DD642
Abstract: No abstract text available
Text: RELIABILITY MONITOR PRODUCT MONITOR DATE DATE CODE ASSEMBLY FACILITY ASSEMBLY LOT NO PROCESS TYPE PACKAGE TYPE DS1669 Aug-97 9701 B3 OMEDATA DD642763AAC1 1.2µ OX/NI EEPROM 08 SOIC 208 STRESS/JOB NO. READPOINT Sample Size/No. of Fails Preconditioning (P/C):
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Aug-97
P-20239
P-20483,
P-20599
DD642763AAC1
DS1669
P-20600
P-20601
P-20602
DD642
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LT1039
Abstract: No abstract text available
Text: RELIABILITY DATA LT1039 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE CERDIP SIDEBRAZE PLASTIC DIP 516 8644 104 9701 136 8701 756 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE PLASTIC DIP SOIC/SOT/MSOP
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LT1039
00-03-6209B.
LT1039
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LT1039
Abstract: No abstract text available
Text: RELIABILITY DATA LT1039 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE CERDIP SIDEBRAZE PLASTIC DIP 516 8644 104 9701 136 8701 756 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE PLASTIC DIP SOIC/SOT/MSOP
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LT1039
00-03-6209B.
LT1039
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LT1328
Abstract: LT1537 LT4351 9805
Text: RELIABILITY DATA LT1328 / LT1537 / LT4351 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SIDEBRAZE SOIC/SOT/MSOP 39 9636 205 9701 244 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE SOIC/SOT/MSOP SSOP/TSSOP
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LT1328
LT1537
LT4351
00-03-6209B.
LT4351
9805
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9747
Abstract: LTC1473 LTC1479 R336
Text: RELIABILITY DATA LTC1473 / LTC1479 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE NEWEST DATE CODE SOIC/SOT/MSOP 50 9701 50 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE PLASTIC DIP SSOP/TSSOP 50 396 446
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LTC1473
LTC1479
00-03-6209B.
9747
LTC1479
R336
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PDF
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9805
Abstract: 9701 SOIC LT1328 LT1537 9531
Text: RELIABILITY DATA LT1328 / LT1537 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SIDEBRAZE SOIC/SOT/MSOP 39 9636 45 9701 84 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE SOIC/SOT/MSOP SSOP/TSSOP 745 250 995
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LT1328
LT1537
00-03-6209B.
9805
9701 SOIC
LT1537
9531
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data sheet transistor 9747
Abstract: LTC1473 LTC1479 R336 7497
Text: RELIABILITY DATA LTC1473 / LTC1479 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP 50 9701 50 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE PLASTIC DIP SSOP/TSSOP 50 346 396 • TEMP CYCLE FROM -65°C to +150°C
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LTC1473
LTC1479
00-03-6209B.
data sheet transistor 9747
LTC1479
R336
7497
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PDF
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LT1124
Abstract: OP270 OP470 MSOP-9 op27
Text: RELIABILITY DATA LT1124 / 1125 / 1126 / 1127 / OP270 / OP470 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE CERDIP FLATPAK/LCC PLASTIC DIP SOIC/SOT/MSOP 42 9101 80 9318 1,869 9207 228 9505 2,219 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH
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LT1124
OP270
OP470
00-03-6209B.
OP470
MSOP-9
op27
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PDF
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LT1124
Abstract: OP270 OP470
Text: RELIABILITY DATA LT1124 / 1125 / 1126 / 1127 / OP270 / OP470 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE CERDIP FLATPAK/LCC PLASTIC DIP SOIC/SOT/MSOP NEWEST DATE CODE 89 9101 80 9318 1,969 9207 459 9505 2,597 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH
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LT1124
OP270
OP470
00-03-6209B.
