1494-0059
Abstract: strobe trigger CR2477 81110A hz 91710 EN50082-1 IEC1010 81-100A 81104A W343
Text: Agilent 81101A 50 MHz One-Channel Pulse Generator Data Sheet Key Features • • • • • • • • • • Agilent 81100 Family of Pulse/Pattern Generators The Agilent Technologies 81101A pulse generator belongs to the 81100 family. All members have the same
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1101A
1101A
5967-6274E
1494-0059
strobe trigger
CR2477
81110A
hz 91710
EN50082-1
IEC1010
81-100A
81104A
W343
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PDF
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81110A
Abstract: CR2477 81130A 8110A 65503P hz 91710 E8311A E8312A EN50082-1 IEC1010
Text: Agilent Technologies 81100 Family Pulse/Pattern Generator Technical Specifications Flexible pulses or patterns for digital designs Introduction to the 81100 Family Signals for testing digital designs and components All members have the same programming/user interfaces,
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1101A,
1104A,
1110A
1130A
5980-1215E
81110A
CR2477
81130A
8110A
65503P
hz 91710
E8311A
E8312A
EN50082-1
IEC1010
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81110A
Abstract: 81130A CR2477 hz 91710 E8311A E8312A EN50082-1 IEC1010 811xx-91021 81104A
Text: Agilent 81100 Family of Pulse Pattern Generators Data Sheet – Version 1.3 Agilent 81110A Signals for testing digital designs and components Flexible Pulses or Patterns for Digital Designs – Key Features The Agilent 81101A, 81104A, 81110A and 81130A generate all
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1110A
1101A,
1104A,
1110A
1130A
5980-1215E
81110A
81130A
CR2477
hz 91710
E8311A
E8312A
EN50082-1
IEC1010
811xx-91021
81104A
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Untitled
Abstract: No abstract text available
Text: Agilent 81100 Family of Pulse Pattern Generators Data Sheet – Version 1.3 Agilent 81110A Signals for testing digital designs and components Flexible Pulses or Patterns for Digital Designs – Key Features The Agilent 81101A, 81104A, 81110A and 81130A generate all
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1110A
1101A,
1104A,
1110A
1130A
5980-1215E
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PDF
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Untitled
Abstract: No abstract text available
Text: Agilent 81100 Family of Pulse/Pattern Generators Dual Clock Gbit Chip Test Technical Overview, Version 2.0 Introduction Agilent Technologies pulse generators are a necessity in the world of semiconductor test clocks and digital communication clocks. Many customers need the ability to generate more than one clock signal simultaneously and at multiple frequencies. The
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1150A
1150A
BP2-19-13)
5991-2247EN
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Untitled
Abstract: No abstract text available
Text: Agilent 81150A and 81160A Pulse Function Arbitrary Noise Generators Data Sheet, Version 1.1 Which Product Meets Your Needs? High precision pulse generators enhanced with versatile signal generation, modulation and distortion capabilities for: • Accurate signals to test your device and not your signal source
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1150A
1160A
5989-6433EN
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PDF
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Untitled
Abstract: No abstract text available
Text: Agilent 81150A and 81160A Pulse Function Arbitrary Noise Generators Data Sheet, Version 1.1 Which Product Meets Your Needs? High precision pulse generators enhanced with versatile signal generation, modulation and distortion capabilities for: • Accurate signals to test your device and not your signal source
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1150A
1160A
5989-6433EN
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PDF
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Untitled
Abstract: No abstract text available
Text: Keysight 81150A and 81160A Pulse Function Arbitrary Noise Generators Data Sheet Introduction High precision pulse generators enhanced with versatile signal generation, modulation and distortion capabilities for: – Accurate signals to test your device and not your signal source
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1150A
1160A
1160A
BP-05-19-14)
