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    EPM1270GM256I5 Price and Stock

    Intel Corporation EPM1270GM256I5N

    IC CPLD 980MC 6.2NS 256MBGA
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    DigiKey EPM1270GM256I5N Tray 176
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    Altera Corporation EPM1270GM256I5N

    CPLD - Complex Programmable Logic Devices
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    Mouser Electronics EPM1270GM256I5N
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    Bristol Electronics EPM1270GM256I5N 67
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    Quest Components EPM1270GM256I5N 76
    • 1 $142.176
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    EPM1270GM256I5N 53
    • 1 $130
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    EPM1270GM256I5 Datasheets (1)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    EPM1270GM256I5N Altera Embedded - CPLDs (Complex Programmable Logic Devices), Integrated Circuits (ICs), IC CPLD 980MC 6.2NS 256MBGA Original PDF

    EPM1270GM256I5 Datasheets Context Search

    Catalog Datasheet MFG & Type Document Tags PDF

    PCN0813

    Abstract: EPM240T100C5N EP1C3T144C8N EPM240T100I5N EPM1270T144C5N EPM570T144C5N EPM240T100C5 EPM570T100C5N EPM2210F256A5N f324
    Text: Revision: 1.0.0 PROCESS CHANGE NOTIFICATION PCN0813 POLYIMIDE WAFER COAT REMOVAL FOR SELECTED ALTERA DEVICES Change Description Altera is implementing a change to the wafer coat on selected product lines fabricated at Taiwan Semiconductor Manufacturing Co. TSMC . This change includes the exclusion of the existing


    Original     		PCN0813 PM2210GF256C5N EPM2210GF256C5RR EPM2210GF256I5 EPM2210GF256I5N EPM2210GF324C3 EPM2210GF324C3N EPM2210GF324C4 EPM2210GF324C4N EPM2210GF324C5 PCN0813 EPM240T100C5N EP1C3T144C8N EPM240T100I5N EPM1270T144C5N EPM570T144C5N EPM240T100C5 EPM570T100C5N EPM2210F256A5N f324 PDF

    ADV0907

    Abstract: ALTERA PART MARKING EP3C16M164C7N EPM240ZM68I8N EPM570ZM100I8N EP3C16M164I7N altera epm570 Date Code Formats EP3C16M164C8N epm1270 fpga EP3C10M164I7N
    Text: Revision: 1.0.0 CUSTOMER ADVISORY ADV0907 ADDITIONAL ASSEMBLY PLANT FOR MBGA PACKAGES Change Description Altera will be introducing Amkor, Philippines as an additional assembly source for Altera Micro FineLine BGA MBGA packages. This change does not affect the form, fit, or function of the


    Original     		ADV0907 ADV0907 ALTERA PART MARKING EP3C16M164C7N EPM240ZM68I8N EPM570ZM100I8N EP3C16M164I7N altera epm570 Date Code Formats EP3C16M164C8N epm1270 fpga EP3C10M164I7N PDF

    CYCLONE 3 ep3c25f324* FPGA

    Abstract: FBGA-484 datasheet EP3C16F484I7N EPM570T144I5 EP3C10E144I7N EP3C25F324I7N EPM1270F256I5 EPM1270T144I5 EP2C5Q208I8N EP3C120F780I7N
    Text: Technical Brief Extended Temperature Support for Cyclone II, Cyclone III, and MAX II Devices Introduction Semiconductor devices undergo at least two types of testing: device characterization and production testing. Device characterization is used to verify the performance of a semiconductor design and its physical implementation.


    Original     		PDF