quality control assurance and reliability
Abstract: PROCESS CONTROL EQUIPMENT QUALITY statistical process control
Text: DISCRETE SEMICONDUCTORS DATA SHEET Quality High-voltage and Switching NPN Power Transistors July 1994 Philips Semiconductors Philips Semiconductors High-voltage and Switching NPN Power Transistors Quality • Acceptance tests on finished products to verify
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A -1123* test
Abstract: Family of Testability Products process flow diagram
Text: pASIC 1 FAMILY Quality Program OVERVIEW The pASIC product quality program has the goal to meet or exceed the industry's highest quality standards. The program includes product acceptance inspection in the Standard Process Flow see the following Standard Process Flow diagram . Electrical, visual/mechanical and check on the
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in-process quality inspections
Abstract: process flow diagram
Text: 9 OVERVIEW The pASIC product quality program has the goal to meet or exceed the industry's highest quality standards. The program includes product acceptance inspection in the Standard Process Flow see the following Standard Process Flow diagram . Electrical and visual/mechanical
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h0 sod123
Abstract: Transistor SMD SOT363 SC70 SOT353 hf Device h0 sod123 GaAs tunnel diode gFE smd diode SOD80 footprint sot23 footprint SOT346 ZENER thyristor handbook
Text: Philips Semiconductors RF Wideband Transistors General section • Acceptance tests on finished products to verify conformance with the device specification. The test results are used for quality feedback and corrective actions. The inspection and test requirements are
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MLB049
h0 sod123
Transistor SMD SOT363 SC70
SOT353 hf
Device h0 sod123
GaAs tunnel diode
gFE smd diode
SOD80 footprint
sot23 footprint
SOT346 ZENER
thyristor handbook
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SOD80 footprint
Abstract: GaAs tunnel diode TRANSISTOR SMD CODE PACKAGE SOT89 4
Text: Philips Semiconductors Video Transistors and Modules for Monitors General • Acceptance tests on finished products to verify conformance with the device specification. The test results are used for quality feedback and corrective actions. The inspection and test requirements are
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SOD80 footprint
GaAs tunnel diode
TRANSISTOR SMD CODE PACKAGE SOT89 4
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apqp MANUAL
Abstract: quality acceptance plan wafer fab control plan FORD apqp manual Ford in-process quality ford ppap delco ic MATERIAL CONTROL PROCEDURE PPAP MANUAL Ford Part Number
Text: Status of Document is:RELEASED Effective from: 07-NOV-1995 17:36:32 to Date Printed: 09/03/97 6:30 AM 1.0 Controlled Document Purpose The purpose of this document is to define the procedure for implementing Control Plans for integrated circuits designed for the automotive customers Chrysler, Ford or General
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07-NOV-1995
QOP-SMV-002
QOP-SMV-004
95QP004
apqp MANUAL
quality acceptance plan
wafer fab control plan
FORD apqp manual
Ford in-process quality
ford ppap
delco ic
MATERIAL CONTROL PROCEDURE
PPAP MANUAL
Ford Part Number
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intersil DATE CODE MARKING
Abstract: pin diagram details of CD4015 y2010 R4573 B TA3842 wafer fab control plan TA388* transistor ESD test plan ta5142 R4573
Text: Status of Document is: RELEASED Effective from: 07-AUG-2000 09:48:23 to Date Printed: 07-Aug-2000 10:33:38 Controlled Document QML QUALITY MANAGEMENT PLAN Title: QML QUALITY MANAGEMENT PLAN Specification Type: DOCS Specification Number :999015 Issue :24 Page :1 of 100
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07-AUG-2000
28-SEP-1995
03-NOV-1995
21-SEP-1995
28-SEP-1995
intersil DATE CODE MARKING
pin diagram details of CD4015
y2010
R4573 B
TA3842
wafer fab control plan
TA388* transistor
ESD test plan
ta5142
R4573
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VI- vicor
Abstract: No abstract text available
Text: PCN – Product Change Notice PCN #: 060602 Date: June 2, 2006 To Our Valued Customers: We appreciate your use of V•I Chip products. Our commitment to customer satisfaction and continuous improvement is demonstrated by our plans to enhance quality, reliability and
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quality acceptance plan
Abstract: JESD22-102 JESD22-105 generic failure rate electronic device JESD22-A103 JESD22-A108 JESD22-A101 JESD22-A102 Fairchild wafer fab processes outgoing quality
Text: QUALITY Reliability Qualification Program Fairchild Semiconductor is committed to delivering the highest level of quality and reliability to its customers. Fairchild supplies components for the most demanding applications with guaranteed parametric limits spanning commercial, automotive,
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Untitled
Abstract: No abstract text available
Text: QN100 QUALITY NOTE MEMORY PRODUCTS QUALITY PROGRAM The Corporate quality program of SGS-THOMSON is published as the SURE Semiconductor Users Reliability Evaluation Program. The quality program for memory products follows closely this Program. Described here are the particular controls that apply specifically to memories starting with the Lot
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QN100
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QN100
Abstract: JESD22-A113
Text: QN100 QUALITY NOTE MEMORY PRODUCTS QUALITY PROGRAM The Corporate quality program of SGS-THOMSON is published as the SURE Semiconductor Users Reliability Evaluation Program. The quality program for memory products follows closely this Program. Described here are the particular controls that apply specifically to memories starting with the Lot
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QN100
QN100
JESD22-A113
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RH A4 130
Abstract: QN100 CP 1005 eeprom 2016 JESD22-A113 quality control procedure MATERIAL CONTROL PROCEDURE
Text: QN100 QUALITY NOTE MEMORY PRODUCTS QUALITY PROGRAM The Corporate quality program of SGS-THOMSON is published as the SURE Semiconductor Users Reliability Evaluation Program. The quality program for memory products follows closely this Program. Described here are the particular controls that apply specifically to memories starting with the Lot