5989-6433EN
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PDF
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Untitled
Abstract: No abstract text available
Text: Agilent N4916A De-Emphasis Signal Converter Data Sheet Version 1.1 De-Emphasis Signal Injection Enables Robust Receiver and Board Designs: • • • • • De-emphasis signal converter N4916A • • Industry-first de-emphasis signal converter Variable de-emphasis post-cursor up to 12 dB
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N4916A
N4903A
81141/81142A
N4916A
5989-6062EN
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B1517A
Abstract: B1525A E5288A B1500A N1301A-200 B1530 N1301A-201 N1301A-100 b1525 b1530a
Text: Agilent B1500A Semiconductor Device Analyzer Technical Overview Introduction The Agilent B1500A Semiconductor Device Analyzer with EasyEXPERT software is a complete parametric test solution. It supports all aspects of parametric test, from basic manual measurement to test automation across a
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B1500A
B1500A
5989-2785EN
B1517A
B1525A
E5288A
N1301A-200
B1530
N1301A-201
N1301A-100
b1525
b1530a
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81110A
Abstract: C3750 4072A 3458a E4980A C0804 E4980A tsk TEL Prober C3600 agilent 2599
Text: Agilent 4072A Advanced Parametric Tester Data Sheet General Description Contents General Description 1-2 Switching Matrix Subsystem 3 Pulse Switch 4 DC Measurement Subsystem: SMU Capacitance Measurement Subsystem: Agilent E4980A LCR Meter 5-7 8 Pulse Force Unit: PGU Option
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E4980A
5968-4530E
81110A
C3750
4072A
3458a
C0804
E4980A tsk
TEL Prober
C3600
agilent 2599
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Untitled
Abstract: No abstract text available
Text: Agilent B1500A Semiconductor Device Analyzer Data Sheet Introduction The Agilent B1500A Semiconductor Device Analyzer with EasyEXPERT software is a complete parametric test solution. It supports all aspects of parametric test, from basic manual measurement to test automation across a wafer in
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B1500A
B1500A
B1505A
com/find/B1505A
B2900A
com/find/B2900A
5989-2785EN
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P12xl
Abstract: TSK UF300 Tel P8LC UF3000 S2-0200 tsk UF200 TSK UF3000 P12x TEL Prober UF200
Text: Agilent 4073A Ultra Advanced Parametric Tester Data Sheet General Description Contents General Description 1-2 Switching Matrix Subsystem 3 Pulse Switch 4 DC Measurement Subsystem: SMU Capacitance Measurement Subsystem: Agilent E4980A LCR Meter 4-6 8 Pulse Force Unit: PGU Option
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E4980A
5980-1576E
P12xl
TSK UF300
Tel P8LC
UF3000
S2-0200
tsk UF200
TSK UF3000
P12x
TEL Prober
UF200
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u317
Abstract: CY2509 CY26114 AN1223 CY2309
Text: Clock Performance in Series PLLs AN1223 Associated Project: No Associated Part Family: None Software Version: None Associated Application Notes: None Abstract AN1223 discusses the complexities of designing clock trees with cascaded PLLs using clock generators and zerodelay buffers. Various timing issues and the resulting Total Timing Budget are reviewed, and sample applications
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AN1223
AN1223
CY26114CZ,
u317
CY2509
CY26114
CY2309
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4156C
Abstract: 41501B 82357b 41501A 4155C PA300 4145B hp 940 printer B2200A VX2000
Text: Agilent 4155C Semiconductor Parameter Analyzer Agilent 4156C Precision Semiconductor Parameter Analyzer Data Sheet Introduction Agilent 4155C and 4156C Basic functions • Set measurement and/or stress conditions • Control measurement and/or stress execution
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4155C
4156C
4156C
4155C
5988-9238EN
41501B
82357b
41501A
PA300
4145B
hp 940 printer
B2200A
VX2000
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PDF
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Untitled
Abstract: No abstract text available
Text: EMIF06-mSD02C3 Mini and micro-SD card IPAD EMI filtering and ESD protection Features • EMI low-pass filter ■ ESD protection ±15 kV IEC 61000-4-2 ■ Integrated pull up resistors to prevent bus floating when no card is connected ■ 50 MHz clock frequency compatibility with
