P2 MARKING Search Results

marking p2

Abstract: KRA316E P2 marking
Contextual Info: SEMICONDUCTOR KRA316E MARKING SPECIFICATION ESM PACKAGE 1. Marking method Laser Marking 2. Marking P2 No. 2000. 12. 27 Item Marking Description Device Mark P2 KRA316E hFE Grade - - Revision No : 0 1/1

Contextual Info: 250UT Micro-Measurements General Purpose Strain Gage - Tee Rosette GAGE PATTERN DATA GAGE DESIGNATION RESISTANCE OHMS See Note 1 OPTIONS AVAILABLE See Note 2 120 ± 0.4% 350 ± 0.4% 1000 ± 0.4% CEA-XX-250UT-120 CEA-XX-250UT-350 CEA-XX-250UT-10C P2 P2 P2

KDP622UL

Abstract: marking p2
Contextual Info: SEMICONDUCTOR KDP622UL MARKING SPECIFICATION ULP-12 PACKAGE 1. Marking method Laser Marking 1 No. P2 0A 2. Marking 2 Item Marking Description Device Mark P2 KDP622UL * Lot No. 0A 2007. 1st Week [0:1st Character, A:2nd Character] Note * Lot No. marking method

KRA316

Contextual Info: SEMICONDUCTOR KRA316 MARKING SPECIFICATION USM PACKAGE 1. Marking method Laser Marking 2. Marking No. 0 1 P2 1 2 Item Marking Description Device Mark P2 KRA316 hFE Grade - - * Lot No. 01 2006. 1st Week [0:1st Character, 1:2nd Character] Note * Lot No. marking method

KRA566E

Abstract: marking p2
Contextual Info: SEMICONDUCTOR KRA566E MARKING SPECIFICATION TESV PACKAGE 1. Marking method Laser Marking P2 1 3 No. 0 1 2. Marking 2 Item Marking Description Device Mark P2 KRA566E hFE Grade - - * Lot No. 01 2006. 1st Week [0:1st Character, 1:2nd Character] Pin No. Dot Pin 1 Index.

KRA766U

Contextual Info: SEMICONDUCTOR KRA766U MARKING SPECIFICATION US6 PACKAGE 1. Marking method Laser Marking P2 1 3 No. 0 1 2. Marking 2 Item Marking Description Device Mark P2 KRA766U hFE Grade - - * Lot No. 01 2006. 1st Week [0:1st Character, 1:2nd Character] Pin No. Dot Pin 1 Index.

KRA766E

Abstract: p213
Contextual Info: SEMICONDUCTOR KRA766E MARKING SPECIFICATION TES6 PACKAGE 1. Marking method Laser Marking P2 1 3 No. 0 1 2. Marking 2 Item Marking Description Device Mark P2 KRA766E hFE Grade - - * Lot No. 01 2006. 1st Week [0:1st Character, 1:2nd Character] Pin No. Dot Pin 1 Index.

KRA566U

Contextual Info: SEMICONDUCTOR KRA566U MARKING SPECIFICATION USV PACKAGE 1. Marking method Laser Marking 2. Marking 3 No. 0 1 P2 1 2 Item Marking Description Device Mark P2 KRA566U hFE Grade - - * Lot No. 01 2006. 1st Week [0:1st Character, 1:2nd Character] Dot ● Pin 1 Indexs

KRA116S

Contextual Info: SEMICONDUCTOR KRA116S MARKING SPECIFICATION SOT-23 PACKAGE 1. Marking method Laser Marking 2. Marking No. 0 1 P2 1 2 Item Marking Description Device Mark P2 KRA116S hFE Grade - - * Lot No. 01 1998. 1st Week [0:1st Character, 1:2nd Character] Note * Lot No. marking method

E308602

Abstract: ta 8659 n ul2464 e120k E115256 37143 lf 8659 marking AR5T 8396H CAT 7551
Contextual Info: REV. DATE DESCRIPTION AO ECNNO 2005/09/09 NEW DRAWING ISSUE r i3 CABLE1 JL P1 16 P2 x; -CABLE2 15 16 15 20± 3 20± 3 150±10 PIN OUT PIN OUT CABLE1 (CABLE2) P1 1 3 I P2 DOC 9- %/m8- « 10- P2 5 1 P1 5 3 6 2 11 4 12 12 7 13 13 9 14 8 10 M. 6 11 14 15

Contextual Info: 187UV Micro-Measurements General Purpose Strain Gages - Shear/Torque Pattern GAGE PATTERN DATA GAGE DESIGNATION RESISTANCE OHMS See Note 1 OPTIONS AVAILABLE See Note 2 CEA-XX-187UV-120 CEA-XX-187UV-350 120 ± 0.4% 350 ± 0.4% P2 P2 actual size DESCRIPTION

8 pin IC h002

Contextual Info: VS P2 582 VSP2582 www.ti.com . SBES002 – JUNE 2008 CCD ANALOG FRONT-END FOR DIGITAL CAMERAS

