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Catalog Datasheet	MFG & Type	Document Tags	PDF
SN74ABT3612 Abstract: B1494 Text: SN74ABT3612 64 x 36 x 2 CLOCKED BIDIRECTIONAL FIRST-IN, FIRST-OUT MEMORY S C BS129F - JULY 1992 - R EVISED FEBRUARY 1996 EFB, FFB, AEB, and AFB Flags Synchronized by CLKB Passive Parity Checking on Each Port Parity Generation Can Be Selected for Each Port	OCR Scan	SN74ABT3612 36-bit 0103bSE B1494	PDF
SN74ALVCH162525 Abstract: No abstract text available Text: SN74ALVCH162525 18-BIT REGISTERED BUS TRANSCEIVER WITH 3-STATE OUTPUTS SCES058- NOVEMBER 1995 • Member of the Texas Instruments Wldebus Family • EPIC™ Enhanced-Performance Implanted CMOS Submicron Process • B-Port Outputs Have Equivalen 26-ft Series	OCR Scan	SN74ALVCH162525 18-BIT SCES058- MIL-STD-883C, JESD-17 300-mil 010E40E	PDF
QCH7727 Abstract: SN54ABT18646 JM9E H TR 1A60 Text: SN54ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVERS AND REGISTERS _ S GBS306 - AU G U S T 1992 - REVISED AU G U S T 1994 • Members of the Texas Instruments SCOPE Family of Testability Products S C O P E ™ Instruction Set - IEEE Standard 1149.1-1990 Required	OCR Scan	SN54ABT18646 18-BIT SGBS306 6S5303 QCH7727 JM9E H TR 1A60	PDF
SN74LVCH16244A Abstract: No abstract text available Text: SN74LVCH16244A 16-BIT BUFFER/DRIVER WITH 3-STATE OUTPUTS S C A S 3 1 3 B - NO VEM BER 1993 - REVISED AUG UST 1995 DGG OR DL PACKAGE CTOP VIEW • Member of the Texas Instruments Wldebus Family • EPIC™ Enhanced-Performance Implanted CMOS) Submicron Process	OCR Scan	SN74LVCH16244A 16-BIT SCAS313B- MIL-STD-883C, JESD-17 AThl723	PDF