KM48S8030BT-GL
Abstract: nn5264805tt-b60 KM48S2020CT-GL 0364804CT3B-260 d4564163g5 nt56v1680a0t D4564841g5 81F641642B-103FN M5M4V16S30DTP Siemens 9832
Text: PC100 SDRAM Component Testing Summary As part of Intel’s enabling process, the following test/characterization procedure has been implemented on PC100 SDRAM components. A small sample of components 2-5 devices have been tested under the conditions described in Table 2.
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PC100
KM48S8030BT-GL
nn5264805tt-b60
KM48S2020CT-GL
0364804CT3B-260
d4564163g5
nt56v1680a0t
D4564841g5
81F641642B-103FN
M5M4V16S30DTP
Siemens 9832
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KM416S4030BT-G10
Abstract: KM48S2020CT-GL 81F641642B-103FN d4564163g5 S9745-M06 M5M4V16S30DTP gm72v661641ct7j D4564163G5-A10-9JF D4516821AG5 D4516821
Text: PC100 SDRAM Component Testing Summary As part of Intel’s enabling process, the following test/characterization procedure has been implemented on PC100 SDRAM components. A small sample of components 2-5 devices have been tested under the conditions described in Table 2.
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PC100
KM416S4030BT-G10
KM48S2020CT-GL
81F641642B-103FN
d4564163g5
S9745-M06
M5M4V16S30DTP
gm72v661641ct7j
D4564163G5-A10-9JF
D4516821AG5
D4516821
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IRFIBC44LC
Abstract: MOSFET IRF 3710 transistor IRFZ46N irf2807 equivalent IRFIBC44 TO-220 IRF 3615 irfz46n irf 3215 mosfet irf 9740 transistor equivalent irf510
Text: SWITCH RELIABILITY REPORT QUARTERLY REPORT NUMBER 57 OCTOBER 15, 1999 International Rectifier WORLD HEADQUARTERS: 233 KANSAS ST., EL SEGUNDO, CA 90245 USA • Tel: 310 322-3332 • TELEX 66-4464 EUROPEAN HEADQUARTERS: HURST GREEN, OXTED, SURREY RH8 9BB, UK • Tel: (44) 0883 714234 • TELEX 95219
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IRF5905
Abstract: MOSFET IRF 9732 transistor equivalent irf510 IRF3710 equivalent IRFz44n equivalent IRF 9732 irf2807 equivalent IRF3205 application IRD110 HTGB
Text: TABLE OF CONTENTS EXECUTIVE SUMMARY i 1.0 INTRODUCTION 1-1 2.0 USING HEXFET RELIABILITY INFORMATION 2-1 3.0 THE MATRIX QUALIFICATION PHILOSOPHY 3.1 CRITICAL HEXFET ATTRIBUTES FOR CONSIDERATION IN MATRIX QUALIFICATION 3.2 CROSS REFERENCE FOR ALL PART TYPES
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O-220/D2PAK
IRF5905
MOSFET IRF 9732
transistor equivalent irf510
IRF3710 equivalent
IRFz44n equivalent
IRF 9732
irf2807 equivalent
IRF3205 application
IRD110
HTGB
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KM48S8030BT-GL
Abstract: NT56V1680A0T D4516821AG5 KM416S4030BT-GL 81f641642b103fn KM48S2020CT-GL D4516821AG5-A107JF gm72v661641ct7j TC59S6408BFT80 D4564163G5
Text: PC100 SDRAM Component Testing Summary As part of Intel’s enabling process, the following test/characterization procedure has been implemented on PC100 SDRAM components. A small sample of components 2-5 devices have been tested under the conditions described in Table 2.
