srp300
Abstract: No abstract text available
Text: SRP300A thru SRP300K Vishay General Semiconductor General Purpose Plastic Rectifier FEATURES • Glass passivated chip junction • Fast switching for high efficiency • Low forward voltage drop • Low leakage current • High forward surge capability • Solder Dip 260 °C, 40 seconds
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SRP300A
SRP300K
DO-201AD
2002/95/EC
2002/96/EC
DO-201AD,
08-Apr-05
srp300
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73884
Abstract: DSA003850
Text: Silicon Technology Reliability Vishay Siliconix P-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT 175 °C - AUTOMOTIVE Sample Size 574 Equivalent Device Hours 176,191,121 Number of Total Failures Failure Rate in FIT 5.165 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, based on
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JESD85,
05-May-06
73884
DSA003850
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jesd
Abstract: No abstract text available
Text: Silicon Technology Reliability Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT 175 °C - AUTOMOTIVE Sample Size 6,642 Equivalent Device Hours 3,229,012,514 Number of Total Failures Failure Rate in FIT 0.282 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, based on
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JESD85,
05-May-06
jesd
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Untitled
Abstract: No abstract text available
Text: ST7263B LOW SPEED USB 8-BIT MCU FAMILY WITH UP TO 32K FLASH/ROM, DFU CAPABILITY, 8-BIT ADC, WDG, TIMER, SCI & I²C Memories – 4, 8, 16 or 32 Kbytes Program Memory: High Density Flash HDFlash , FastROM or ROM with Readout and Write Protection – In-Application Programming (IAP) and In-Circuit programming (ICP)
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ST7263B
128byte
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Untitled
Abstract: No abstract text available
Text: GI910 thru GI917 Vishay General Semiconductor Medium-Switching Plastic Rectifier FEATURES • Fast switching for high efficiency • Low forward voltage drop • Low leakage current • High forward surge capability • Solder Dip 260 °C, 40 seconds • Component in accordance to RoHS 2002/95/EC
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GI910
GI917
DO-201AD
2002/95/EC
2002/96/EC
DO-201AD,
08-Apr-05
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Untitled
Abstract: No abstract text available
Text: Silicon Technology Reliability Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT 175 °C - AUTOMOTIVE Sample Size 7,904 Equivalent Device Hours 2,955,801,265 Number of Total Failures Failure Rate in FIT 0.308 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, based on
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JESD85,
05-May-06
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Untitled
Abstract: No abstract text available
Text: Silicon Technology Reliability Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT 175 °C - AUTOMOTIVE Sample Size 492 Equivalent Device Hours 372,234,768 Number of Total Failures Failure Rate in FIT 2.445 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, based on
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JESD85,
05-May-06
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C 828
Abstract: No abstract text available
Text: Silicon Technology Reliability Vishay Siliconix P-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT 175 °C - AUTOMOTIVE Sample Size 328 Equivalent Device Hours 41,690,292 Number of Total Failures Failure Rate in FIT 21.828 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, based on
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JESD85,
05-May-06
C 828
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Untitled
Abstract: No abstract text available
Text: Silicon Technology Reliability Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT 175 °C - AUTOMOTIVE Sample Size 12,070 Equivalent Device Hours 5,788,374,686 Number of Total Failures Failure Rate in FIT 0.157 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, based on
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JESD85,
05-May-06
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Untitled
Abstract: No abstract text available
Text: GI820 thru GI828 Vishay General Semiconductor Fast Switching Plastic Rectifier FEATURES • Fast switching for high efficiency • Low forward voltage drop • Low leakage current • High forward current operation • High forward surge capability • Solder Dip 260 °C, 40 seconds
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GI820
GI828
2002/95/EC
2002/96/EC
08-Apr-05
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Untitled
Abstract: No abstract text available
Text: Silicon Technology Reliability Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT 175 °C - AUTOMOTIVE Sample Size 6,986 Equivalent Device Hours 3,107,031,480 Number of Total Failures Failure Rate in FIT 0.293 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, based on
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JESD85,
05-May-06
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73881
Abstract: No abstract text available
Text: Silicon Technology Reliability Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT 175 °C - AUTOMOTIVE Sample Size 738 Equivalent Device Hours 300,269,377 Number of Total Failures Failure Rate in FIT 3.031 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, based on
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JESD85,
05-May-06
73881
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Untitled
Abstract: No abstract text available
Text: VLMO31. Vishay Semiconductors SMD LED in PLCC2 Package 94 8553 DESCRIPTION This device has been designed for applications requiring narrow brightness and color selection. The package of this device is the PLCC-2. It consists of a lead frame which is embedded in a
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VLMO31.
J-STD-020C
08-Apr-05
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failure rate
Abstract: 940 629
Text: Silicon Technology Reliability Vishay Siliconix P-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT 175 °C - AUTOMOTIVE Sample Size 4,746 Equivalent Device Hours 1,446,940,078 Number of Total Failures Failure Rate in FIT 0.629 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, based on
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JESD85,
05-May-06
failure rate
940 629
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JESD85
Abstract: Activation Energy
Text: Silicon Technology Reliability Vishay Siliconix P-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT 175 °C - AUTOMOTIVE Sample Size 656 Equivalent Device Hours 186,613,694 Number of Total Failures Failure Rate in FIT 4.876 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, based on
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JESD85,
05-May-06
JESD85
Activation Energy
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CLTS-2B TEMPERATURE SENSORS
Abstract: EGP-5-120 strain Gages cea 00 125UN 350 CEA-XX-062UL-120 CLTS-2B 134-AWP SR-4 STRAIN GAGES LM-SS-210AW-048 EA-06-125BZ-350 TN501
Text: VISHAY INTERTECHNO L O G Y , INC . INTERACTIVE data book precision strain gages vishay micro-measurements vse-db0066-0705 Notes: 1. To navigate: a Click on the Vishay logo on any datasheet to go to the Contents page for that section. Click on the Vishay logo on any Contents
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vse-db0066-0705
CLTS-2B TEMPERATURE SENSORS
EGP-5-120 strain Gages
cea 00 125UN 350
CEA-XX-062UL-120
CLTS-2B
134-AWP
SR-4 STRAIN GAGES
LM-SS-210AW-048
EA-06-125BZ-350
TN501
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Untitled
Abstract: No abstract text available
Text: n 6 7 THIS DRAWING IS UNPUBLISHED. VW COPYRIGHT 2006 RELEASED FOR PUBLICATION BY TYCO ELECTRONICS CORPORATION. 5 4 n 2 3 - ALL RIGHTS RESERVED. LOC DIST GP 00 R E V IS IO N S P LTR B R E V IS E D PER DESCRIPTION DATE DWN E C 0 - 0 6 - 0 1 81 1 8 31JU L0 6
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OCR Scan
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L94V-0
05MAY06
31MAR2000
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