9638

Abstract: ir 9637 M 9639 521-9639 a 9639 ma 9639 led high brightness 9639 max
Contextual Info: 3mm Discrete LED High Brightness Tinted, Non-Diffused 4.45 [.175] 1.02 [.040] 3.30 [.130] 25.40 [1.00] MIN Dialight 521-9637, -9638, -9639 PART NO. 521-9637 521-9638 521-9639 1.02 [.040] MIN ANODE: -9636-16, -9637-16 CATHODE: -9638-16, -9639-16, & -9650-16

M 9639

Abstract: 9638
Contextual Info: 3mm Discrete LED High Brightness Tinted, Non-Diffused Dia light 521-9637, -9638, -9639 PART NO. 521-9637 521-9638 521-9639 Zìi & COLOR Red Green Yellow MOUNTING CLIP: 515-0006 located on page 4-65 Dimensions in mm [inches] Red Green Yellow -9637 -9638 -9639

m63044

Abstract: m64076 M64026 m7108 M64073 M63062 M64021 M71081 M63006 M71064
Contextual Info: RELIABILITY MONITOR SUMMARY QUARTERLY SUMMARY, QUARTER 1, 1997 April 17, 1997 PERFORMED PER THE REQUIREMENTS OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION. CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY STANDARD STRESS TEST DESCRIPTIONS Test HTOL HTOL2

hall current transducer 5A

Abstract: HY-10 transistor marking hy hy power HY-5 M 9639 20-P 25-P hall ac current transducer 10A ho 10-p
Contextual Info: HY 5.25-P Definition The HY.-P is a compact and low-cost transducer for the measurement of small current. It works on the Hall effect principle and allows measurement with galvanic isolation of DC, AC or other currents of complex wave form. Operating from a +/-15V power supply and over a wide temperature range, it is suitable for use in current

lem 25-p

Abstract: lem hy 10-p 20-P 25-P HY 20
Contextual Info: Current Transducers HY 5 to 25-P For the electronic measurement of currents : DC, AC, pulsed, mixed, with a galvanic isolation between the primary circuit high power and the secondary circuit (electronic circuit). IPN = 5 . 25 A Electrical data Primary nominal

Contextual Info: 1234567894ABCDEF69 1234567894ABCDEF69 12345267 289ABCDECF  4C457457DC7  234C25DC4E4E    F5 !" #!" $!"5%%52&!  17E '4C3F"!#3 A48!  7CD45*4DCCBC54B4F565  A7* 7%+C24! F x × 2C89CF CA ! CBF8E2E

M63064

Abstract: M63041 M63002 M63080 CY7C964-NC m63032 M63058 M63065 M63069 M63057
Contextual Info: RELIABILITY MONITOR SUMMARY Description of Data Table Column Headings AAA AAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA

MAX785

Abstract: st 9635 DG302 to220 MAX232CPE MAX232 integrated chips IC 9637 MAX333 equivalent max232 MTBF calculation MAX232 mtbf st 9548
Contextual Info: December 1997 RR-1K Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1996. It is separated into seven fabrication processes: 1 Standard

IC 9637

Abstract: A101 A102 A104 A106 A110 11256E pqfp100 71124X IDT QUALITY & RELIABILITY MONITOR REPORT
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS July 1997 IDT QUALITY SERVICE QSP PERFORMANCE 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT July 1997 TABLE OF CONTENTS

Contextual Info: Current Transducers HY 5.25-P IPN = 5 . 25 A For the electronic measurement of currents : DC, AC, pulsed, mixed, with a galvanic isolation between the primary circuit high power and the secondary circuit (electronic circuit). Electrical data Primary nominal

lem hy 10-p

Abstract: 20-P 25-P HY-5
Contextual Info: Current Transducers HY 5.25-P IPN = 5 . 25 A For the electronic measurement of currents : DC, AC, pulsed, mixed, with a galvanic isolation between the primary circuit high power and the secondary circuit (electronic circuit). Electrical data Primary nominal

max785

Abstract: DG302 to220 DG301 to220 st 9635 st 9548 MAX232 integrated chips max232 MTBF calculation MAX232 mtbf MAX333 equivalent MAX232ACPE
Contextual Info: December 1997 RR-1K Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1996. It is separated into seven fabrication processes: 1 Standard

H9549

Abstract: h9627 79r3081 memory 9652 7015X Y9709 H9541 h961 MQUAD report on PLCC
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS July 1997 IDT QUALITY SERVICE QSP PERFORMANCE 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT July 1997 TABLE OF CONTENTS

