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    Untitled

    Abstract: No abstract text available
    Text: RELIABILITY MONITOR PRODUCT MONITOR DATE DATE CODE ASSEMBLY FACILITY ASSEMBLY LOT NO PROCESS TYPE PACKAGE TYPE DS1267 Jul-97 9727 A1 ANAM, K. DN716805AABC 1.2µ OX/NI 16 SOIC STRESS/JOB NO. Preconditioning P/C : HTC Vapor Phase P-20071 READPOINT (Sample Size/No. of Fails)


    Original     		DS1267 Jul-97 P-20071 P-20136 P-20137, P-20183 P-20184 P-20185 C/100% P-20186 PDF

    P-20606

    Abstract: c19643 DS1868 p19500 p1908 DD642 P19-50 B59728 P2050
    Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 PRODUCT DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS2401 DS2401 DS2401 DS80C320 DS80C320 DS80C320 DS80C320 MONITOR DATE JOB NO. Mar-97 Jun-97 Sep-97 Feb-97 Feb-97


    Original     		DS1302) Mar-97 Jun-97 Sep-97 Feb-97 May-97 Aug-97 P-20606 c19643 DS1868 p19500 p1908 DD642 P19-50 B59728 P2050 PDF