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    ADC08D1000DEV

    Abstract: AD677 WAVEVISION4 ADC08D1000WG-QV XC4VLX15 JESD57 for lvds ADC hard radiation
    Text: The material is posted here with permission of the IEEE. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained fron the IEEE by writing to pubs-permissions.org.


    Original     		PDF XC4VLX15) com/xilinx/files/ADC08D1000DEV rary/analogdialogue/archives/3906/Chapter 20Sampled 20Data 20Systems ADC08D1000WG-QV" EIA/JESD57, org/download/search/jesd57 ADC08D1000DEV AD677 WAVEVISION4 ADC08D1000WG-QV XC4VLX15 JESD57 for lvds ADC hard radiation

    A434 RF MODULE

    Abstract: JESD31 TRANSISTOR SMD MARKING CODE A45 NCSL Z540.3 MIL-I-46058 part marking b36 smd diode tm-1017 B568 solar water pumping machine control schematic JEDEC JESD31
    Text: DEFENSE LOGISTICS AGENCY DEFENSE SUPPLY CENTER, COLUMBUS POST OFFICE BOX 3990 COLUMBUS, OH 43218-3990 IN REPLY REFER TO DSCC-VAC 20 April, 2010 MEMORANDUM FOR MILITARY/INDUSTRY DISTRIBUTION SUBJECT: Initial Draft of MIL-PRF-38535 Revision J: Project Number 5962-2010-006


    Original     		PDF MIL-PRF-38535 MIL-PRF-38535J RD-650) A434 RF MODULE JESD31 TRANSISTOR SMD MARKING CODE A45 NCSL Z540.3 MIL-I-46058 part marking b36 smd diode tm-1017 B568 solar water pumping machine control schematic JEDEC JESD31

    3411G

    Abstract: JC-13 MIL-STD-961 4813b a4611
    Text: MIL-PRF-38535 Revision H Change Summary Paragraph Rev. H Major Changes Wording added/changed to make appendices requirements the performance benchmarks for QML devices, and that appendix a forms the basis for QML Q Preamble and V devices. Wording added that the QA is the approving authority for various certification


    Original     		PDF MIL-PRF-38535 MIL-STD-961E JC-13 3411G JC-13 MIL-STD-961 4813b a4611

    JESD57

    Abstract: DAC121S101WGRQV F-1192 DAC121S101QMLV DAC121S101 LM124
    Text: This material is posted here with permission of the IEEE. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.


    Original     		PDF

    ESD test plan

    Abstract: vqe 14e IR 134E 463E-04 VQE 13E WE VQE 23 F 47AG mosfet 9420 vqe 24e WE VQE 11 E
    Text: Single Event Effects Test Report R5, 100V, SE, N R5, 130V, SE, N R5, 150V, SE, N R5, 60V, N R5, 30V, N March 2000 - B.N.L. 233 Kansas Street El Segundo CA 90245 Fax-On-Demand 310 252 7100 Website WWW.irf.com International Rectifier Corp. SEE Test Report March 2000 - B.N.L.


    Original     		PDF

    PRF38534

    Abstract: MIL-PRF-38534 d452 TRANSISTOR equivalent d331 TRANSISTOR equivalent EQUIVALENT transistor D446 d472 TRANSISTOR equivalent D471 TRANSISTOR equivalent EQUIVALENT transistor D446 SMD transistor D613 equivalent transistor D331 circuit diagram application
    Text: INCH-POUND This document and process conversion measures necessary to comply with this revision shall be completed by 13 March 2011 MIL-PRF-38534H 13 September 2010 SUPERSEDING MIL-PRF-38534G 9 March 2009 PERFORMANCE SPECIFICATION HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR


    Original     		PDF MIL-PRF-38534H MIL-PRF-38534G 38534H PRF38534 MIL-PRF-38534 d452 TRANSISTOR equivalent d331 TRANSISTOR equivalent EQUIVALENT transistor D446 d472 TRANSISTOR equivalent D471 TRANSISTOR equivalent EQUIVALENT transistor D446 SMD transistor D613 equivalent transistor D331 circuit diagram application

