Untitled
Abstract: No abstract text available
Text: User's Guide SNVA353B – February 2009 – Revised April 2013 AN-1870 LM26420 Evaluation Board 1 Introduction The LM26420 evaluation board was designed to provide two 2A outputs, VOUT1 and VOUT2 . It is available in either the HTSSOP package option of the LM26420 for easier probing or the WQFN version for evaluating
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SNVA353B
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LM26420
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xilinx cross
Abstract: rtl series verilog
Text: R ALLIANCE Series Software Xilinx Synplicity Synplify Implementation Flow HDL Analyst Cross Probing Verilog & VHDL Instantiation HDL Editor RTL View Module Generators .VEI .VHI DSP COREGen .NGO Cross Probing Technology View LogiBLOX VHDL Verilog Timing & Design
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X8443
xilinx cross
rtl series
verilog
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N2876-97000
Abstract: 5990-3930EN N2870A N2885A N2874A N2873A 5968-7141EN
Text: Agilent N2870A Series Passive Probes and Accessories Data Sheet Introduction The N2870A Series passive probe family sets new standards in high performance probing of up to 1.5 GHz bandwidth. These general purpose probes and accessories offer high quality measurements at a very
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N2870A
N2873A
5990-3930EN
N2876-97000
5990-3930EN
N2885A
N2874A
5968-7141EN
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DDR3 DIMM 240 pinout
Abstract: DDR3 slot 240 pinout DDR3 DIMM pinout DDR3 DIMM footprint DDR3 DIMM DDR3 impedance N4834A eye-fi "Touch DISPLAY" A13-B13
Text: DDR3 DIMM Probing For Use With the 16900 Series Logic Analyzer Data Sheet Features Agilent offers a wide range of probing • Quick, easy connection between the DIMM connector and Agilent logic analyzers with the interposer or midbus probe solution for DDR3 DIMM measurement. • Compatible with all 240-pin DDR3 SDRAM DIMMs
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240-pin
N4835A
5990-3577EN
DDR3 DIMM 240 pinout
DDR3 slot 240 pinout
DDR3 DIMM pinout
DDR3 DIMM footprint
DDR3 DIMM
DDR3 impedance
N4834A
eye-fi
"Touch DISPLAY"
A13-B13
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mobile jammer
Abstract: mobile signal jammer N5316A E2960B-RET-05 jammer slot N5309A-COM N5540A N5323A-JM1 N5426A TLP 433 module
Text: Agilent E2960B Series for PCI EXPRESS 2.0 Data Sheet Version 2.3 Fastest Time to Insight The most integrated and comprehensive PCI Express® x1 through x16 test solution, with superior probing P2L Gateway Protocol Analyzer Full system viewing with the extended P2L
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E2960B
5989-5660EN
mobile jammer
mobile signal jammer
N5316A
E2960B-RET-05
jammer slot
N5309A-COM
N5540A
N5323A-JM1
N5426A
TLP 433 module
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TLA700
Abstract: MQUAD RC32364 RC4640 RC4650 RC5000 RC64474 RC64475 disassembler
Text: Logic Analyzers Tektronix Crescent Heart Software CRESCENT HEAR T SOFTW ARE EART OFTWARE RISC Processors Probing Support for Use with Tektronix Logic Analyzers Features ◆ PQFP- and MQUAD-package processor probing support includes high-reliability SMT adapter and/or probe adapter
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Marking B2
Abstract: transistor marking N1 RT1404B7
Text: Note Number AN-C1-TP-A Development Tools And Methods APPLICATION NOTE TOP PROBE-ABLE CLEARONE DEVICES INTRODUCTION The use of ball grid array BGA devices during the development phase of a project can represent some unique challenges in terms of circuit probing
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Abstract: No abstract text available
Text: Model 6499 Modular Passive Oscilloscope Probe Accessories included with Probe: Model 6499 Modular Passive Oscilloscope Probe Features • • • • • • • USA: This probe is recommended for general purpose probing applications and is adjustable for low
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replace300
X1/X10
D2015570
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Untitled
Abstract: No abstract text available
