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    DS2175

    Abstract: No abstract text available
    Text: RELIABILITY MONITOR PRODUCT MONITOR DATE DATE CODE ASSEMBLY FACILITY ASSEMBLY LOT NO PROCESS TYPE PACKAGE TYPE DS2175 Jul-97 9712 D1 ANAM, K. DN702069AAJ 2.0µ OXIDE 16 SOIC STRESS/JOB NO. READPOINT Sample Size/No. of Fails Preconditioning (P/C): T/C: -55°C to +125°C, 10~


    Original     		PDF DS2175 Jul-97 DN702069AAJ P-20058 P-20082 P-20083, P-20122 P-20123 39/0EADPOINT DS2175

    P-20606

    Abstract: c19643 DS1868 p19500 p1908 DD642 P19-50 B59728 P2050
    Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 PRODUCT DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS2401 DS2401 DS2401 DS80C320 DS80C320 DS80C320 DS80C320 MONITOR DATE JOB NO. Mar-97 Jun-97 Sep-97 Feb-97 Feb-97


    Original     		PDF DS1302) Mar-97 Jun-97 Sep-97 Feb-97 May-97 Aug-97 P-20606 c19643 DS1868 p19500 p1908 DD642 P19-50 B59728 P2050

    DS1868

    Abstract: DL6-11 c19643 dallas date code ds12887 P1788 P-18182 dk52
    Text: RELIABILITY MONITOR PRODUCT DS1302 DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V.SUMMARY DS1


    Original     		PDF DS1302 DS1868 DS21S07A DL6-11 c19643 dallas date code ds12887 P1788 P-18182 dk52