Contextual Info: SC Connectors SC Type Fiber Optic Connectors Housing SSC-P2 Series ORDERING INFORMATION Model Number SSC-P2 2 3 5 6 8 Designed for ø 2.0 mm Cable • Recommended adapter: SSC-A series ■ Combined with SZ series ferrule provides high-performance 2 6 1 5 Type Number

Contextual Info: 062UT Micro-Measurements General Purpose Strain Gages - Tee Rosette GAGE PATTERN DATA GAGE DESIGNATION RESISTANCE OHMS See Note 1 OPTIONS AVAILABLE See Note 2 CEA-XX-062UT-120 CEA-XX-062UT-350 120 ± 0.4% 350 ± 0.4% P2 P2 DESCRIPTION 

CEA-XX-250UN-120

Abstract: CEA-XX-250UN-350
Contextual Info: 250UN Micro-Measurements General Purpose Strain Gages - Linear Pattern GAGE PATTERN DATA GAGE DESIGNATION RESISTANCE OHMS See Note 1 OPTIONS AVAILABLE See Note 2 CEA-XX-250UN-120 CEA-XX-250UN-350 120 ± 0.3% 350 ± 0.3% P2 P2 actual size DESCRIPTION General-purpose gage with narrow geometry. Exposed

Contextual Info: 250UR Micro-Measurements General Purpose Strain Gages - Rectangular Rosette GAGE PATTERN DATA GAGE DESIGNATION RESISTANCE OHMS See Note 1 OPTIONS AVAILABLE See Note 2 CEA-XX-250UR-120 CEA-XX-250UR-350 120 ± 0.4% 350 ± 0.4% P2 P2 DESCRIPTION Large three-element 45° single-plane rosette. Exposed

Contextual Info: 250UN Micro-Measurements General Purpose Strain Gages - Linear Pattern GAGE PATTERN DATA GAGE DESIGNATION RESISTANCE OHMS See Note 1 OPTIONS AVAILABLE See Note 2 CEA-XX-250UN-120 CEA-XX-250UN-350 120 ± 0.3% 350 ± 0.3% P2 P2 actual size DESCRIPTION General-purpose gage with narrow geometry. Exposed

125UN

Abstract: 125UW CEA-XX-125UN-350 CEA-XX-125UN-120
Contextual Info: 125UN Micro-Measurements General Purpose Strain Gages - Linear Pattern GAGE PATTERN DATA GAGE DESIGNATION RESISTANCE OHMS See Note 1 OPTIONS AVAILABLE See Note 2 CEA-XX-125UN-120 CEA-XX-125UN-350 120 ± 0.3% 350 ± 0.3% P2 P2 actual size DESCRIPTION General-purpose gage with narrow geometry. Exposed

Contextual Info: 187UW Micro-Measurements General Purpose Strain Gages - Linear Pattern GAGE PATTERN DATA GAGE DESIGNATION RESISTANCE OHMS See Note 1 OPTIONS AVAILABLE See Note 2 CEA-XX-187UW-120 CEA-XX-187UW-350 120 ± 0.3% 350 ± 0.3% P2 P2 actual size DESCRIPTION General-purpose gage. Exposed solder tab area 0.10 x

Contextual Info: 375UW Micro-Measurements General Purpose Strain Gages - Linear Pattern GAGE PATTERN DATA GAGE DESIGNATION RESISTANCE OHMS See Note 1 OPTIONS AVAILABLE See Note 2 CEA-XX-375UW-120 CEA-XX-375UW-350 120 ± 0.3% 350 ± 0.3% P2 P2 actual size DESCRIPTION General-purpose gage. Exposed solder tab area 0.10 x

Contextual Info: 125UW Micro-Measurements General Purpose Strain Gages - Linear Pattern GAGE PATTERN DATA GAGE DESIGNATION RESISTANCE OHMS See Note 1 OPTIONS AVAILABLE See Note 2 CEA-XX-125UW-120 CEA-XX-125UW-350 120 ± 0.3% 350 ± 0.3% P2 P2 actual size DESCRIPTION General-purpose gage. Exposed solder tab area 0.10 x

h002

Abstract: VSP2582RHNR h009 SPECIFICATION QFN-36 VSP2582 VSP2582RHN VSP2582RHNG4 VSP2582RHNRG4
Contextual Info: VS P2 582 VSP2582 www.ti.com. SBES002A – JUNE 2008 – REVISED SEPTEMBER 2008 CCD ANALOG FRONT-END FOR DIGITAL CAMERAS

h009 SPECIFICATION

Contextual Info: VS P2 582 VSP2582 www.ti.com. SBES002A – JUNE 2008 – REVISED SEPTEMBER 2008 CCD ANALOG FRONT-END FOR DIGITAL CAMERAS

Contextual Info: 062UR Micro-Measurements General Purpose Strain Gages - Rectangular Rosette GAGE PATTERN DATA GAGE DESIGNATION RESISTANCE OHMS See Note 1 See Note 2 CEA-XX-062UR-120 CEA-XX-062UR-350 120 ± 0.4% 350 ± 0.4% P2 P2 DESCRIPTION  Small 45° rectangular single-plane rosette in a compact