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    PART 2 BA PRIVATE 2012 EXAM Search Results

    PART 2 BA PRIVATE 2012 EXAM Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    MD28F020-12/B Rochester Electronics LLC Replacement for Intel part number MD28F020-12. Buy from authorized manufacturer Rochester Electronics. Visit Rochester Electronics LLC Buy
    MD28F020-12/R Rochester Electronics LLC 28F020 - 256K X 8 Flash, Mil Temp Visit Rochester Electronics LLC Buy
    25LS2518PC Rochester Electronics LLC Replacement for AMD part number AM25LS2518PC. Buy from authorized manufacturer Rochester Electronics. Visit Rochester Electronics LLC Buy
    74LS491ANS Rochester Electronics LLC Replacement for AMD part number SN74LS491ANS. Buy from authorized manufacturer Rochester Electronics. Visit Rochester Electronics LLC Buy
    9519A-1JC Rochester Electronics LLC Replacement for AMD part number AM9519A-1JC. Buy from authorized manufacturer Rochester Electronics. Visit Rochester Electronics LLC Buy

    PART 2 BA PRIVATE 2012 EXAM Datasheets Context Search

    Catalog Datasheet MFG & Type Document Tags PDF

    Untitled

    Abstract: No abstract text available
    Text: GS88237CB-xxx 119-Bump BGA Commercial Temp 333 MHz–200 MHz 2.5 V or 3.3 V VDD 2.5 V or 3.3 V I/O 256K x 36 9Mb SCD/DCD Sync Burst SRAM Features • Single/Dual Cycle Deselect selectable • IEEE 1149.1 JTAG-compatible Boundary Scan • ZQ mode pin for user-selectable high/low output drive


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    GS88237CB-xxx 119-Bump x18/x36 88237C PDF

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    Abstract: No abstract text available
    Text: GS88237CB-xxx 119-Bump BGA Commercial Temp 333 MHz–200 MHz 2.5 V or 3.3 V VDD 2.5 V or 3.3 V I/O 256K x 36 9Mb SCD/DCD Sync Burst SRAM Features • Single/Dual Cycle Deselect selectable • IEEE 1149.1 JTAG-compatible Boundary Scan • ZQ mode pin for user-selectable high/low output drive


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    GS88237CB-xxx 119-Bump x18/x36 88237C PDF

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    Abstract: No abstract text available
    Text: GS88237CB-xxxIV 119-Bump BGA Industrial Temp 256K x 36 9Mb SCD/DCD Sync Burst SRAM Features • Single/Dual Cycle Deselect selectable • IEEE 1149.1 JTAG-compatible Boundary Scan • ZQ mode pin for user-selectable high/low output drive • 1.8 V or 2.5 V core power supply


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    GS88237CB-xxxIV 119-Bump 882V37C 119-BGA PDF

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    Abstract: No abstract text available
    Text: GS88218/36CB/D-xxxI 119- and 165-Bump BGA Industrial Temp 333 MHz–150 MHz 2.5 V or 3.3 V VDD 2.5 V or 3.3 V I/O 512K x 18, 256K x 36 9Mb SCD/DCD Sync Burst SRAMs Features • FT pin for user-configurable flow through or pipeline operation • Single/Dual Cycle Deselect selectable


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    GS88218/36CB/D-xxxI 165-Bump x18/x36 88218C PDF

    Untitled

    Abstract: No abstract text available
    Text: GS88237CB-xxxIV 119-Bump BGA Industrial Temp 256K x 36 9Mb SCD/DCD Sync Burst SRAM Features • Single/Dual Cycle Deselect selectable • IEEE 1149.1 JTAG-compatible Boundary Scan • ZQ mode pin for user-selectable high/low output drive • 1.8 V or 2.5 V core power supply


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    GS88237CB-xxxIV 119-Bump 882V37C PDF

    Untitled

    Abstract: No abstract text available
    Text: GS88237CB-xxxV 119-Bump BGA Commercial Temp 256K x 36 9Mb SCD/DCD Sync Burst SRAM Features • Single/Dual Cycle Deselect selectable • IEEE 1149.1 JTAG-compatible Boundary Scan • ZQ mode pin for user-selectable high/low output drive • 1.8 V or 2.5 V core power supply


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    GS88237CB-xxxV 119-Bump 882V37C PDF

    Untitled

    Abstract: No abstract text available
    Text: GS88237CB-xxxV 119-Bump BGA Commercial Temp 256K x 36 9Mb SCD/DCD Sync Burst SRAM Features • Single/Dual Cycle Deselect selectable • IEEE 1149.1 JTAG-compatible Boundary Scan • ZQ mode pin for user-selectable high/low output drive • 1.8 V or 2.5 V core power supply


