I426
Abstract: U2002 i437 ATL60 3I102 3SD11
Text: Scan Insertion and ATPG Development via Synopsys Test Compiler This application note presents Atmel’s design guidelines, then gives specific recommendations for scan insertion and ATPG vector generation using the Synopsys Test Compiler , version
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"3 Bit Shift Register"
Abstract: I426 SD4 diode i437 ATL60 sdi verilog code OM32muxl0
Text: Test Compiler Scan Insertion and ATPG Development via Synopsys Test Compiler This application note presents Atmel’s design guidelines, then gives specific recommendations for scan insertion and ATPG vector generation using the Synopsys Test Compiler , version
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Original
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PDF
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U2002
Abstract: ATL60
Text: Test Compiler Scan Insertion and ATPG Development via Synopsys• Test Compiler This application note presents Atmel’s design guidelines, then gives specific recommendations for scan insertion and ATPG vector generation using the Synopsys• Test Compiler• , version
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