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    MIC29302

    Abstract: TO263-5 MIC29151 MIC2941A MIC29201 0343 0617 pb 0617 MIC29302WU 3.3BU
    Text: TO-263 PACKAGE REL MONITOR DATA High Temperature Storage Life +150 deg C, 1000 hours Device Lot No Pkg MSL Soak MIC29302 WU 6A04417 TO-263-5 L3 MIC29302 YU 6A10125MEB TO-263-5 L3 MIC29201 3.3BU A203232MEA TO-263-5 n/a MIC29151 3.3WU 3A18105M09 TO-263-5 n/a


    Original
    O-263 MIC29302 6A04417 O-263-5 6A10125MEB MIC29201 A203232MEA TO263-5 MIC29151 MIC2941A 0343 0617 pb 0617 MIC29302WU 3.3BU PDF

    MIC29302WT

    Abstract: No abstract text available
    Text: Bi CMOS DMOS METAL GATE OPERATING LIFE @ TA = +125C AT RATED VOLTAGE BCDM PROCESS Vcc Sample Size Act Hrs Fails TO-263 TO-220 TO-263 + 26V + 26V +26V 116 116 116 168 168 168 500 500 1000 1000 1000 116000 116000 116000 2A06111M03 SOT-223 +26V 110 168 500 1000


    Original
    O-263 O-220 2A06111M03 OT-223 MIC29302AWU MIC29302WUY MIC29302WU MIC29302 MIC29302WT PDF

    MIC29151WU

    Abstract: MIC2171WU MIC29151BU MIC2177YWM 20L SOT-23 UNISEM Preconditioning 3a204
    Text: RELIABILITY REPORT DATE: 4/28/2004 QUALITY ENG : Herb Grimm PURPOSE: Matte Tin Reliability Test Summary. HTOL - High Temperature Operating Life Test TA= + 125°C PACKAGE TYPE : PART NO. LOT ID. 168 HR 500 HR 1000HR SSOP 28L MIC2563AYSM 2A28088M01 0/116 0/116


    Original
    1000HR MIC2563AYSM 2A28088M01 MIC2177YWM 3A02058MEA OT-23 MIC5248YM 2A09099MEA O-263 MIC29151WU MIC29151WU MIC2171WU MIC29151BU MIC2177YWM 20L SOT-23 UNISEM Preconditioning 3a204 PDF