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    2C9242 Search Results

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    Catalog Datasheet MFG & Type Document Tags PDF

    2a92

    Abstract: 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9
    Text: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)


    Original
    AT-27C010 AT-27C010 E901-14056 2D1147-12 2a92 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9 PDF

    5A9516

    Abstract: 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126
    Text: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)


    Original
    AT-27C010 AT-27C010 E901-14056 2D1147-12 5A9516 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126 PDF

    M1014

    Abstract: K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352
    Text: PAGE 1 OF 15 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C256R CMOS EPROM RELIABILITY DATA* * - 200°C DATA RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST - 125°C HIGH TEMPERATURE REVERSE BIAS (HTRB) - TEMPERATURE CYCLE, CENTRIFUGE, FINE AND GROSS


    Original
    AT-27C256R from27C256R 4B0691 8703A) M1014 K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352 PDF