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PC100
KM48S8030BT-GL
NT56V1680A0T
D4516821AG5
KM416S4030BT-GL
81f641642b103fn
KM48S2020CT-GL
D4516821AG5-A107JF
gm72v661641ct7j
TC59S6408BFT80
D4564163G5
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BUF654
Abstract: transistor 9747
Text: BUF654 Silicon NPN High Voltage Switching Transistor Features D D D D D D D D D Simple-sWitch-Off Transistor SWOT HIGH SPEED technology Planar passivation 100 kHz switching rate Very low switching losses Very low dynamic saturation Very low operating temperature
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BUF654
D-74025
18-Jul-97
BUF654
transistor 9747
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BUF654
Abstract: No abstract text available
Text: BUF654 TELEFUNKEN Semiconductors Silicon NPN High Voltage Switching Transistor Features D Simple-sWitch-Off Transistor SWOT D HIGH SPEED technology D Planarpassivation D 100 kHz switching rate D Very low switching losses D Very low dynamic saturation D Very low operating temperature
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BUF654
D-74025
BUF654
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transistor 9747
Abstract: 9746 BUF654
Text: BUF654 TELEFUNKEN Semiconductors Silicon NPN High Voltage Switching Transistor Features D D D D D D D D D Simple-sWitch-Off Transistor SWOT HIGH SPEED technology Planarpassivation 100 kHz switching rate Very low switching losses Very low dynamic saturation
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BUF654
D-74025
transistor 9747
9746
BUF654
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transistor 9747
Abstract: BUF654
Text: BUF654 Vishay Telefunken Silicon NPN High Voltage Switching Transistor Features D D D D D D D D D Simple-sWitch-Off Transistor SWOT HIGH SPEED technology Planar passivation 100 kHz switching rate Very low switching losses Very low dynamic saturation Very low operating temperature
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BUF654
D-74025
transistor 9747
BUF654
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cy7c9101
Abstract: M82054 M74070 97356 M8201 CY7C199-DMB 130C 140C CY7C1009-VC 519701901
Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 2, 1998 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Marc Hartranft Reliability Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT
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619802812L
CY7C109-VC
cy7c9101
M82054
M74070
97356
M8201
CY7C199-DMB
130C
140C
CY7C1009-VC
519701901
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h9740
Abstract: B897 T9934 l9735 l9731 L9726 74100 B8948 JESD22-B100 PT 9732
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS October 1998 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT October 1998 TABLE OF CONTENTS Section I: Introduction Section II:
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DU128
PQ132
PK128
723643Z
ASAT-HK/T11567
PN100
70V261Z
H52742
71215Y
ASAT-HK/T11531
h9740
B897
T9934
l9735
l9731
L9726
74100
B8948
JESD22-B100
PT 9732
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H9723
Abstract: h9740 L9727 H9703 PJ 966 IV L9718 L9726 IC L9712 K961 L9712
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS July 1998 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT July 1998 TABLE OF CONTENTS Section I: Introduction Section II:
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61543N
K12871L
PK100
71V632Z
2821W
H51143
Y9681
7007Z
ASAT-HK/T11052
7280Q
H9723
h9740
L9727
H9703
PJ 966 IV
L9718
L9726
IC L9712
K961
L9712
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h9740
Abstract: k1917 B934 L9726 Y9846 H9817 n9831 l9735 9806 9826 320
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS January 1999 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT January 1999 TABLE OF CONTENTS Section I: Introduction Section II:
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72201X
H54480G
T11747
7280Q
60210D
D00725
P23419G
42V509Z
P23393G
71V124T
h9740
k1917
B934
L9726
Y9846
H9817
n9831
l9735
9806
9826 320
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H9723
Abstract: h9740 l9718 L9712 L9709 L9727 T9934 l9731 L9706 l9735
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS April 1998 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT April 1998 TABLE OF CONTENTS Section I: Introduction Section II:
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9808M
9806M
9807M
H9723
h9740
l9718
L9712
L9709
L9727
T9934
l9731
L9706
l9735
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k1917
Abstract: L9726 JESD22-B100 9806 cga 624 Monitor Hyundai Service TSOP 173 g JEDEC-22-A113 K1573 74FST163245
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS April 1999 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT April 1999 TABLE OF CONTENTS Section I: Introduction Section II:
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723612Z
71215Y
72225S
2211W
Y10648
Y10746
Y10662
T11844
61823N
k1917
L9726
JESD22-B100