    DNA-H-93-140

    Abstract: DNA-H-95-61 e1309 JEP133 transistor 2N2222 F1262 FOTP-64 MOSFET DOSIMETER sensor 3414 cobalt-60
    Text: N RADIATION OWNER’S MANUAL – RHA-Related Documents Military Performance Specifications 19500 – General Specification for Semiconductor Devices 38534 – Performance Specifications for Hybrid Microcircuits 38535 – General Specification for Intregrated Circuits Microcircuits Manufacturing


    Original     		PDF P1156 PSS-01-609 heisen9929 DNA-H-93-140 DNA-H-95-61 e1309 JEP133 transistor 2N2222 F1262 FOTP-64 MOSFET DOSIMETER sensor 3414 cobalt-60

    xilinx cross

    Abstract: FLUKE 80T-IR LM98640 CDS1 LM98640QML thermister 332 80T-IR LM98640CVAL LM4050WG2.5RLQV JESD57 for lvds
    Text: 1 SEE Testing of National Semiconductor’s LM98640QML System on a Chip for Focal Plane Arrays and Other Imaging Systems Kirby Kruckmeyer, Member, IEEE, Robert Eddy, Alex Szczapa, Bill Brown and Tom Santiago Abstract—National Semiconductor’s LM98640QML is a


    Original     		PDF LM98640QML F1192, org/Standards/F1192 LM139A/LM139QML com/ds/LM/LM139A com/pf/LM/LM98640QML xilinx cross FLUKE 80T-IR LM98640 CDS1 thermister 332 80T-IR LM98640CVAL LM4050WG2.5RLQV JESD57 for lvds

    SRAM Cross References

    Abstract: UT9Q512K8 SRAM SAMSUNG UT8Q512K8 36E-4 weibull test data 19E4
    Text: Single Event Effects Qualification UT8Q512K8 RQ02 Lot 6ZVL04 4Mbit SRAM 7/21/03 Craig Hafer 719-594-8319 craig.hafer@aeroflex.com SUMMARY-Single event effects qualification testing was performed on the UTMC 4Mbit SRAM, (Samsung Rev C die), Lot 6ZVL04, at the Lawrence Berkeley Laboratory using


    Original     		PDF UT8Q512K8 6ZVL04 6ZVL04, 88-inch 5E-11 9E-10 3E-09 7E-08 0E-11 SRAM Cross References UT9Q512K8 SRAM SAMSUNG UT8Q512K8 36E-4 weibull test data 19E4

    systron Donner 410

    Abstract: MIL-STD-750E Ultrasonic Atomizing Transducer systron donner accelerometer substitute diode PH 33D fastest finger first indicator synopsis emerson three phase dc motor driver service note tektronix 576 curve tracer MIL-STD-750E 1071 proximity detector sensor
    Text: The documentation and process conversion measures necessary to comply with this revision shall be completed by 20 June 2007 INCH - POUND MIL-STD-750E 20 November 2006 SUPERSEDING MIL-STD-750D 28 FEBRUARY 1995 DEPARTMENT OF DEFENSE TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES


    Original     		PDF MIL-STD-750E MIL-STD-750D systron Donner 410 MIL-STD-750E Ultrasonic Atomizing Transducer systron donner accelerometer substitute diode PH 33D fastest finger first indicator synopsis emerson three phase dc motor driver service note tektronix 576 curve tracer MIL-STD-750E 1071 proximity detector sensor

    DAC121S101WGRQV

    Abstract: Micro Linear cross DAC121S101 DAC121S101QML LM124 F-1192 DAC121S101QMLV output impedance calculation in LM124 JESD57
    Text: Single Event Transient Response Dependence on Operating Conditions for a Digital to Analog Converter Kirby Kruckmeyer, Member, IEEE, James S. Prater, Bill Brown and Sandeepan DasGupta Abstract—The Single Event Effect SEE characterization of a Digital to Analog Converter (DAC) showed an unexpected Single


