Emcore solar cell
Abstract: GaAs tunnel diode multi-junction "solar cell" NIEL proton tunnel diode tunnel diode GaAs GAAS multi-junction solar cell" NIEL for solar cell inp
Text: PROTON AND ELECTRON RADIATION ANALYSIS OF GaInP2/GaAs SOLAR CELLS P. R. Sharps, C. H. Thang, P. A. Martin, and H. Q. Hou EMCORE Photovoltaics 10420 Research Road SE Albuquerque, NM 87112 ABSTRACT Electron and proton radiation damage analysis of solar cells is extremely important for predicting the response of
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OR-2000
Emcore solar cell
GaAs tunnel diode
multi-junction "solar cell"
NIEL
proton
tunnel diode
tunnel diode GaAs
GAAS multi-junction solar cell"
NIEL for solar cell inp
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prisma
Abstract: smartcard visa SMARTCARD CEPS proton aspic e purse ISO7816 "electronic purse"
Text: Proton PRISMA Latest-generation smartcard solutions for banking, government and public transport www.st.com/smartcard Key benefits • Ideal for finance, government and public transport applications ■ Seamless migration to multi-application functionality
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ISO7816,
FLPROTONGEN/1003
prisma
smartcard visa
SMARTCARD
CEPS
proton
aspic
e purse
ISO7816
"electronic purse"
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Untitled
Abstract: No abstract text available
Text: Application Note 1851 Single-Event Performance of the ISL75052SEH Introduction Part Description The intense proton and heavy ion environment encountered in space applications can cause a variety of Single-Event Effects SEE in electronic circuitry, including Single-Event Upset (SEU),
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ISL75052SEH
ISL75052SEH
AN1851
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prisma
Abstract: proton EMV CARDS DDA quality control payment CARDS
Text: EMVPlus Credit/debit application on ST Proton PRISMA technology www.st.com/smartcard • Multi-brands ■ Extended risk management ■ SDA, DDA, CDA mechanisms ■ One-time password ■ Card-manufacturer independent ■ Simplified personalization ■ Future-proof
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FLPROTEMV/1003
prisma
proton
EMV CARDS DDA
quality control
payment CARDS
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Untitled
Abstract: No abstract text available
Text: Application Note 1938 Single Event Effects SEE Testing of the ISL71091SEHxx Precision Voltage References Family Introduction SEE Test Objectives The intense proton and heavy ion environment encountered in space applications can cause a variety of single event effects
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ISL71091SEHxx
AN1938
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4N49
Abstract: No abstract text available
Text: 66260 PROTON RADIATION TOLERANT OPTOCOUPLER MICROPAC Single Channel, Electrically Similar to 4N49 OTOELECTRONIC PRODUCTS DIVISION 01/05/05 Features: Applications: • • • • • • • • • • High Reliability Base lead provided for conventional transistor
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Pentium III Developer
Abstract: No abstract text available
Text: Managing Multiple Code Paths 10/23/98 updated 3/1/99 Copyright 1998, Intel Corporation. All rights reserved. G-Number This presentation discusses a technology introduced in the Intel® C+ Compiler (Proton/VTune Performance Analyzer tool compiler) release
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F32vec4
F32vec4*
Pentium III Developer
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Untitled
Abstract: No abstract text available
Text: 6 PIN GULL WING 66266 PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION WITH 850 nm LED 05/31/2013 Features: Applications: • High Reliability Base lead provided for conventional transistor biasing Rugged package
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vcsel spice model
Abstract: 1310nm led Modulating VCSELs 1310nm photodiode 6 Ghz 10Gbps TOcan
Text: APPLICATION NOTE Modulating Finisar Oxide VCSELs INTRODUCTION In the last decade, proton isolated VCSELs have become the industry standard for short wavelength 850nm gigabit data communications links on multimode fiber. As the speeds have increased beyond 2Gbps, however, the oxide isolated
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850nm)
1-866-MY-VCSEL
vcsel spice model
1310nm led
Modulating VCSELs
1310nm photodiode 6 Ghz
10Gbps TOcan
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Untitled
Abstract: No abstract text available
Text: 6 PIN GULL WING 66266 PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION WITH 850 nm LED 06/15/2012 Features: Applications: • High Reliability Base lead provided for conventional transistor biasing
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6 pin Optocoupler
Abstract: 66266-105 66266-300 4N49 850 nm LED
Text: 6 PIN GULL WING 66266 PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION WITH 850 nm LED 06/21/2010 Features: Applications: • • • • • • • • • • High Reliability Base lead provided for conventional transistor biasing
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Abstract: No abstract text available
