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    Cypress Semiconductor

    Cypress Semiconductor CY7C28975WC

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    CY7C289 Datasheets (11)

    Part
    ECAD Model
    Manufacturer
    Description
    Curated
    Datasheet Type
    PDF
    CY7C289-65WC
    		Cypress Semiconductor 65,536 x 8 Reprogrammable Fast Column Access PROM Scan PDF
    CY7C289-75DMB
    		Cypress Semiconductor 65,536 x 8 Reprogrammable Fast Column Access PROM Scan PDF
    CY7C289-75LMB
    		Cypress Semiconductor 65,536 x 8 Reprogrammable Fast Column Access PROM Scan PDF
    CY7C289-75QMB
    		Cypress Semiconductor 65,536 x 8 Reprogrammable Fast Column Access PROM Scan PDF
    CY7C289-75WC
    		Cypress Semiconductor 65,536 x 8 Reprogrammable Fast Column Access PROM Scan PDF
    CY7C289-75WMB
    		Cypress Semiconductor 65,536 x 8 Reprogrammable Fast Column Access PROM Scan PDF
    CY7C289-85DMB
    		Cypress Semiconductor 65,536 x 8 Reprogrammable Fast Column Access PROM Scan PDF
    CY7C289-85LMB
    		Cypress Semiconductor 65,536 x 8 Reprogrammable Fast Column Access PROM Scan PDF
    CY7C289-85QMB
    		Cypress Semiconductor 65,536 x 8 Reprogrammable Fast Column Access PROM Scan PDF
    CY7C289-85WC
    		Cypress Semiconductor 65,536 x 8 Reprogrammable Fast Column Access PROM Scan PDF
    CY7C289-85WMB
    		Cypress Semiconductor 65,536 x 8 Reprogrammable Fast Column Access PROM Scan PDF

    CY7C289 Datasheets Context Search

    Catalog Datasheet
    Type
    Document Tags
    PDF

    CY7C601

    Contextual Info: CY7C285 CY7C289 P R E L IM IN A R Y ' CYPRESS SEMICONDUCTOR 65,536 x 8 PROM Reprogrammable Fast Column Access Features Product Characteristics • CMOS for optimum speed/ power T h e C Y 7C 285 an d the C Y 7C 289 are high-perform ance 65,536 \ 8 bit CM O S


    OCR Scan     		CY7C285 CY7C289 CY7C289-65WC CY7C289-75WC CY7C289-75DMB CY7C289-75WMB CY7C289-75LMB CY7C289-7 CY7C601 PDF

    CY7C601

    Abstract: ac1122 333Q AU-AIS 19D4T
    Contextual Info: CY7C285 CY7C289 CYPRESS - W SEMICONDUCTOR Features Functional Description • CMOS for optimum speed/power • Windowed for reprogrammabllity • Unique fast column access — t/VA —20 ns commercial — U a = 25 ns (military) The CY7C285 and the CY7C289 are


    OCR Scan     		CY7C285 CY7C289 7C289) 300-mil CY7C289 28-pin timeCY7C289â CY7C601 ac1122 333Q AU-AIS 19D4T PDF

    203d6

    Contextual Info: CY7C285 CY7C289 CYPRESS SEMICONDUCTOR Features Functional Description • CMOS for optimum speed/power • Windowed for reprogrammability • Unique fast column access — <aa = 20 ns commercial — t*A = 25 n t (military) T h e CY7C285 an d th e CY7C289 are


    OCR Scan     		CY7C285 CY7C289 7C289) 300-mil 7C289 89-75W 289--85DM 289--85QM 89--85W 203d6 PDF

    CY7C601

    Contextual Info: CY7C285 CY7C289 PRELIMINARY P Y P P irc q SEMICONDUCTOR 65,536 x 8 Reprogrammable Fast Column Access PROM Features Functional Description • C M O S fo r o p tim u m speed/pow er T h e CY7C285 and th e CY7C289 are highperform ance 65,536 by 8-bit C M O S


    OCR Scan     		CY7C285 CY7C289 300-m 7C289-65W 7C289-75W 7C289-75D 7C289-75LM 7C289-75Q 7C289-85W CY7C601 PDF

    CY27S03A

    Abstract: 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide
    Contextual Info: Thermal Management and Component Reliability slope of the logarithmic plots is given by the activation energy of the failure mechanisms causing thermally activated wear out of the device see Figure 1 . One of the key variables determining the long-term reliability


    Original     		CY7C122 CY27S03A 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide PDF

    cy7c611

    Abstract: CY7C602A asi cypress CY7C157A CY7C611A 38R1
    Contextual Info: CY7C611A CYPRESS SEMICONDUCTOR Features • SPARC CD processor optimized for em­ bedded control applications • Reduced Instruction Set Computer RISC architecture — Simple format instructions — M ost instructions execute in a single cycle • Very high performance


    OCR Scan     		CY7C611A 32-Bit 40-ns 240-ns 24-bit 38-R-10003-A CY7C611 CY7C602A asi cypress CY7C157A 38R1 PDF

    CY7C9101

    Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901
    Contextual Info: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the


    Original     		PDF

    CY7C157A

    Contextual Info: CY7C611A CYPRESS SEMICONDUCTOR Features • SPARC processor optimized for em ­ bedded control applications 32-Bit RISC Controller — Privileged instructions • 136 32-bit registers — Eight overlapping windows o f 24 registers each • Artificial intelligence support


    OCR Scan     		CY7C611A 40-ns 240-ns 32-bit 24-bit 7C611A CY7C61 CY7C157A PDF