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QN100
RH A4 130
QN100
CP 1005
eeprom 2016
JESD22-A113
quality control procedure
MATERIAL CONTROL PROCEDURE
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kd 2060 transistor
Abstract: saia factory 124
Text: 60 years of Know-How CATALOG 1 rs-485 OFFER of measuring instruments and Electronics Manufacturing Services WWW.LUMEL.COM.PL To meet the expectation of our customers we continuously take care of improving the quality management system. It takes place at every activity level, from the identification of the customer’s needs, through the production
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rs-485
kd 2060 transistor
saia factory 124
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LQ231U1LW01
Abstract: No abstract text available
Text: Product Change Notification Type of Notification: Production Plant Change ISSUE DATE LAST BUY DATE NOTIFICATION NO. LAST SHIP DATE 26 July 2007 N/A PCN-20070726-04 N/A This is to advise you that the following product has been changed. Product ID Description :
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PCN-20070726-04
LQ231U1LW01
PCN-20070726-04
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SNW-EQ-611
Abstract: No abstract text available
Text: Philips Semiconductors Product specification Microwave Transistors General QUALITY necessary corrective action. Process steps are under statistical process control. Total Quality Management • Acceptance tests on finished products to verify conformance with the device specification. The test
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tda1000
Abstract: Germanium Diode aa112 BPW50 PCF-1105WP 74LS00A PCF1105 BZW70 9v1 zener diode circuits
Text: Philips Semiconductors Semiconductors for Telecom systems QUALITY General • acceptance tests on finished products to verify conformance with the device specification. The test results are used for quality feedback and corrective actions. The inspection and test requirements are
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PCF1105WP:
GMB74LS00A-DC:
74LS00A;
TDA1000P:
SAC2000:
tda1000
Germanium Diode aa112
BPW50
PCF-1105WP
74LS00A
PCF1105
BZW70
9v1 zener diode circuits
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RF power transistors cross reference
Abstract: transistors cross reference list HF RF Power Transistors cross reference rf transistors cross reference
Text: Philips Semiconductors RF Wideband Transistors Generai section QUALITY • Acceptance tests on finished products to verify conformance with the device specification. The test results are used for quality feedback and corrective actions. The inspection and test requirements are
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MEA471
OT323
OT143
OT143R
OT143,
OT143R
OT223
RF power transistors cross reference
transistors cross reference list
HF RF Power Transistors cross reference
rf transistors cross reference
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Untitled
Abstract: No abstract text available
Text: Philips Sem iconductors Small-signal Transistors General • Acceptance tests on finished products to verify conform ance with the device specification. The test results are used for quality feedback and corrective actions. The inspection and test requirem ents are
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Untitled
Abstract: No abstract text available
Text: Quality Assurance 1 F ig u re 1 an d 2 show the most important stages of the Q A system. Quality assurance QA departments, independent of production and development, are responsible fo r the selected measures, acceptance procedures and information feedback loops. Operating Q A departments have state-ofthe-art test and measuring equipment at their disposal, work
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BS0001
Abstract: BS-0001 INCOMING RAW MATERIAL INSPECTION method centrifuge
Text: m o \ Reliability Program ELECTRONIC DESIGNS IN C . Quality Control Tests and Procedures Electronic Designs, Inc.'s continuing effort to be a leader in providing top quality products has lead us to com plete our m ission to become IS 09001 certified. The certification is the most comprehensive quality
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Hours/80
C/150
EP-00008
TP-00002
QP-00062
TP-00006
EP-00004,
EP-00005
QP-00062
BS0001
BS-0001
INCOMING RAW MATERIAL INSPECTION method
centrifuge
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INCOMING RAW MATERIAL INSPECTION form
Abstract: IC 34992 ucl 11
Text: QUALITY ASSURANCE and RELIABILITY PROGRAM 1. Introduction Samsung utilizes rigorous qualification and reliability programs to monitor the integrity of its devices. All industry' standard and various non-standard stresses are run. Testing is done not only to collect data, but also to detect
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Untitled
Abstract: No abstract text available
Text: 5. Quality Assurance and Reliability So n y's Policy of Quality Assurance The Sony sem iconductor em bodies The other point is a source m anagem ent system com bined with the concept of thorough quality design. W ith this system, higher quality products can be steadily
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NEC Ga FET marking L
Abstract: tamagawa gaas fet marking B mmic amplifier marking code N5 NE272 FET marking code .N5 ne29200 NE23383B NE292 gaas fet marking a
Text: GET-30749, Revision C NEC NEC Corporation Tamagawa Plant 1753,Shimonumabe, Nakahara-lcu, Kawasaki, Kanagawa, 211-8666 Specification Control Drawing o f Grade L GaAs Devices fo r Satellite Applications Prepared on: September 28,2000 Prepared by: Masahito Kushima
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GET-30749,
GET-30749
NE29200
NE674
uPG501B
uPG501P
uPG503B
uPG503P
uPG506B
NEC Ga FET marking L
tamagawa
gaas fet marking B
mmic amplifier marking code N5
NE272
FET marking code .N5
ne29200
NE23383B
NE292
gaas fet marking a
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FTG-12
Abstract: INCOMING RAW MATERIAL FILM INSPECTION procedure ADE-6 Sample form for INCOMING Inspection of RAW MATERIAL mosfet 1500v MTBF UCL 2003 INCOMING RAW MATERIAL INSPECTION method
Text: QUALITY ASSURANCE and RELIABILITY PROGRAM 1. Introduction Samsung utilizes rigorous qualification and reliability programs to m onitor the integrity o f its devices. All industry standard and various non-standard stresses are run. Testing is done not only to collect data, but also to detect
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