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    GS88237CB-xxxV 119-Bump 882V37C 119-BGA PDF

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    Abstract: No abstract text available
    Text: GS88218/36C B/D -xxxIV 119- and 165-Bump BGA Industrial Temp 512K x 18, 256K x 36 9Mb SCD/DCD Sync Burst SRAMs Features • FT pin for user-configurable flow through or pipeline operation • Single/Dual Cycle Deselect selectable • IEEE 1149.1 JTAG-compatible Boundary Scan


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    GS88218/36C 165-Bump x18/x36 882VxxC 882xxC PDF

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    Abstract: No abstract text available
    Text: GS88218/36C B/D -xxxV 119- and 165-Bump BGA Commercial Temp 512K x 18, 256K x 36 9Mb SCD/DCD Sync Burst SRAMs Features • FT pin for user-configurable flow through or pipeline operation • Single/Dual Cycle Deselect selectable • IEEE 1149.1 JTAG-compatible Boundary Scan


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    GS88218/36C 165-Bump x18/x36 882VxxC 882xxC PDF

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    Abstract: No abstract text available
    Text: GS816218/36D B/D -xxxV 1M x 18, 512K x 36 18Mb S/DCD Sync Burst SRAMs 119 & 165 BGA Commercial Temp Industrial Temp Features • FT pin for user-configurable flow through or pipeline operation • Single/Dual Cycle Deselect selectable • IEEE 1149.1 JTAG-compatible Boundary Scan


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    GS816218/36D x18/x36 165-bump 8162xxD PDF

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    Abstract: No abstract text available
    Text: GS832218/36A B/D -xxxV 2M x 18, 1M x 36 36Mb S/DCD Sync Burst SRAMs 119 & 165 BGA Commercial Temp Industrial Temp Features • FT pin for user-configurable flow through or pipeline operation • Single/Dual Cycle Deselect selectable • IEEE 1149.1 JTAG-compatible Boundary Scan


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    GS832218/36A x18/x36 8322xxA PDF

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    Abstract: No abstract text available
    Text: GS816218/36D B/D -xxxV 1M x 18, 512K x 36 18Mb S/DCD Sync Burst SRAMs 119 & 165 BGA Commercial Temp Industrial Temp Features • FT pin for user-configurable flow through or pipeline operation • Single/Dual Cycle Deselect selectable • IEEE 1149.1 JTAG-compatible Boundary Scan


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    GS816218/36D x18/x36 165-bump 8162xxD PDF

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    Abstract: No abstract text available
    Text: GS832218/36A B/D -xxxV 2M x 18, 1M x 36 36Mb S/DCD Sync Burst SRAMs 119 & 165 BGA Commercial Temp Industrial Temp Features • FT pin for user-configurable flow through or pipeline operation • Single/Dual Cycle Deselect selectable • IEEE 1149.1 JTAG-compatible Boundary Scan


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    GS832218/36A x18/x36 8322xxA PDF

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    Abstract: No abstract text available
    Text: GS816218/36D B/D -xxxV 1M x 18, 512K x 36 18Mb S/DCD Sync Burst SRAMs 119 & 165 BGA Commercial Temp Industrial Temp Features • FT pin for user-configurable flow through or pipeline operation • Single/Dual Cycle Deselect selectable • IEEE 1149.1 JTAG-compatible Boundary Scan


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    GS816218/36D x18/x36 8162xxD PDF

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    Abstract: No abstract text available
    Text: GS8321E18/32/36AD-xxxV 333 MHz–150 MHz 1.8 V or 2.5 V VDD 1.8 V or 2.5 V I/O 2M x 18, 1M x 32, 1M x 36 36Mb Sync Burst SRAMs 165-Bump BGA Commercial Temp Industrial Temp Features • FT pin for user-configurable flow through or pipeline operation • Dual Cycle Deselect DCD operation


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    GS8321E18/32/36AD-xxxV 165-Bump 165ete 8321ExxA PDF

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    Abstract: No abstract text available
    Text: GS832118/32/36AD-xxxV 333 MHz–150 MHz 2.5 V or 3.3 V VDD 2.5 V or 3.3 V I/O 2M x 18, 1M x 32, 1M x 36 36Mb Sync Burst SRAMs 165-Bump BGA Commercial Temp Industrial Temp Features • IEEE 1149.1 JTAG-compatible Boundary Scan • 1.8 V or 2.5 V core power supply


