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    transistor smd 5DW 73

    Abstract: sipex 3232 BU-61588P3 SD-14621DX SD14621 sdc 7500 natel 09059 MPC 1298 V 5962-8952211YC 95003-01HXA
    Text: Qualifications Validated Annually QUALIFIED MANUFACTURERS LIST OF CUSTOM HYBRID MICROCIRCUITS QUALIFIED UNDER MILITARY SPECIFICATION MIL-PRF-38534 CUSTOM HYBRID MICROCIRCUITS QML-38534-29 30-Jun-99 SUPERSEDING QML-38534-28 31-Mar-99 CUSTOM HYBRID MICROCIRCUITS


    Original     		MIL-PRF-38534 QML-38534-29 30-Jun-99 QML-38534-28 31-Mar-99 MIL-PRF-38534. 16-BIT, transistor smd 5DW 73 sipex 3232 BU-61588P3 SD-14621DX SD14621 sdc 7500 natel 09059 MPC 1298 V 5962-8952211YC 95003-01HXA PDF

    5962-9214401HXC

    Abstract: qml-38534 SMHF2812D 5962-E402-04 MHF SC 5962-9214401HXA
    Text: REVISIONS LTR DESCRIPTION DATE YR-MO-DA E Table I; Changed the min and max limits for Radhard levels L,R device type 02 for the following tests +VOUT, -VOUT. Changed the max limits for VRLINE, VRLOAD, IIN, and Eff. For the IRIP test separate subgroups 1,2,3 to subgroup 1 for device type 01 max limit of 60


    Original     		MonniHF2812DF/KR 5962-9214401HXC qml-38534 SMHF2812D 5962-E402-04 MHF SC 5962-9214401HXA PDF

    5962L0053605VYC

    Abstract: 5962-9069204QXA ATMEL 302 24C16 UT9Q512E-20YCC MOH0268D UT54ACS164245SEIUCCR Z085810 5962-9762101Q2A UT28F256QLET-45UCC 5962R0250401KXA
    Text: NOT MEASUREMENT SENSITIVE MIL-HDBK-103AJ 19 SEPTEMBER 2011 SUPERSEDING MIL-HDBK-103AH 28 MARCH 2011 DEPARTMENT OF DEFENSE HANDBOOK LIST OF STANDARD MICROCIRCUIT DRAWINGS This handbook is for guidance only. Do not cite this document as a requirement. AMSC N/A


    Original     		MIL-HDBK-103AJ MIL-HDBK-103AH MIL-HDBK-103AJ 5962L0053605VYC 5962-9069204QXA ATMEL 302 24C16 UT9Q512E-20YCC MOH0268D UT54ACS164245SEIUCCR Z085810 5962-9762101Q2A UT28F256QLET-45UCC 5962R0250401KXA PDF

    QML-38534

    Abstract: MHF 2812D 44t smd 5962-9214401HXC 5962-9214401HXA
    Text: REVISIONS LTR DESCRIPTION D Added RadHard and Class K devices. Added RadHard requirements. Redrew entire document. -sld 97-10-29 K.A. Cottongim E Table I; Changed the min and max limits fo r Radhard levels L,R device type 02 for the following tests +V0 ijT ’ ' vOUT- Changed the


    OCR Scan     		2812D/KR 2812DF/KR D034b32 QML-38534 MHF 2812D 44t smd 5962-9214401HXC 5962-9214401HXA PDF