DS1669
Abstract: No abstract text available
Text: RELIABILITY MONITOR PRODUCT MONITOR DATE DATE CODE ASSEMBLY FACILITY ASSEMBLY LOT NO PROCESS TYPE PACKAGE TYPE DS1669 Nov-96 9642 B3 OMEDATA DD628106AAA 1.2µ OX/NI EEPROM 08 SOIC 200 STRESS/JOB NO. READPOINT Sample Size/No. of Fails Preconditioning (P/C):
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DS1669
Nov-96
DD628106AAA
P-18594
P-18638,
P-18638
P-18733
DS1669
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P-18733
Abstract: No abstract text available
Text: RELIABILITY MONITOR PRODUCT MONITOR DATE DATE CODE ASSEMBLY FACILITY ASSEMBLY LOT NO PROCESS TYPE PACKAGE TYPE DS1669 Nov-96 9642 B3 OMEDATA DD628106AAA 1.2µ OX/NI EEPROM 08 SOIC 208 STRESS/JOB NO. READPOINT Sample Size/No. of Fails Preconditioning (P/C):
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PDF
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Nov-96
P-18594
P-18638,
P-18638
DD628106AAA
DS1669
P-18733
P-18734
P-18735
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dk52
Abstract: P-16890 17872 p1908 P1875 P-18701
Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 SUMMARY TYPE: PRODUCT DS1302 DS1302 DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 MONITOR DATE JOB NO. Mar-96 Sep-96
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DS1302)
Mar-96
Sep-96
Feb-96
Aug-96
Nov-96
Feb-97
May-96
dk52
P-16890
17872
p1908
P1875
P-18701
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DS1868
Abstract: DL6-11 c19643 dallas date code ds12887 P1788 P-18182 dk52
Text: RELIABILITY MONITOR PRODUCT DS1302 DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V.SUMMARY DS1
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DS1302
DS1868
DS21S07A
DL6-11
c19643
dallas date code ds12887
P1788
P-18182
dk52
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DK53
Abstract: dk52 P-17422 P19500 P1908 P-17411 DN546229ATA DS1000M
Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 PRODUCT MONITOR DATE DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 Mar-96 Sep-96
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DS1302)
DS1302
DS1868
DS21S07A
DS80C320
DK53
dk52
P-17422
P19500
P1908
P-17411
DN546229ATA
DS1000M
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