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    Abstract: No abstract text available
    Text: PAGE 1 OF 4 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27BV1024 CMOS EPROM RELIABILITY DATA - 150°C RETENTION BAKE (PLASTIC) - 125°C DYNAMIC LIFETEST (PLASTIC) - EXTENDED TEMPERATURE CYCLE JULY 2003 2325 Orchard Parkway San Jose CA. 95131 PAGE 2 OF 4


    Original     		AT-27BV1024 AT-27BV1024 7D1192-1 7D9812 9E0214B2 9E9926 9G0315 9G9945 9G0314-2 9G0023 PDF

    1H0132

    Abstract: 8S02 7H9749 9J0003 9H4501 0H1055-1 2E0215 49F8192 7J0202 7-H-97
    Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-49F8192A FLASH MEMORY RELIABILITY DATA - 150°C RETENTION BAKE (PLASTIC) - 125°C DYNAMIC LIFE TEST (PLASTIC) - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLING - 131°C/85% RELATIVE HUMIDITY HAST TEST


    Original     		AT-49F8192A AT-49F8192A 7G4406-1 7S0029G 7H4713A 7S0170B 7T0048A 7J0202A 7J0202 7J2728 1H0132 8S02 7H9749 9J0003 9H4501 0H1055-1 2E0215 49F8192 7J0202 7-H-97 PDF