PKF 4111A SI
Abstract: PKF 5713 SI PKF 4110B SI 2113A 5617 PKF 2611 PI PKF 4121A SI PKF 4621 SI pkf 4910a PKF 4610A SI
Text: PKF series PKF series General information • SMD and through hole versions with ultra-low component height 8.0 mm 0.315 in. • Up to 87% efficiency at full load • Safety requirements in accordance with EN60950 • MTTF >10 million hours at +50°C case
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EN60950
D357901
M94022763
4918B
4919B
4110B
PKF 4111A SI
PKF 5713 SI
PKF 4110B SI
2113A
5617
PKF 2611 PI
PKF 4121A SI
PKF 4621 SI
pkf 4910a
PKF 4610A SI
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MIL-HDBK-217
Abstract: No abstract text available
Text: 9810A Rev. B NEL CRYSTAL CLOCK OSCILLATORS SJ/HJ-X8XX series clock oscillators Reliability Calculations Based on MIL-HDBK-217 F 1 . .01 2.2 θjc 1 . .0035 .15 1 . .025 .64 1 . .025 .64 Silicon,epoxy,alumina,and alumina 0.05.0.05 θjc = 42.402 junction to case thermal resistance
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MIL-HDBK-217
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AB-059
Abstract: No abstract text available
Text: APPLICATION BULLETIN Mailing Address: PO Box 11400 • Tucson, AZ 85734 • Street Address: 6730 S. Tucson Blvd. • Tucson, AZ 85706 Tel: 602 746-1111 • Twx: 910-952-111 • Telex: 066-6491 • FAX (602) 889-1510 • Immediate Product Info: (800) 548-6132
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AB-059
Abstract: burr-brown application bulletin selection
Text: APPLICATION BULLETIN Mailing Address: PO Box 11400 • Tucson, AZ 85734 • Street Address: 6730 S. Tucson Blvd. • Tucson, AZ 85706 Tel: 602 746-1111 • Twx: 910-952-111 • Telex: 066-6491 • FAX (602) 889-1510 • Immediate Product Info: (800) 548-6132
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K4500
Abstract: X5R activation energy MLCC MTTF BME MLCC 90705-F Minford Technology MTTF test data 140C 0805X5R106 2817 kemet capacitor
Text: Lifetime Modeling of Sub 2 Micron Dielectric Thickness BME MLCC Michael S. Randall, Abhijit S. Gurav, Daniel J. Skamser, James J. Beeson Fountain Inn, SC 29644. Phone: 864 409-5700, FAX: (864) 409-5665, e-mail: mikerandall@kemet.com Multilayer ceramic capacitor (MLCC) design is
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0805X5R106
K4500
X5R activation energy
MLCC MTTF
BME MLCC
90705-F
Minford Technology
MTTF test data
140C
2817 kemet capacitor
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Untitled
Abstract: No abstract text available
Text: Low Noise Gallium Arsenide FET Reliability Data ATF-10XXX ATF-13XXX Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the
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ATF-10XXX
ATF-13XXX
MIL-STD-883.
Ambie11
5966-0233E
5966-2942E
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MTTF
Abstract: AT-3XXXX wk 3 25 transistor DOD-HDBK-1686
Text: NPN Silicon Bipolar Transistor Reliability Data AT-3XXXX Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the
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MIL-STD-883.
10-9/hrs.
MIL-STD-750
HPGSS-12-107
MIL-STD-202,
DOD-HDBK-1686
AT-3XX11/3XX33
MTTF
AT-3XXXX
wk 3 25 transistor
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HPMX-3002
Abstract: M2003 M2015
Text: Silicon Bipolar RFIC 900 MHz Driver Amplifier Reliability Data HPMX-3002 Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the relevant MIL-STD-883 or HP internal GSS methods. Data was
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HPMX-3002
MIL-STD-883
M1010
M1011
M2015
M2003
DOD-HDBK-1686
MIL-STD-202,
HPMX-3002
M2003
M2015
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MTTF
Abstract: MTTF test data ina series
Text: Silicon Bipolar Monolithic Amplifier Reliability Data INA Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the
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MIL-STD-883.
To-883
DOD-HDBK-1686
MIL-STD-202,
MTTF
MTTF test data
ina series
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Untitled
Abstract: No abstract text available
Text: NPN Silicon Bipolar Transistor Reliability Data AT-3XXXX Series Description The following cumulative test results have been obtained from testing performed at Agilent Technologies in accordance with the latest revision of MIL-STD-883. Data was gathered from the
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MIL-STD-883.
GSS-12-107
MIL-STD-202,
DOD-HDBK-1686
AT-3XX11/3XX33
5963-3564E
5965-8917E
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I 6506
Abstract: 5091-8326E HRS108
Text: Silicon Bipolar Monilithic Amplifiers Reliability Data MSA Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-750. Data was gathered from the
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MIL-STD-750.
MIL-STD-202,
DOD-HDBK-1686
I 6506
5091-8326E
HRS108
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ina-01
Abstract: No abstract text available
Text: Silicon Bipolar Monolithic Amplifier Reliability Data INA-01/02/03/10 Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the
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INA-01/02/03/10
MIL-STD-883.