Text: Model 6496 Modular Passive Oscilloscope Probe Accessories included with Probe: Model 6496 Modular Passive Oscilloscope Probe Features • • • • • USA: This probe is recommended for general purpose probing applications and is adjustable for low and
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D2015567
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P7H55M
Abstract: DDR3 udimm jedec asus p7h55-m samsung ddr3 Samsung Capacitor asus diagram asus p7h55 intel h55 DDR3 "application note"
Text: Mar.2010 Understanding DDR3 VrefDQ and VrefCA signal waveform Purpose of this Application Note - Generally when measuring the signal waveform with Oscilloscope, Probe is attached to desired signal point and ground. - With general probing method, VrefCA signal shows very noisy waveform and it
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P7H55M
1333Mbps
DDR3 udimm jedec
asus p7h55-m
samsung ddr3
Samsung Capacitor
asus diagram
asus
p7h55
intel h55
DDR3 "application note"
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PB-BGA256J-Z-01
Abstract: SF-BGA256J-B-01 SF-BGA232A-B-01
Text: U.S. PATENT 6,351,392 78.64mm [3.096"] 2.54mmtyp. [0.100"] 19.23mm [0.757"] 50.8mm [2.000"] Top View 1 * This height variable depends on the screw position. * 2 9.97mm [0.393"] 12.6mm [0.496"] 6mm [0.236"] Side View For Probing BGA256J use SF-BGA256J-B-01
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54mmtyp.
BGA256J
SF-BGA256J-B-01
BGA232A
SF-BGA232A-B-01
FR4/G10
16x16
PB-BGA256J-Z-01
SF-BGA256J-B-01
SF-BGA232A-B-01
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XC6SLX45t-fgg484
Abstract: XC6VLX240T-FF1156 xc6vlx240tff1156-1 AMBA AXI4 stream specifications XC6VLX240T-FF1156-1 xc6vlx240tff1156 xc6slx45tfgg484 XC6SLX45T kintex 7 AMBA AXI designer user guide
Text: LogiCORE IP ChipScope AXI Monitor v3.01.a DS810 October 19, 2011 Product Specification Introduction LogiCORE IP Facts Table The ChipScope AXI Monitor core is designed to monitor and debug AXI interfaces. The core allows the probing of any signals going from a peripheral to the
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XC6SLX45t-fgg484
XC6VLX240T-FF1156
xc6vlx240tff1156-1
AMBA AXI4 stream specifications
XC6VLX240T-FF1156-1
xc6vlx240tff1156
xc6slx45tfgg484
XC6SLX45T
kintex 7
AMBA AXI designer user guide
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Untitled
Abstract: No abstract text available
Text: N5450B InfiniiMax Extreme Temperature Extension Cable Data Sheet Probe your device’s signals in extreme testing conditions • Industry’s first extreme temperature probing solution • Perfect probing solution for extreme environmental testing, including applications in the
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N5450B
E2677A
E2678A
N5425A/26A
5990-7542EN
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EPS-ACC-150-PCA
Abstract: No abstract text available
Text: EPS150TRIAX A dedicated 150 mm manual probing solution for low-noise measurements Benefits Make everyone a low-noise measurement expert Best-known methods for low-level I-V/C-V test enable i-V measurements at fA level Full triaxial design and high-quality cables
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EPS150TRIAX
EPS150TRIAX
DPP210-M-S
EPS-ACC-150-PCA
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Abstract: No abstract text available
Text: W2630 Series DDR2 BGA Probes for Logic Analyzers and Oscilloscopes Data Sheet The W2630 Series DDR2 BGA probes enable probing of embedded memory DIMMs directly at the ball grid array with Agilent logic analyzers and oscilloscopes Features The Agilent W2630 Series DDR2
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signal69
5989-5964EN
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Untitled
Abstract: No abstract text available
Text: PA300PS-MA 300 mm Semi-Automatic Probe System DATA SHEET The PA300PS-MA is the world’s only analytical probe system for ine-pitch probing of pads down to 30 m x 30 μm, veriication of ball grid arrays and the most universal tool for wafer-level reliability WLR tests with 220 mm or 320 mm Celadon tiles. The semiautomatic probe system employs the powerful ProbeShield technology, enabling accurate low-noise measurements of atto amps
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PA300PS-MA
PA300PS-MA
PA300PS-MA-DS-1012
PA300PS-MA.
