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    PQ160, Search Results

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    PQ160, Price and Stock

    Microchip Technology Inc A42MX09-PQ160

    IC FPGA 101 I/O 160QFP
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    DigiKey A42MX09-PQ160 Tray
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    Avnet Americas A42MX09-PQ160 Tray 24
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    Microchip Technology Inc A42MX16-FPQ160

    IC FPGA 125 I/O 160QFP
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    DigiKey A42MX16-FPQ160 Tray
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    Microchip Technology Inc A1280A-1PQ160C

    IC FPGA 125 I/O 160QFP
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    DigiKey A1280A-1PQ160C Tray
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    AMD XC4010D-5PQ160C

    IC FPGA 129 I/O 160QFP
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    DigiKey XC4010D-5PQ160C Tray 24
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    AMD XC4006E-2PQ160I

    IC FPGA 128 I/O 160QFP
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    DigiKey XC4006E-2PQ160I Tray 4
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    Find more PQ160, price and stock on Findchips.com

    PQ160, Datasheets (4)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    PQ160QH04N Nihon Inter Electronics 40 V, 160 A, diode Original PDF
    PQ160QH04N Nihon Inter Electronics SCHOTTKY BARRIER DIODE MODULE Scan PDF
    PQ160QH06N Nihon Inter Electronics 60 V, 160 A, diode Original PDF
    PQ160QH06N Nihon Inter Electronics SCHOTTKY BARRIER DIODE MODULE Scan PDF

    PQ160, Datasheets Context Search

    Catalog Datasheet MFG & Type Document Tags PDF

    121C-2

    Abstract: XC1765D XC95108 XL mp8000ch4 p103 pot datasheet reliability report PQFP240 XC95xxx 17256d D1 PGA 478
    Text: The Reliability Data Program Expanded Version Jan. 1, 2000 Cover P1 TABLE OF CONTENTS Introduction .…4 The Reliability Program. .…4


    Original     		XC4005XL PQFP-160 PLCC-84, HQFP-304, VQFP-100 XC4044XL XC4013XLA 121C-2 XC1765D XC95108 XL mp8000ch4 p103 pot datasheet reliability report PQFP240 XC95xxx 17256d D1 PGA 478 PDF

    XC95XXXL

    Abstract: XC95XXX XC1765D PQFP240 C17S xc9536 A9903 XCV1000E FG HT 12E APPLICATION Reliability Test Methods for Packaged Devices
    Text: The Reliability Data Program Expanded Version July 1, 2000 Cover P1 TABLE OF CONTENTS Introduction .…4 The Reliability Program. .…4


    Original     		XC4005XL PQFP-160 PLCC-84, HQFP-304, VQFP-100 XC4044XL XC4013XLA XC95XXXL XC95XXX XC1765D PQFP240 C17S xc9536 A9903 XCV1000E FG HT 12E APPLICATION Reliability Test Methods for Packaged Devices PDF