Te260
MIL-STD-202,
DOD-HDBK-1686
5962-7978E
5968-6301E
ina-01
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Hp 2564
Abstract: M-1004 INA-51063 INA-52063 M2003 Hp+2564
Text: Low Noise Silicon MMIC Amplifiers Reliability Data INA-51063 INA-52063 The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the product qualification, reliability
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INA-51063
INA-52063
MIL-STD-883.
M1004
M1010
M2003
M2031
MILSTD-202,
DOD-HDBK-1686
Hp 2564
M-1004
INA-51063
INA-52063
M2003
Hp+2564
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JESD22-A114A
Abstract: HPMX-5001 JESD22-A114-A
Text: HPMX-5001, HPMX-5002 Integrated Circuits Reliability Data HPMX-5001 HPMX-5002 Description The following cumulative test results have been obtained from testing performed at HewlettPackard. Data was gathered from the product qualification, reliability monitor, and engineering
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HPMX-5001,
HPMX-5002
HPMX-5001
HPMX-5002
MIL-STD-202,
EIA/JESD22-A114-A
5968-0215E
JESD22-A114A
JESD22-A114-A
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Untitled
Abstract: No abstract text available
Text: HPMX-2006, HPMX-2007 Integrated Circuits Reliability Data HPMX-2006 HPMX-2007 Description The following cumulative test results have been obtained from testing performed at HewlettPackard Company. Data was gathered from the product qualification, reliability monitor,
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HPMX-2006,
HPMX-2007
HPMX-2006
HPMX-2007
MIL-STD-202,
DOD-HDBK-1686
5968-0731E
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MTTF
Abstract: AT-41511
Text: NPN Silicon Bipolar Transistor Reliability Data AT-4xxxx The following cumulative test results have been obtained from testing performed at Agilent Technologies in accordance with the latest revision of MIL-STD-883. Data was gathered from the product qualification, reliability
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MIL-STD-883.
MIL-STD-202,
DOD-HDBK-1686
AT-41511/41533
5966-0933E
5988-9788EN
MTTF
AT-41511
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Abstract: No abstract text available
Text: NPN Silicon Bipolar Transistor Reliability Data AT-41511 AT-41533 The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the product qualification, reliability
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AT-41511
AT-41533
MIL-STD-883.
VC200
MIL-STD-202,
DOD-HDBK-1686
AT-41511/41533
5963-5127E
5966-0933E
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IAM-8XXXX
Abstract: MTTF
Text: Silicon Bipolar Active Mixer Reliability Data IAM-8XXXX Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the product qualification, reliability
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MIL-STD-883.
DOD-HDBK-1686
MIL-STD-202,
IAM-8XXXX
MTTF
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IAM-82018
Abstract: IAM82018 IVA05218 M2016 M2004 IVA-05218
Text: Silicon Bipolar Vector Modulator Reliability Data HPMX-2003/5 Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the
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HPMX-2003/5
MIL-STD-883.
MIL-STD-883
M1010
M1011
M2004
M2016
MIL-STD-202,
DOD-HDBK-1686
IAM-82018
IAM82018
IVA05218
M2016
M2004
IVA-05218
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MTTF
Abstract: No abstract text available
Text: Silicon Bipolar Variable Gain Amplifiers Reliability Data IVA Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the
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MIL-STD-883.
DOD-HDBK-1686
MIL-STD-202,
MTTF
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HPMX-5001
Abstract: MTTF test data
Text: HPMX-5001, HPMX-5002 Integrated Circuits Reliability Data HPMX-5001 HPMX-5002 Description The following cumulative test results have been obtained from testing performed at HewlettPackard. Data was gathered from the product qualification, reliability monitor, and engineering
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HPMX-5001,
HPMX-5002
HPMX-5001
HPMX-5002
MIL-STD-202,
EIA/JESD2-A114-A
MTTF test data
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MTTF
Abstract: No abstract text available
Text: GaAs Schottky Diode Reliability Data HSCH-9XXX The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-750. Data was gathered from the product qualification, reliability
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MIL-STD-750.
5x10-12
1x10-6%
1x10-11
2x10-6%
MIL-STD-750
DOD-HDBK-1686
MTTF
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Hp 2564
Abstract: DOD-HDBK-1686
Text: warn H E W L E T T miCM P A C K A R D Silicon Bipolar RFIC 900 MHz Driver Amplifier Reliability Data HPMX-3002 Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the relevant MIL-STD-883 or HP inter
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HPMX-3002
MIL-STD-883
DOD-HDBK-1686
MIL-STD-202,
Hp 2564
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XLO8
Abstract: diode hp 5082-2080 hp 5082-2830 DOD-HDBK-1686A DOD-HDBK-1686 hp 5082-2900 diode
Text: WhoI H EW L E T T 1 "KM PA CK A R D Tri Metal Beam Lead Schottky Diodes Reliability Data HSCH-5300 Series HSCH-5500 Series Conclusion Hewlett-Packard’s beam lead diodes have successfully passed stringent environmental testing. Hewlett-Packard beam lead diodes may be used in military
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HSCH-5300
HSCH-5500
MIL-STD-750
1051C
DOD-HDBK-1686
XLO8
diode hp 5082-2080
hp 5082-2830
DOD-HDBK-1686A
hp 5082-2900 diode
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