OP470
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P-20606
Abstract: c19643 DS1868 p19500 p1908 DD642 P19-50 B59728 P2050
Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 PRODUCT DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS2401 DS2401 DS2401 DS80C320 DS80C320 DS80C320 DS80C320 MONITOR DATE JOB NO. Mar-97 Jun-97 Sep-97 Feb-97 Feb-97
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DS1302)
Mar-97
Jun-97
Sep-97
Feb-97
May-97
Aug-97
P-20606
c19643
DS1868
p19500
p1908
DD642
P19-50
B59728
P2050
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m63044
Abstract: m64076 M64026 m7108 M64073 M63062 M64021 M71081 M63006 M71064
Text: RELIABILITY MONITOR SUMMARY QUARTERLY SUMMARY, QUARTER 1, 1997 April 17, 1997 PERFORMED PER THE REQUIREMENTS OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION. CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY STANDARD STRESS TEST DESCRIPTIONS Test HTOL HTOL2
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CY7C374I-JC
M64016
FLASH-FL28D
M71081
m63044
m64076
M64026
m7108
M64073
M63062
M64021
M63006
M71064
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PLL52C59-14T
Abstract: PLL52C59
Text: PLL52C59-14T Sys tem Clock Gen er ator with In te grated Buff ers PIN INFORMATION FEATURES n Generates all clock frequencies for Pentium and CYRIX CPU. n Provides 4 copies of CPU clock, 6 copies of PCI clock, two system clocks, one 24Mhz and one 48Mhz clock.
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PLL52C59-14T
24Mhz
48Mhz
66Mhz)
PLL52C59-14T
PLL52C59
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LM119
Abstract: LM319 LT1123
Text: RELIABILITY DATA LM119 / LM319 / LT1123 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE CERDIP FLATPAK/LCC HERMETIC PLASTIC DIP TO-92 1,058 8433 766 9109 1,934 8318 535 8411 630 8952 4,923 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH
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LM119
LM319
LT1123
00-03-6209B.
LT1123
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H 9731
Abstract: 27.145Mhz remote control remote control car circuit diagram m1 series remote control toy car circuit diagram remote control car c945 REMOTE CONTROLLER toy car pc controlled car circuit diagram 27.145Mhz 27.145Mhz remote car remote control toy circuit diagram
Text: Data Sheet PT8A9701/9731 Duty Cycle Output Remote Controller |
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PT8A9701/9731
PT8A9701
PT8A9731
PT0094
H 9731
27.145Mhz remote control
remote control car circuit diagram m1 series
remote control toy car circuit diagram
remote control car c945
REMOTE CONTROLLER toy car
pc controlled car circuit diagram
27.145Mhz
27.145Mhz remote car
remote control toy circuit diagram
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toshiba tc 97101
Abstract: tc 97101 M7401 M73049 "256K x 16" SRAM PLCC M73002 M7206 M7-300 M72016 T 9722
Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 3, 1997 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Marc Hartranft QA Engineering Department Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT
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CY74FCT163952TP
CY7C341-25JI
FAMOS-P20
CY7C374I-JC
M72048
FLASH-FL28D
toshiba tc 97101
tc 97101
M7401
M73049
"256K x 16" SRAM PLCC
M73002
M7206
M7-300
M72016
T 9722
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MAX6809
Abstract: ST 9727 st 9635 st 9548 12x12 bga thermal resistance MAX232CWE 9846B MAX232 integrated chips 9836 maxim iso 9717
Text: November 1999 Surface-Mount Devices Reliability Report This report presents reliability data for Maxim’s surface-mount devices, including the results of extensive reliability stress tests performed solely on epoxy surface-mount packages since 1995. Maxim’s surface-mount packages are subjected to standard
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1-888-MAXIM-IC
MAX6809
ST 9727
st 9635
st 9548
12x12 bga thermal resistance
MAX232CWE
9846B
MAX232 integrated chips
9836 maxim
iso 9717
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74ACT11008pwle
