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Catalog Datasheet	MFG & Type	PDF	Document Tags
arcflash Abstract: ks fuses IEEE1584 F1959 fastcam 1307C Text: Arc Flash Basics: Testing Update M. Lang and T. Neal Ferraz Shawmut, 374 Merrimac St, Newburyport, MA 01950, USA mike.lang@ferrazshawmut.com Neal Associates Ltd., 106 Leetes Island Road, Guilford, CT 06437, USA nealassoc@earthlink.net Abstract: Arc flash hazard calculations used to predict the magnitude of the heat hazard are based on tests with	Original	PDF	F1959/F1959M-06a arcflash ks fuses IEEE1584 F1959 fastcam 1307C
arcflash Abstract: Ferraz Shawmut IEEE1584 fastcam plasma ignition Text: Effect of Electrode Orientation in Arc Flash Testing R. Wilkins, M. Allison and M. Lang October 2005 Ferraz Shawmut, Inc. 374 Merrimac Street Newburyport, MA 01950-1998 USA 2006 IEEE. Reprinted from the record of the 2005 Industry Applications Conference, October 2005.	Original	PDF	PCIC-2004-39, arcflash Ferraz Shawmut IEEE1584 fastcam plasma ignition
1234567890ABCDEF Abstract: SiC semiconductors Text: D IS TIN C TIV E C H A R A C TE R IS T IC S 128 entries of 48 bits each for storage of record tags in a Content-addressable Memory for Fully-associative caching Nibble masking allows configuring the CAM versus Associated data from 24 to 48 bits in four-bit increments	OCR Scan	PDF	-2-815-8536x6201 1234567890ABCDEF SiC semiconductors
VBO+19-16+DT1 Abstract: No abstract text available Text: DATA DISTINCTIVE CHARACTERISTICS 128 entries of 48 bits each for storage of record tags in a Content-addressable Memory for Fully-associative caching Nibble masking allows configuring the CAM versus Associated data from 24 to 48 bits in four-bit increments	OCR Scan	PDF	63-2-815-8536x6201 VBO+19-16+DT1