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    AT24C128

    Abstract: AT3500 ATMEL Qualification Package AT24C128 at350 AT35000 Atmel AT35523 Product Reliability Test ATMEL AT35000 package qualification
    Text: AT24C128 AT35523 2-Wire Bus Serial EEPROM Product Qualification • 2325 Orchard Parkway • San Jose CA 95131 • The AT24C128 2-Wire Bus Serial EEPROM is fabricated on the AT35000 CMOS process. With the exception of HBM ESD, all tests were performed at Atmel’s Colorado


    Original     		PDF AT24C128 AT35523) AT24C128 AT35000 AT24C128. AT35523 2G5606 AT3500 ATMEL Qualification Package AT24C128 at350 Atmel AT35523 Product Reliability Test ATMEL AT35000 package qualification

    MIL-STD-883 Method 3015.7

    Abstract: atmel lot marking eeprom atmel 922 AT89C5114 breakdown gate oxide atmel 336 DYNAMIC RAM CROSS REFERENCE Atmel eeprom Cross Reference Atmel 434 Atmel AT35523 Product Reliability Test
    Text: T8xC5121 QualPack Qualification Package T8xC5121 C51 Microcontrollers T8xC5121 FEBRUARY 2003 Rev. 0 – 2003 February 1 T8xC5121 QualPack 1 Table of contents 1 TABLE OF CONTENTS .2


    Original     		PDF T8xC5121 T8xC5121 MIL-STD-883 Method 3015.7 atmel lot marking eeprom atmel 922 AT89C5114 breakdown gate oxide atmel 336 DYNAMIC RAM CROSS REFERENCE Atmel eeprom Cross Reference Atmel 434 Atmel AT35523 Product Reliability Test