Abstract: No abstract text available
Text: 74ACT11008 QUADRUPLE 2-INPUT POSITIVE-AND GATE SCAS013C – AUGUST 1987 – REVISED APRIL 1996 D D D, N, OR PW PACKAGE TOP VIEW Inputs Are TTL-Voltage Compatible Center-Pin VCC and GND Configurations Minimize High-Speed Switching Noise EPIC (Enhanced-Performance Implanted
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74ACT11008
SCAS013C
500-mA
300-mil
scyd013
sdyu001x
sgyc003d
scyb017a
74ACT11008pwle
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Untitled
Abstract: No abstract text available
Text: SN54AC74, SN74AC74 DUAL POSITIVEĆEDGEĆTRIGGERED DĆTYPE FLIPĆFLOPS WITH CLEAR AND PRESET SCAS521F − AUGUST 1995 − REVISED OCTOBER 2003 D 2-V to 6-V VCC Operation D Inputs Accept Voltages to 6 V D Max tpd of 10 ns at 5 V SN54AC74 . . . J OR W PACKAGE
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SN54AC74,
SN74AC74
SCAS521F
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DS1868
Abstract: DL6-11 c19643 dallas date code ds12887 P1788 P-18182 dk52
Text: RELIABILITY MONITOR PRODUCT DS1302 DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V.SUMMARY DS1
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DS1302
DS1868
DS21S07A
DL6-11
c19643
dallas date code ds12887
P1788
P-18182
dk52
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PDF
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H9723
Abstract: h9740 l9718 L9712 L9709 L9727 T9934 l9731 L9706 l9735
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS April 1998 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT April 1998 TABLE OF CONTENTS Section I: Introduction Section II:
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9808M
9806M
9807M
H9723
h9740
l9718
L9712
L9709
L9727
T9934
l9731
L9706
l9735
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PDF
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97A8
Abstract: cable tv amplifier MAX496 MAX496CPE MAX496CSE MAX497
Text: 19-0373; Rev 1; 12/98 L MANUA ION KIT HEET T A U L EVA TA S WS DA FOLLO 375MHz Quad Closed-Loop Video Buffers, AV = +1 and +2 _Features The MAX496 and MAX497 are quad, closed-loop, ±5V video buffers that feature extremely high bandwidth and
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375MHz
MAX496
MAX497
275MHz
MAX496/MAX497
230MHz
215MHz,
97A8
cable tv amplifier
MAX496CPE
MAX496CSE
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H9723
Abstract: h9740 L9727 H9703 PJ 966 IV L9718 L9726 IC L9712 K961 L9712
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS July 1998 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT July 1998 TABLE OF CONTENTS Section I: Introduction Section II:
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61543N
K12871L
PK100
71V632Z
2821W
H51143
Y9681
7007Z
ASAT-HK/T11052
7280Q
H9723
h9740
L9727
H9703
PJ 966 IV
L9718
L9726
IC L9712
K961
L9712
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MAX496
Abstract: MAX496CPE MAX496CSE MAX497 97A8
Text: 19-0373; Rev 1; 12/98 L MANUA ION KIT HEET T A U L EVA TA S WS DA FOLLO 375MHz Quad Closed-Loop Video Buffers, AV = +1 and +2 _Features The MAX496 and MAX497 are quad, closed-loop, ±5V video buffers that feature extremely high bandwidth and
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375MHz
MAX496
MAX497
275MHz
MAX496/MAX497
230MHz
215MHz,
MAX496CPE
MAX496CSE
97A8
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PDF
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ST 9427
Abstract: 155-0241 155-0241-02 M726* TRANSISTOR st 9635 1550371 74935 M605030 806-0300 transistor 9427
Text: December 1997 RR-B2A High-Frequency Bipolar Products Reliability Report This report presents the product reliability data for Maxim’s High-Frequency Bipolar analog and digital products. This data was collected from extensive reliability stress tests performed between June 1, 1994 and
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12GHz
27GHz
ST 9427
155-0241
155-0241-02
M726* TRANSISTOR
st 9635
1550371
74935
M605030
806-0300
transistor 9427
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