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    Untitled

    Abstract: No abstract text available
    Text: DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244–3292 214 450–0400 Date: June 21, 1996 Subject: PRODUCT CHANGE NOTICE – G61401 Description: DS5002M Burn–in Reduction Description of Change: This memo is to notify you of a change in the burn–in duration for the DS5002M Secure Micro. The


    Original     		PDF G61401 DS5002M

    Untitled

    Abstract: No abstract text available
    Text: DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244–3292 214 450–0400 Date: September 14, 1995 To: Subject: PRODUCT CHANGE NOTICE – I50801 Description: DS5002M Metal Planarization Change The attached letter has been generated as a part of the Dallas Semiconductor Product Change Notification


    Original     		PDF I50801 DS5002M DS5002M

    9940

    Abstract: No abstract text available
    Text: DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244-3292 972 371-4000 Date: 9/28/99 Subject: PRODUCT CHANGE NOTICE – I92201 Description: DS5002M revision change from B4 to C5


    Original     		PDF I92201 DS5002M 9940

    K4010

    Abstract: K40101
    Text: DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244–3292 214 450–0400 Date: November 18, 1994 To: Subject: PRODUCT CHANGE NOTICE – K40101 Description: DS5002M Revision Change From M2 to M3 This memo is to notify you of a change in revision for the DS5002M secure microcontroller from revision M2 to M3.


    Original     		PDF K40101 DS5002M K4010 K40101

    DS2503

    Abstract: DS12C885 DS2505 DS1225Y DS2068 DS2414 DS1868 c1 a6 B712 DS83C950
    Text: RMP Process Samples 0.8 µm Double Poly, Double Metal Monitor Device s Product Rev DS2154 DS2152 A2 DS2154 A2 DS80CH10 A3 DS80CH10 A5 0.6 µm 0.6 µm A2 DS32KHZ A6 A3 Double Poly, Double Metal (Ti/TiN layers used on all Metals) Product Rev DS1722 A2 DS1775


    Original     		PDF DS2154 DS2152 DS80CH10 DS2154 DS80CH10 DS32KHZ DS1722 DS21352 DS21552 DS2196 DS2503 DS12C885 DS2505 DS1225Y DS2068 DS2414 DS1868 c1 a6 B712 DS83C950

    DS-1100

    Abstract: DS1620 C2 ds-2197 ds1216 DS13d12 DS2414 DS1868 DS2505 DS1225Y DS1640
    Text: RMP Process Samples 0.8 µm Double Poly, Double Metal Monitor Device s Product Rev DS2154 DS2152 A2 DS2154 A2 DS80CH10 A3 DS80CH10 A5 0.6 µm 0.6 µm A2 Product Rev DS1722 A2 DS1775 A1 DS21352 A3 DS21352 A4 DS21354 A1 DS2148 A1 DS21552 A3 DS21554 A3 DS2196


    Original     		PDF DS2154 DS2152 DS80CH10 DS2154 DS80CH10 DS32KHZ DS1722 DS21352 DS21552 DS2196 DS-1100 DS1620 C2 ds-2197 ds1216 DS13d12 DS2414 DS1868 DS2505 DS1225Y DS1640

    DS1235YW

    Abstract: ds1480 DS1235YWl DS2228-1MG DS1242 DS2402 ds2403 DS1990A-f50 DS2228-4MG DS1833A
    Text: RELIABILITY MONITOR PROCESS TECHNOLOGY SAMPLING PLAN VEHICLE TECHNOLOGY 0.8 µ Double Poly, Single Metal w/TEOS-OxyNitride Passivation DS87520 DS1302 DS1315 DS17485 DS21S07A DS2153 DS1868 DS1706 DS1800 DS1817 DS1866 DS1305 DS17285 DS1306 DS17485 DS1307 DS17885


    Original     		PDF DS87520 DS87523 DS87530 DS2118 DS1302 DS1315 DS17485 DS1721 DS83CH20 DS1235YW ds1480 DS1235YWl DS2228-1MG DS1242 DS2402 ds2403 DS1990A-f50 DS2228-4MG DS1833A

    ds1480

    Abstract: DS13d12 DS13D14 DS83C950 DS-1100 DS1214 ds1272 ds1216 DS1671 DS1868
    Text: RMP Process Samples 0.8 µm Double Poly, Double Metal Monitor Device s Product Rev DS2154 DS2152 A2 DS2154 A2 DS80CH10 A3 DS80CH10 A5 0.6 µm 0.6 µm A2 A6 Double Poly, Double Metal (Ti/TiN layers used on all Metals) Product Rev DS1775 A1 DS21352 A3 DS21354


    Original     		PDF DS2154 DS2152 DS80CH10 DS2154 DS80CH10 DS32KHZ DS1775 DS21552 DS87C550 DS21352 ds1480 DS13d12 DS13D14 DS83C950 DS-1100 DS1214 ds1272 ds1216 DS1671 DS1868

    TR-TSY-000357

    Abstract: No abstract text available
    Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 1996 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/20/96 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		PDF MIL-STD-883, TR-TSY-000357

    in-coming quality control

    Abstract: "Dallas Semiconductor" TOP MARKING
    Text: RELIABILITY MONITOR PROGRAM FIRST QUARTER 1997 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/20/97 NOTICE RELIABILITY MONITOR PROGRAM CHANGE Starting with the Third Quarter 96 Report, the Reliability Monitor will


    Original     		PDF MIL-STD-883, in-coming quality control "Dallas Semiconductor" TOP MARKING

    DS1235YW

    Abstract: DS1235YWL DS2228-1MG DS1242 DS1868 DS1187 ds1480 DS1671 DS83520 DS1241
    Text: RELIABILITY MONITOR PROCESS TECHNOLOGY SAMPLING PLAN VEHICLE DS87520 TECHNOLOGY 0.8 µ Double Poly, Single Metal w/TEOS-OxyNitride Passivation DS87520 DS1302 DS1585 DS1306 DS17485 DS1307 DS17885 DS1315 DS1803 DS1623 DS1806 DS1627 DS2430A DS1670 DS2437 DS1673


    Original     		PDF DS87520 DS87523 DS87530 DS2118 DS1302 DS1302 DS1721 DS83CH20 DS12885B DS1235YW DS1235YWL DS2228-1MG DS1242 DS1868 DS1187 ds1480 DS1671 DS83520 DS1241