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Catalog Datasheet	MFG & Type	Document Tags	PDF
FBGA672 Abstract: ioa18 fbga672 paging EPF8282A EPF8282AV EPF8636A EPF8820A EPM7032S EPM7064S AGILENT TECHNOLOGIES 3070 Text: IEEE 1149.1 JTAG Boundary-Scan Testing in Altera Devices June 2005, ver. 6.0 Introduction Application Note 39 As printed circuit boards (PCBs) become more complex, the need for thorough testing becomes increasingly important. Advances in surfacemount packaging and PCB manufacturing have resulted in smaller	Original	1980s, FBGA672 ioa18 fbga672 paging EPF8282A EPF8282AV EPF8636A EPF8820A EPM7032S EPM7064S AGILENT TECHNOLOGIES 3070	PDF
FBGA672 Abstract: IOAD16 8 IOG20 AGILENT TECHNOLOGIES 3070 ioa18 ieee 1532 EPC16 EPF81500A EPF8282A EPF8636A Text: IEEE 1149.1 JTAG Boundary-Scan Testing in Altera Devices June 2005, ver. 6.0 Introduction Application Note 39 As printed circuit boards PCBs become more complex, the need for thorough testing becomes increasingly important. Advances in surfacemount packaging and PCB manufacturing have resulted in smaller	Original	1980s, FBGA672 IOAD16 8 IOG20 AGILENT TECHNOLOGIES 3070 ioa18 ieee 1532 EPC16 EPF81500A EPF8282A EPF8636A	PDF
7408, 7404, 7486, 7432 Abstract: RF400U functional diagram of 7400 and cd 4011 ls 7404 180 nm CMOS standard cell library TEXAS INSTRUMENTS 74191 4BITS s273 buffer 74374 7408 CMOS cmos 7404 Text: TGC100 Series CMOS Gate Arrays RELEASE 3.0, REVISED JANUARY 1990 • Twelve Arrays with up to 26K Available Gates • Fast Prototype Turnaround Time • Extensive Design Support - Design Libraries Compatible with Daisy, Valid, and Mentor CAE Systems - Tl Regional ASIC Design Centers	OCR Scan	TGC100 20-mA Sink/12mA TDB10LJ 120LJ TDC11LJ TDN11LJ 100MHz 7408, 7404, 7486, 7432 RF400U functional diagram of 7400 and cd 4011 ls 7404 180 nm CMOS standard cell library TEXAS INSTRUMENTS 74191 4BITS s273 buffer 74374 7408 CMOS cmos 7404	PDF
0221l Abstract: APPLICATION NOTES CD 7474 IC bit-slice TGC119 TGC100 IPF 830 RC02X ci 7432 ttl DTN20 tsg 271 Text: TGC100 Series 1-\|im CMOS Gate Arrays RELEASE 4.0. REVISED SEPTEMBER 1991 14 Arrays with up to 26K Available Gates C E LL C O LU M N Fast Prototype Turnaround Time W IR IN G C H A N N E L Extensive Design Support -Design Libraries Compatible With Valid,u and Mentor CAE Systems	OCR Scan	TGC100 16-mA Slnk/12-mA 0221l APPLICATION NOTES CD 7474 IC bit-slice TGC119 IPF 830 RC02X ci 7432 ttl DTN20 tsg 271	PDF