M2003
Abstract: No abstract text available
Text: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR TO−92 Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage BOND INT 80 20,000 200C + N2 0.00 HAST 1205 120,500 130_C, 85%RH 0.00 LEAD INT 125 345 883M2004
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883M2004
M2003
30-Sep-03
M2003
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M2003
Abstract: No abstract text available
Text: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR SC−70 Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage 85/85 325 54,600 85_C, 85%RH 0.00 BOND INT 480 320,000 200_C + N2 0.00 HAST 2,661 282,448 130_C, 85%RH
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SC-70
883M2004
10SEC
M2003
15-Aug-03
M2003
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