Text: 6 PIN GULL WING 66266 PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION WITH 850 nm LED 02/10/2011 Features: Applications: • • • • • • • • • • High Reliability Base lead provided for conventional transistor biasing
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Abstract: No abstract text available
Text: Test Report 004 Single Event Effects SEE Testing of the ISL71840SEH 16:1 30V Mux Introduction SEE Test Objectives The intense proton and heavy ion environment encountered in space applications can cause a variety of Single Event Effects (SEE) in electronic circuitry, including Single Event Upset (SEU),
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ISL71840SEH
TR004
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proton up
Abstract: 4N48
Text: 66260 6 PIN GULL WING PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION 12/23/2009 Features: Applications: • • • • • • • • • • High Reliability Base lead provided for conventional transistor biasing Rugged package Stability over wide temperature
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Abstract: No abstract text available
Text: 66260 6 PIN GULL WING PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION 05/31/2013 Features: Applications: • High Reliability Base lead provided for conventional transistor biasing Rugged package Stability over wide temperature
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66266-001
Abstract: 66266 66266-105 4N49 66266-00 proton up 850 nm LED
Text: 6 PIN GULL WING 66266 PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION WITH 850 nm LED 01/21/2010 Features: Applications: • • • • • • • • • • High Reliability Base lead provided for conventional transistor biasing
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Untitled
Abstract: No abstract text available
Text: Application Note 1961 Single Event Effects SEE Testing of the ISL70244SEH, Dual 40V Radiation Hardened Precision Operational Amplifier Introduction SEE Test Facility The intense proton and heavy ion environment encountered in space applications can cause a variety of single event effects
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ISL70244SEH,
AN1961
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66266-300
Abstract: 66266 66266-105 proton up optocoupler
Text: 6 PIN GULL WING 66266 PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION WITH 850 nm LED 12/17/2012 Features: Applications: • High Reliability Base lead provided for conventional transistor biasing
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Abstract: No abstract text available
Text: Test Report 007 Single Event Effects SEE Testing of the ISL71841SEH 32:1 30V Multiplexer Introduction SEE Test Facility The intense proton and heavy ion environment encountered in space applications can cause a variety of Single Event Effects (SEE) in electronic circuitry, including Single Event Upset (SEU),
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ISL71841SEH
TR007
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Untitled
Abstract: No abstract text available
Text: 6 PIN GULL WING 66266 PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION WITH 850 nm LED 10/04/2012 Features: Applications: • High Reliability Base lead provided for conventional transistor biasing
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Abstract: No abstract text available
Text: 3.75-6.5 Watt Hybrid Features SINGLE OUTPUT DEVICES • Rad Hard: TID > 100kRad Si • 2:1 margin: Operates beyond 200kRad TID • No SEE: LET > 82MeV*cm2/mg • Proton Resistant: No optocouplers used • Specifically designed for redundant or individual space applications
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100kRad
200kRad
82MeV
MIL-STD-461C
5690-TXX
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Untitled
Abstract: No abstract text available
Text: 19.5-40 Watt Hybrid Features SINGLE OUTPUT DEVICES 7193-S03.3 26.4W • Rad Hard: TID > 100kRad(Si) • 2:1 margin: Operates beyond 200kRad TID • No SEE: LET > 82MeV*cm2/mg • Proton Resistant: No optocouplers used • Specifically engineered for 50 VDC
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7193-S03
100kRad
200kRad
82MeV
MIL-STD-461C
7193-TXX
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75184
Abstract: No abstract text available
Text: 19.5-40 Watt Hybrid Features SINGLE OUTPUT DEVICES 9193-S03.3 26.4W • Rad Hard: TID > 100kRad(Si) • 2:1 margin: Operates beyond 200kRad TID • No SEE: LET > 82MeV*cm2/mg • Proton Resistant: No optocouplers used • Specifically designed for 100 VDC
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9193-S03
100kRad
200kRad
82MeV
MIL-STD-461C
9193-TXX
75184
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Untitled
Abstract: No abstract text available
Text: Application Note 1894 Author: Nick van Vonno Single Event Effects SEE Testing of the ISL71590SEH Temperature Sensor Introduction The intense proton and heavy ion environment encountered in space applications can cause a variety of destructive and nondestructive single-event effects in electronic circuitry,
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ISL71590SEH
AN1894
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