9806
cga 624
Monitor Hyundai Service
TSOP 173 g
JEDEC-22-A113
K1573
74FST163245
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M7401
Abstract: m74010 m7402 M74050 M74040 M74064 m80129 hyundai 9750 9745-1 VIC068A cy7c199zi
Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 1, 1998 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Marc Hartranft Reliability Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT
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CY7C1334-AC
M7401
m74010
m7402
M74050
M74040
M74064
m80129
hyundai 9750 9745-1
VIC068A
cy7c199zi
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K2837
Abstract: h9910 pj 899 diode l9845 k1917 B897 74100 ipc 9850 74FST163245 L9726
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS JULY 1999 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT July 1999 TABLE OF CONTENTS Section I: Introduction Section II:
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61245L
63344N
K26795
A17844
A17838
7280Q
D01802
43574K
42646H
K2837
h9910
pj 899 diode
l9845
k1917
B897
74100
ipc 9850
74FST163245
L9726
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h9910
Abstract: 74FST163245 B897 PL84 K2837 9806 h9910 datasheet ipc 9850 pj 899 diode JEDEC-22-A113-A
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS JULY 1999 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT July 1999 TABLE OF CONTENTS Section I: Introduction Section II:
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61245L
63344N
K26795
A17844
A17838
7280Q
D01802
43574K
42646H
h9910
74FST163245
B897
PL84
K2837
9806
h9910 datasheet
ipc 9850
pj 899 diode
JEDEC-22-A113-A
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L9939
Abstract: B897 k9920 L9924 k1917 JESD22-B100 K9928 K2837 P9848 h9910
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS October 1999 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT October 1999 TABLE OF CONTENTS Section I: Introduction Section II:
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--D28
723646Y
Y12142
77105Z
Y12171G
65V500A
P27999G
11V256YY
B10996
63244L
L9939
B897
k9920
L9924
k1917
JESD22-B100
K9928
K2837
P9848
h9910
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L9939
Abstract: k9920 h9910 K1917 L9924 K2837 B897 k3296 JEDEC-22-A113-A K9926
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS October 1999 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT October 1999 TABLE OF CONTENTS Section I: Introduction Section II:
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--D28
723646Y
Y12142
77105Z
Y12171G
65V500A
P27999G
11V256YY
B10996
63244L
L9939
k9920
h9910
K1917
L9924
K2837
B897
k3296
JEDEC-22-A113-A
K9926
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h9910
Abstract: h9940 L9939 z9939 l9923 hyundai 9734 ram K9930 l9934 733W K2837
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS January 2000 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT January 2000 TABLE OF CONTENTS Section I: Introduction Section II:
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PN100
PN120
72V3670Z
70V261Z
723631Z
Y12526
H64413
Y12663G
7130S
71215Y
h9910
h9940
L9939
z9939
l9923
hyundai 9734 ram
K9930
l9934
733W
K2837
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h9910
Abstract: K9930 L9938 PB44 L9939 h9940 L9924 Z178 K2837 K3296
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS April 2000 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT April 2000 TABLE OF CONTENTS Section I: Introduction Section II:
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T13351H
H67541
72V841W
H67444
71V124N
B11539
71V016N
H67495
62373L
A20338G
h9910
K9930
L9938
PB44
L9939
h9940
L9924
Z178
K2837
K3296
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transistor c5578
Abstract: BELDEN 9116 DUOBOND(R) II 75 OHM SERIES 6 awm style 20233 7700A transformer Belden 138777 awm 2464 vw-1 300v shield cable specification transistor nec 8772 yokogawa DCS finder type 81.11 C5611 Transistor
Text: Asia / Pacific Belden Electronics Division Australia Hong Kong Shanghai 2200 U.S. Highway 27 South Richmond, IN 47374-7279 Phone: 765-983-5200 Fax: 765-983-5294 E-mail: info@belden.com Web: www.belden.com Belden Australia Pty Ltd. 100 Olympia Street Tottenham, Victoria 3012
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MCAT-2003
transistor c5578
BELDEN 9116 DUOBOND(R) II 75 OHM SERIES 6
awm style 20233
7700A transformer
Belden 138777
awm 2464 vw-1 300v shield cable specification
transistor nec 8772
yokogawa DCS
finder type 81.11
C5611 Transistor
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Untitled
Abstract: No abstract text available
Text: BUF654 Vishay Telefunken Silicon NPN High Voltage Switching Transistor Features • • • • • • • • • Simple-sWitch-Off Transistor SWOT HIGH SPEED technology Planar passivation 100 kHz switching rate Very low switching losses Very low dynamic saturation
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BUF654
20-Jan-99
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