    Original     		PDF

    Samsung K6R4008C1D

    Abstract: K6R4008C1D 317 mg K6R4008V1D SAMSUNG SRAM 110e4
    Text: Single Event Latch-Up Testing on Samsung Rev. D 4M Fast Asynchronous SRAM Joseph Benedetto, Ph.D. Craig Hafer 719-594-8319 craig.hafer@aeroflex.com Summary—Single event latch-up SEL testing was performed on the Samsung K6R4008V1D and K6R4008C1D 3.3 and 5.0V 4M Asynchronous SRAMs (respectively) at the Texas A&M


    Original     		PDF K6R4008V1D K6R4008C1D K6R4008V1D EIA/JESD57 Samsung K6R4008C1D 317 mg SAMSUNG SRAM 110e4

    tm-1017

    Abstract: JESD31 marking code ny SMD Transistor npn JEDEC JESD31 Automated Guided Vehicles project A434 RF MODULE MIL-I-46058 ASTM E104 M38510 cross index semiconductors cross index
    Text: The documentation and process conversion measures necessary to comply with this revision shall be completed by 13 September 2007. INCH-POUND MIL-PRF-38535H 16 March 2007 SUPERSEDING MIL-PRF-38535G 7July 2006 PERFORMANCE SPECIFICATION INTEGRATED CIRCUITS MICROCIRCUITS MANUFACTURING,


    Original     		PDF MIL-PRF-38535H MIL-PRF-38535G MIL-PRF-3853591 RD-650) tm-1017 JESD31 marking code ny SMD Transistor npn JEDEC JESD31 Automated Guided Vehicles project A434 RF MODULE MIL-I-46058 ASTM E104 M38510 cross index semiconductors cross index

    HP laptop schematic power supply circuit diagram

    Abstract: mono mosfet amplifier diagram hp 520 schematic 20 pin lcd laptop 8ohm .5W speaker LX1701 LX1701CLQ hp laptop schematic diagram Monitor speaker schematic diagram of laptop hp Power H-Bridge Schematic
    Text: LX1701 TM 2W Filterless Mono Class-D Audio Amplifier P RODUCTION D ATA S HEET KEY FEATURES DESCRIPTION The LX1701 family provides very low quiescent current consumption through the use of a proprietary output modulation scheme. This technology enables filter-less operation in many


    Original     		PDF LX1701 16-pin 200KHz 14dB/8dB 20/300Hz HP laptop schematic power supply circuit diagram mono mosfet amplifier diagram hp 520 schematic 20 pin lcd laptop 8ohm .5W speaker LX1701 LX1701CLQ hp laptop schematic diagram Monitor speaker schematic diagram of laptop hp Power H-Bridge Schematic

    8ohm .5W speaker

    Abstract: HP laptop schematic power supply circuit diagram hp 520 schematic 20 pin lcd laptop hp laptop schematic diagram pc multimedia speaker pcb layout hp laptop battery pin definition LX1701 LX1701ILQ LX1701ILQTR Monitor speaker
    Text: LX1701 TM 2W Filterless Mono Class-D Audio Amplifier P RODUCTION D ATA S HEET KEY FEATURES DESCRIPTION The LX1701 family provides very low quiescent current consumption through the use of a proprietary output modulation scheme. This technology enables filter-less operation in many


    Original     		PDF LX1701 16-pin 200KHz 14dB/8dB 20/300Hz 8ohm .5W speaker HP laptop schematic power supply circuit diagram hp 520 schematic 20 pin lcd laptop hp laptop schematic diagram pc multimedia speaker pcb layout hp laptop battery pin definition LX1701 LX1701ILQ LX1701ILQTR Monitor speaker

    MIL-STD-750E

    Abstract: 1N21B diode cc 3053 MIL-PRF-680 D65019 rectifier 2037-1 TT 2076 SAE-ARP-743 1N21B diode 1N21* Diode Detector Holder
    Text: The documentation and process conversion measures necessary to comply with this revision shall be completed by 20 June 2007 INCH - POUND MIL-STD-750E 20 November 2006 SUPERSEDING MIL-STD-750D 28 FEBRUARY 1995 DEPARTMENT OF DEFENSE TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES


    Original     		PDF MIL-STD-750E MIL-STD-750D MIL-STD-750E 1N21B diode cc 3053 MIL-PRF-680 D65019 rectifier 2037-1 TT 2076 SAE-ARP-743 1N21B diode 1N21* Diode Detector Holder