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    GS832118/32/36AD-xxxV 165-Bump 8321xxA PDF

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    Abstract: No abstract text available
    Text: GS881E18/32/36C T/D -xxx 100-Pin TQFP & 165-bump BGA Commercial Temp 250 MHz–150 MHz 2.5 V or 3.3 V VDD 2.5 V or 3.3 V I/O 512K x 18, 256K x 32, 256K x 36 9Mb Sync Burst SRAMs Features • FT pin for user-configurable flow through or pipeline operation • Dual Cycle Deselect (DCD) operation


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    GS881E18/32/36C 100-Pin 165-bump supply881E18C 100-lead 881E18C PDF

    GS816136DD-200IV

    Abstract: No abstract text available
    Text: GS8161xxD GT/D -xxxV 100-Pin TQFP & 165-Bump BGA Commercial Temp Industrial Temp 333 MHz–150 MHz 2.5 V or 3.3 V VDD 2.5 V or 3.3 V I/O 1M x 18, 512K x 32, 512K x 36 18Mb Sync Burst SRAMs Features • IEEE 1149.1 JTAG-compatible Boundary Scan • 1.8 V or 2.5 V core power supply


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    GS8161xxD 100-Pin 165-Bump 8161xxD GS816136DD-200IV PDF

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    Abstract: No abstract text available
    Text: GS8161ExxD GT/D -xxxV 100-Pin TQFP & 165-Bump BGA Commercial Temp Industrial Temp 333 MHz–150 MHz 1.8 V or 2.5 V VDD 1.8 V or 2.5 V I/O 1M x 18, 512K x 32, 512K x 36 18Mb Sync Burst SRAMs Features • FT pin for user-configurable flow through or pipeline operation


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    GS8161ExxD 100-Pin 165-Bump 8161ExxD PDF

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    Abstract: No abstract text available
    Text: GS8161ExxD GT/D -xxxV 100-Pin TQFP & 165-Bump BGA Commercial Temp Industrial Temp 333 MHz–150 MHz 1.8 V or 2.5 V VDD 1.8 V or 2.5 V I/O 1M x 18, 512K x 32, 512K x 36 18Mb Sync Burst SRAMs Features • FT pin for user-configurable flow through or pipeline operation


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    GS8161ExxD 100-Pin 165-Bump 8161ExxD PDF

    Untitled

    Abstract: No abstract text available
    Text: GS8321E18/32/36AD-xxxV 333 MHz–150 MHz 1.8 V or 2.5 V VDD 1.8 V or 2.5 V I/O 2M x 18, 1M x 32, 1M x 36 36Mb Sync Burst SRAMs 165-Bump BGA Commercial Temp Industrial Temp Features • FT pin for user-configurable flow through or pipeline operation • Dual Cycle Deselect DCD operation


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    GS8321E18/32/36AD-xxxV 165-Bump 8321ExxA PDF

    Untitled

    Abstract: No abstract text available
    Text: GS8161ExxD GT/D -xxxV 100-Pin TQFP & 165-Bump BGA Commercial Temp Industrial Temp 333 MHz–150 MHz 1.8 V or 2.5 V VDD 1.8 V or 2.5 V I/O 1M x 18, 512K x 32, 512K x 36 18Mb Sync Burst SRAMs Features • FT pin for user-configurable flow through or pipeline operation


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    GS8161ExxD 100-Pin 165-Bump 8161ExxD PDF

    Untitled

    Abstract: No abstract text available
    Text: GS8161xxD GT/D -xxxV 100-Pin TQFP & 165-Bump BGA Commercial Temp Industrial Temp 333 MHz–150 MHz 2.5 V or 3.3 V VDD 2.5 V or 3.3 V I/O 1M x 18, 512K x 32, 512K x 36 18Mb Sync Burst SRAMs Features • IEEE 1149.1 JTAG-compatible Boundary Scan • 1.8 V or 2.5 V core power supply


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    GS8161xxD 100-Pin 165-Bump addresse35 8161xxD PDF

    Untitled

    Abstract: No abstract text available
    Text: GS832118/32/36AD-xxxV 333 MHz–150 MHz 2.5 V or 3.3 V VDD 2.5 V or 3.3 V I/O 2M x 18, 1M x 32, 1M x 36 36Mb Sync Burst SRAMs 165-Bump BGA Commercial Temp Industrial Temp Features • IEEE 1149.1 JTAG-compatible Boundary Scan • 1.8 V or 2.5 V core power supply


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    GS832118/32/36AD-xxxV 165-Bump 8321xxA PDF