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EMIF06-mSD02C3
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EMIF06-mSD02C3
Abstract: AN1751 AN2348 HFP1000
Text: EMIF06-mSD02C3 Mini and micro-SD card IPAD EMI filtering and ESD protection Features • EMI low-pass filter ■ ESD protection ±15 kV IEC 61000-4-2 ■ Integrated pull up resistors to prevent bus floating when no card is connected ■ 50 MHz clock frequency compatibility with
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EMIF06-mSD02C3
EMIF06-mSD02C3
AN1751
AN2348
HFP1000
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Untitled
Abstract: No abstract text available
Text: Agilent E8311A, E8312A Pulse/Pattern Generators 165 MHz and 330 MHz Data Sheet • • • • 1-Slot, C-size, register based Two output channels 16 Kbit patterns per channel Fast transition times: 2 ns to 200 ms variable E8311A , 0.8 ns or 1.6 ns selectable
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E8311A,
E8312A
E8311A)
E8312A)
1110A
E8311A
Hz/330
5968-5814E
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TMDS320006711
Abstract: power Combiner overview Agilent AN-409 TMS320C6000 XC2V1000 81110a pipelined matrix multiplication fpga bga 896 "channel estimation"
Text: Dual-Port Memory Simplifies Wireless Base Station Design Application Note AN-409 APPLICATION NOTE AN-409 DUAL PORT MEMORY SIMPLIFIES WIRELESS BASE STATION DESIGN ABSTRACT INTRODUCTION Recent research has shown that the digital signal processor DSP / Dual port/ field programmable gate array (FPGA) chain is a very good
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AN-409
TMDS320006711
power Combiner overview Agilent
AN-409
TMS320C6000
XC2V1000
81110a
pipelined matrix multiplication fpga
bga 896
"channel estimation"
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E8311
Abstract: 81110A E8311A E8312A EN50082-1 IEC-1010-1
Text: STEP4 Dionysos Job: 210%XXXX7930-0001 Agilent_E8311A,_ Comp: 10-24-01 Time: 15:40 OP: NN Agilent E8311A, E8312A Pulse/Pattern Generators 165 MHz and 330 MHz Data Sheet 1-Slot, C-size, register based Two output channels • 16 Kbit patterns per channel • Fast transition times: 2 ns to 200 ms variable E8311A , 0.8
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XXXX7930-0001
E8311A,
E8312A
E8311A)
E8312A)
1110A
E8311A
E8312A
Hz/330
E8311
81110A
EN50082-1
IEC-1010-1
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PDF
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NB3N65027
Abstract: No abstract text available
Text: NB3N65027DTGEVB NB3N65027 Evaluation Board User's Manual http://onsemi.com EVAL BOARD USER’S MANUAL Device Name: NB3N65027DT QSOP20 Board Name: NB3N65027DTGEVB Introduction NB3N65027 device is a 3.3 V Programmable 3 PLL Clock Synthesizer with 6 LVTTL / LVCMOS Outputs
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NB3N65027DTGEVB
NB3N65027
NB3N65027DT
QSOP20)
NB3N65027DTGEVB
NB3N65027.
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Untitled
Abstract: No abstract text available
Text: SPDT RF Switch 50Ω 500-6000 MHz Absorptive RF Switch with internal driver. Single Supply Voltage, +3V to +5V Product Features • High Isolation, 65 dB typ. at 1 GHz • Low insertion loss, 1.0 dB typ. at 1 GHz • High IP3, 50 dBm typ. at 1 GHz • Fast switching, Rise/fall time, 23 ns typ.
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VSWA2-63DR+
DG1235
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PDF
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Untitled
Abstract: No abstract text available
Text: SPDT RF Switch 50Ω500-6000MHz AbsorptiveRFSwitchwithinternaldriver. SingleSupplyVoltage,+3Vto+5V Product Features •HighIsolation,65dBtyp.at1GHz •Lowinsertionloss,1.0dBtyp.at1GHz
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VSWA2-63DR+
DG1235
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TB-407
Abstract: No abstract text available
Text: SPDT RF Switch 50Ω 500-6000 MHz Absorptive RF Switch with internal driver. Single Supply Voltage, +3V to +5V Product Features • High Isolation, 65 dB typ. at 1 GHz • Low insertion loss, 1.0 dB typ. at 1 GHz • High IP3, 50 dBm typ. at 1 GHz • Fast switching, Rise/fall time, 23 ns typ.
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VSWA2-63DR+
DG1235
TB-407
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PDF
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