A101

Abstract: A102 A104 A106 A110 TQFP-64 PACKAGE thermal resistance 7025X quality and reliability report IDT QUALITY & RELIABILITY MONITOR REPORT
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS July 1997 IDT QUALITY SERVICE QSP PERFORMANCE 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT July 1997 TABLE OF CONTENTS

PM108

Abstract: PM-108 PP 50.100
Contextual Info: v •1 QPSK MODULATORS MODELS PM-108/109/110 50-100 MHz Variety of Drivers: PM-108; Current, PM-109; ECL, PM-110; TTL Hermetic Module 2.5° Phase Deviation Guaranteed Specifications* From -5 5 °C to +85°C Frequency Range Insertion Loss VSWR Input Output

A101

Abstract: A102 A104 A106 A110 IDT QUALITY & RELIABILITY MONITOR REPORT
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS January 1997 IDT QUALITY SERVICE QSP PERFORMANCE 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT January 1997 TABLE OF CONTENTS

H9549

Abstract: X9642 h954 A101 A102 A104 A106 A110 SBGA-272 h9610
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS January 1997 IDT QUALITY SERVICE QSP PERFORMANCE 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT January 1997 TABLE OF CONTENTS

CV98Q250

Abstract: CV98F2R5 CV99P250 CV99N180 CV990350 CV99Q400 max 9694 e 140 9632 CV99M100 OZ 9910 g
Contextual Info: J OHA N S ON MANUFACTURING MME 1 to 4.5pF .25 to 7pF 1 to 5pF .5 to 1.3pF 1.5 to 4pF Mr Sìl'Hìifìi <^ w r? N 4j *6 t0 2pF 2.5 to 10pF '©s S'ä^üAU1 ii^iy .6 to 2.5pF 3 to 12pF WSk M^7ÔMSÔ Q Q D 0 S 7 3 b B D 4 to 18pF 6to35pF 5 to 15pF 7to40pF g

UL30AR0660

Contextual Info: WITH OUR PATENTED ADVANCE! IN DRY FILM TECHNOLOGY.THE IMPOSSIBLE IS NOW PRACTICAL! VO LTAG E TO 1000V D C R M S C U R R E N T T O 58 A M P S CAPACITANCE TO 1600|jF Does the product create the need, or does the need create the product? With UNLYTIC the argument can be made either way! Its availability

70241k

Abstract: d5611 61c256 ic 9022 61c64 RELIABILITY REPORT ISSI vacuum tubes CMS 2015 S/TRANSISTOR J 5804 EQUIVALENT 28F010P
Contextual Info: ISSI Integrated Silicon Solution, Inc. Quality and Reliability 1997-1998 An ISO 9001 Company ISSI ® Reliability Report 1997-1998 An ISO 9001 Company 1997 Integrated Silicon Solution, Inc. Integrated Silicon Solution, Inc. • 2231 Lawson Lane • Santa Clara, CA 95054

report on PLCC- II

Abstract: PLCC-52 TQFP-64 A101 A102 A104 A106 A110 ase korea on semiconductor 7132-S
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS January 1997 IDT QUALITY SERVICE QSP PERFORMANCE 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT January 1997 TABLE OF CONTENTS

c9013

Abstract: 84 pin PBGA oscilloscope MTBF TSMC retention memory dc 8069 IS61C1024 IC Data-book Q-16 car radio 14x20 TSOP 8638
Contextual Info: ISSI Integrated Silicon Solution, Inc. Quality and Reliability 1997-1998 An ISO 9001 Company ISSI ® Quality System Manual QUALITY Reliabilty Report 1997-1998 RELIABILITY Integrated Silicon Solution, Inc. An ISO 9001 Company 1997 Integrated Silicon Solution, Inc.

Contextual Info: UA9639C DUAL DIFFERENTIAL LINE RECEIVER D 3 0 0 9 , OCTOBER 1 9 8 6 Meets EIA Standards RS-422-A and RS-423-A D . JG , OR P P A C K A G E T O P V IE W Meets Federal Standards 1020 and 1030 V CC C 1 OUT C 20U T C Operates from Single 5-V Power Supply Wide Common-Mode Voltage Range

BC 148 TRANSISTOR PIN CONFIGURATION

Abstract: diagram for test ic 8873 BYW52 U2403B symbol of Bc 148 transistor telefunken stm transistor Bc 540 pin
Contextual Info: U2403B TELEFUNKEN Semiconductors Charge Timer Description The monolithic integrated bipolar circuit U2403B is a time controlled constant current charger. Selection of charge current versus timing is according to external components at pins 2, 3 and 4. For high current