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EPS-ACC-150MMW-MAU
Abstract: No abstract text available
Text: EPS150MMW A dedicated 150 mm manual probing solution for mmW, tHz and load pull applications The EPS150MMW is a dedicated probing solution that comes with everything you need to achieve accurate measurement results in the shortest time, with maximum conidence. The system incorporates
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EPS150MMW
EPS-ACC-150MMW-MAU
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Oscilloscope
Abstract: QFP 0.3mm pitch
Text: MicroGripperTM Oscilloscope Kit Oscilloscope Probe Adapter 0.8mm to 0.3mm Fine-Pitched Probing With Any Standard Oscilloscope w w w w w Connect to devices with lead pitches from 0.8mm to 0.3mm Use on a variety of QFP and SOIC packages Reduces chance of shorting with smallest wire tip diameter 0.08mm
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DOD-5011)
Oscilloscope
QFP 0.3mm pitch
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reset cross
Abstract: XAPP406 LeonardoSpectrum
Text: For Japanese version, please see: http://www.xilinx.co.jp/xapp/j_xapp406_2_0.pdf Application Note: FPGAs R Cross Probing to Synplicity and Exemplar Author: Yenni Totong XAPP406 v2.0 December 1, 2000 Summary Xilinx Alliance software version 3.3.06i (3.1i Service Pack 6) or later has been enhanced to
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xapp406
XAPP406
Windows98
reset cross
LeonardoSpectrum
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CL-PLCC32-T-01
Abstract: PR-01SS56-6-DIP40
Text: Bottom View Top View 0.020" Sqr. 1 3 5 7 32 2 4 6 9 8 30 31 11 10 28 29 13 12 26 27 15 14 24 25 22 20 18 16 23 21 19 17 Side View Pin Mapping Top View 2x scale Assumes pin 1 in top corner of device. Description: Clips over a 32 pin PLCC that is soldered to a PCB. Provides access to all signals for easy probing, or the clip can be
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CL-PLCC32-T-01
PR--01SS56-6-DIP40
PR-01SS56-6-DIP40
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Untitled
Abstract: No abstract text available
Text: A057 Pair Back Probing Probes Part. incorporate a spring steel prod Voltage / Amperage Rating Maximum Voltage: N/A Maximum Amperage: N/A Agency Listing N/A Copyright 2007 Test Products International, Inc. Category Rating Insulation Material N/A N/A Dimensions
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Abstract: No abstract text available
Text: EPS150COAX A dedicated 150 mm manual probing solution for DC parametric test BENEFITS Make everyone a measurement expert Best-known methods for DC parametric test Ensure contact stability over time Compact and rigid mechanical design Test a wide variety of technologies
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EPS150COAX
EPS150COAX
DPP210-M-S
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Untitled
Abstract: No abstract text available
Text: Probe PP006A The PP006A is a high impedance passive probe with a wide range of probing accessories. It is designed to give high impedance probing capability to a circuit when attached to a LeCroy Oscilloscope. System BW －3dB System Attenuation System Input Resistance
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PP006A
PP006A
PK116
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smd 1aw
Abstract: No abstract text available
Text: From: DocuFACTSitra] Ph# 949-253-7438 16030801932 Pomona 8-20-99 12:27pm p. 2 of 6 Model 6080 Minispring Needle Tip Probe FEATURES: • Provides ultra-fine control for probing high density SMD circuits. • Very fine 0.03” 0.7 diameter, stainless steel tip is spring loaded for controlled pressure.
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02T18/89
smd 1aw
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