M611X

Contextual Info: M611x Series 5 x 7 mm, 3.0, 3.3 & 5.0 Volt, HCMOS or Clipped Sinewave, Precision TCXO/TCVTCXO Product Features • Tight stability 0.3 ppm over wide industrial temperature range (-40 °C to +85 °C) • 3.0 V, 3.3 V and 5.0 V versions • Wide frequency range 8-52 MHz

Contextual Info: M611x Series 5 x 7 mm, 3.0, 3.3 & 5.0 Volt, HCMOS or Clipped Sinewave, Precision TCXO/TCVTCXO Product Features • Tight stability 0.3 ppm over wide industrial temperature range (-40 °C to +85 °C) • 3.0 V, 3.3 V and 5.0 V versions • Wide frequency range 8-52 MHz

Contextual Info: M611x Series 5 x 7 mm, 3.0, 3.3 & 5.0 Volt, HCMOS or Clipped Sinewave, Precision TCXO/TCVTCXO Product Features • Tight stability 0.3 ppm over wide industrial temperature range (-40 °C to +85 °C) • 3.0 V, 3.3 V and 5.0 V versions • Wide frequency range 8-52 MHz

Contextual Info: M611x Series 5 x 7 mm, 3.0, 3.3 & 5.0 Volt, HCMOS or Clipped Sinewave, Precision TCXO/TCVTCXO M6110Sxxx, M6111Sxxx & M6112Sxxx - Contact factory for datasheets. • • • • • • Tight stability 0.3 ppm over wide industrial temperature range (-40 °C to +85 °C)

TCVCXO

Contextual Info: M611x Series 5 x 7 mm, 3.0, 3.3 & 5.0 Volt, HCMOS or Clipped Sinewave, Precision TCXO/TCVCXO Product Features • Tight stability 0.3 ppm over wide industrial temperature range (-40 °C to +85 °C) • 3.0 V, 3.3 V and 5.0 V versions • Wide frequency range 8-52 MHz

M6112

Contextual Info: M611x Series 5 x 7 mm, 3.0, 3.3 & 5.0 Volt, HCMOS or Clipped Sinewave, Precision TCXO/TCVTCXO Product Features • Tight stability 0.3 ppm over wide industrial temperature range (-40 °C to +85 °C) • 3.0 V, 3.3 V and 5.0 V versions • Wide frequency range 8-52 MHz

Contextual Info: M611x Series 5 x 7 mm, 3.0, 3.3 & 5.0 Volt, HCMOS or Clipped Sinewave, Precision TCXO/TCVCXO Product Features • • • • • Tight stability performance +/-0.3 ppm over Industrial Temperatures (-40 °C to +85 °C) (+/-0.2ppm) over Commercial Temperatures (0 to 70C)

Contextual Info: M611x Series 5 x 7 mm, 3.0, 3.3 & 5.0 Volt, HCMOS or Clipped Sinewave, Precision TCXO/TCVCXO Product Features • Tight stability 0.3 ppm over wide industrial temperature range (-40 °C to +85 °C) • 3.0 V, 3.3 V and 5.0 V versions • Wide frequency range 8-52 MHz

Contextual Info: M611x Series 5 x 7 mm, 3.0, 3.3 & 5.0 Volt, HCMOS or Clipped Sinewave, Precision TCXO/TCVTCXO Product Features • Tight stability 0.3 ppm over wide industrial temperature range (-40 °C to +85 °C) • 3.0 V, 3.3 V and 5.0 V versions • Wide frequency range 8-52 MHz

40.000000MHz

Abstract: 400 Series TCXO M611X M-TRON
Contextual Info: Introduces M611x Series HCMOS/Clipped Sinewave TCXO/TCVCXO Features:  Tight stability 0.3 ppm over wide industrial temperature range (-40 °C to +85 °C)  3.0 V, 3.3 V and 5.0 V versions  Wide frequency range 8-52 MHz  Low phase noise  Excellent G-sensitivity performance: 1.5 ppb/G

M6112

Contextual Info: M tronPTI .when timing matters M611x HCMOS/Clipped Sinewave TCXO/TCVCXO <>"V -40°C ~+85°C T ^ :^ 3 .0 V , 3.3V, 5.0V^ ft t&'f&'f “f £ ^ ^ |a ffl8 - 5 2 M H z # j$ 6 ( lG * $ y t : 1.5ppb/G M M U % ( W L A N ) £-SM£ i S'] i t $. f t (GPS) MtronPTI

TCVCXO

Abstract: MtronPTI m
Contextual Info: Introduces M611x Series HCMOS/Clipped Sinewave TCXO/TCVCXO Features:  Tight stability 0.3 ppm over wide industrial temperature range (-40 °C to +85 °C)  3.0 V, 3.3 V and 5.0 V versions  Wide frequency range 8-52 MHz  Low phase noise  Excellent G-sensitivity performance: 1.5 ppb/G

Contextual Info: M611x Series 5 x 7 mm, 3.0, 3.3 & 5.0 Volt, HCMOS or Clipped Sinewave, Precision TCXO/TCVTCXO Product Features • Tight stability 0.3 ppm over wide industrial temperature range (-40 °C to +85 °C) • 3.0 V, 3.3 V and 5.0 V versions • Wide frequency range 8-52 MHz

ST 9427

Abstract: 155-0241 155-0241-02 M726* TRANSISTOR st 9635 1550371 74935 M605030 806-0300 transistor 9427
Contextual Info: December 1997 RR-B2A High-Frequency Bipolar Products Reliability Report This report presents the product reliability data for Maxim’s High-Frequency Bipolar analog and digital products. This data was collected from extensive reliability stress tests performed between June 1, 1994 and