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    RELIABILITY REPORT Search Results

    RELIABILITY REPORT Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    0805HT-8N2TKSC Coilcraft Inc High reliability part. For price, availability and ordering contact Coilcraft Critical Products, cp@coilcraft.com Visit Coilcraft Inc Buy
    H0402CS-27NXGLW Coilcraft Inc High reliability part. For price, availability and ordering contact Coilcraft Critical Products, cp@coilcraft.com Visit Coilcraft Inc Buy
    WB1-1TSSD Coilcraft Inc High reliability part. For price, availability and ordering contact Coilcraft Critical Products, cp@coilcraft.com Visit Coilcraft Inc Buy
    0402CS-36NXJAW Coilcraft Inc High reliability part. For price, availability and ordering contact Coilcraft Critical Products, cp@coilcraft.com Visit Coilcraft Inc Buy
    WB1-1TSSB Coilcraft Inc High reliability part. For price, availability and ordering contact Coilcraft Critical Products, cp@coilcraft.com Visit Coilcraft Inc Buy

    RELIABILITY REPORT Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    M7401

    Abstract: m74010 m7402 M74050 M74040 M74064 m80129 hyundai 9750 9745-1 VIC068A cy7c199zi
    Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 1, 1998 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Marc Hartranft Reliability Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT


    Original     		PDF CY7C1334-AC M7401 m74010 m7402 M74050 M74040 M74064 m80129 hyundai 9750 9745-1 VIC068A cy7c199zi

    cy7c9101

    Abstract: M82054 M74070 97356 M8201 CY7C199-DMB 130C 140C CY7C1009-VC 519701901
    Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 2, 1998 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Marc Hartranft Reliability Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT


    Original     		PDF 619802812L CY7C109-VC cy7c9101 M82054 M74070 97356 M8201 CY7C199-DMB 130C 140C CY7C1009-VC 519701901

    MR840

    Abstract: MR841
    Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 1, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999


    Original     		PDF ------------------------SRAM/LOGIC-R52H 140C/3 CY62128V-ZAIB MR84072 121C/100 MR84070 MR840 MR841

    CYM1464

    Abstract: CY7C1353-AC MR840
    Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 3, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 3, 1999


    Original     		PDF CY62137VL-ZSIB CYM1464 CY7C1353-AC MR840

    CY7C4271-JC

    Abstract: cypress 98267 9832 CY5037
    Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 4, 1998 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998


    Original     		PDF CY62128V-VC CY62128V-ZSC CY7C4271-JC cypress 98267 9832 CY5037

    tms 9937

    Abstract: TSMC fuse PALC22V10b M99242 CY7C1353-AC MR841 Hyundai 9944 PALC22V10B-15PC
    Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 4, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1999


    Original     		PDF SRAM/LOGIC-R52LD 121C/100 CY62137-AI MR94085 tms 9937 TSMC fuse PALC22V10b M99242 CY7C1353-AC MR841 Hyundai 9944 PALC22V10B-15PC

    tms 9937

    Abstract: M9922 TSMC fuse PALC22V10B-15PC 135C-6 cy7c136 PALC22V10B Hyundai 9944 140C CY7B923-JI
    Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 4, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1999


    Original     		PDF SRAM/LOGIC-R52LD 121C/100 CY62137-AI MR94085 tms 9937 M9922 TSMC fuse PALC22V10B-15PC 135C-6 cy7c136 PALC22V10B Hyundai 9944 140C CY7B923-JI

    MR841

    Abstract: M84032 M84020 CY7C341 MR840
    Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 1, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999


    Original     		PDF SRAM/LOGIC-R52H 140C/3 CY62128V-ZAIB MR84072 121C/100 MR84070 MR841 M84032 M84020 CY7C341 MR840

    reliability report

    Abstract: MR840
    Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 3, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 3, 1999


    Original     		PDF CY62137VL-ZSIB reliability report MR840

    MS1562

    Abstract: SPX29150 SPX29300 reliability report and tests for failure rate the1000
    Text: Reliability and Qualification Report Silan BP4 Process Reliability Qualification using the SPX29150 Prepared By: Salvador Wu & Greg West QA Engineering Date: September 15, 2006 SPX29150 Reliability Report Reviewed By: Fred Claussen VP Quality & Reliability


    Original     		PDF SPX29150 SPX29150 O-263 SPX29150/51/52/53 130C/85 96hrs MS1562 SPX29300 reliability report and tests for failure rate the1000

    W49C65

    Abstract: 9938 9952 l28 cypress 9938 G 9948 PALC22V10B Taiwan Alpha TSMC Flash cy82
    Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 1, 2000 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 2000


    Original     		PDF 125C/-55C CY62146VLL-BAIB 121C/100 150C/-65C CY62137VL-BAI W49C65 9938 9952 l28 cypress 9938 G 9948 PALC22V10B Taiwan Alpha TSMC Flash cy82

    tw 9907

    Abstract: W48C101-01H M99213 malaysia 99052 MR92184 M99219 99141 CY7C63101A-SC MR840 MR841
    Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 2, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999


    Original     		PDF SRAM/LOGIC-R52LD CY62137VL-ZSIB tw 9907 W48C101-01H M99213 malaysia 99052 MR92184 M99219 99141 CY7C63101A-SC MR840 MR841

    M82055

    Abstract: m80-193 CY7C1399 M82021 CY7C341-RMB CY7C341 reliability report M83029 VIC068A-BC HTSSL
    Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 3, 1998 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 3, 1998


    Original     		PDF -----------------------SRAM/LOGIC-R42HD CY7C1011-ZC M82055 m80-193 CY7C1399 M82021 CY7C341-RMB CY7C341 reliability report M83029 VIC068A-BC HTSSL

    W49C65

    Abstract: CY62256-SNC CY7C6300 CY7C4385 Hyundai 9944 PALC22V10B-15PC MR001230 9918
    Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 1, 2000 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 2000


    Original     		PDF Co619925642 W49C65 CY62256-SNC CY7C6300 CY7C4385 Hyundai 9944 PALC22V10B-15PC MR001230 9918

    Capacitor Assembly MTBF

    Abstract: spx1117 5 SPX1117 FIT rate MS1557
    Text: Reliability and Qualification Report Silan BP1 Process Reliability Qualification using the SPX1117 Prepared By: Salvador Wu & Greg West QA Engineering Date: September 15, 2006 SPX1117 Reliability Report Reviewed By: Fred Claussen VP Quality & Reliability Date: September 15, 2006


    Original     		PDF SPX1117 SPX1117 /200V. 130C/85 96hrs Capacitor Assembly MTBF spx1117 5 FIT rate MS1557

    SPX2945

    Abstract: SPX2951 SPX2954 MS1595
    Text: Reliability and Qualification Report Silan BP3 Process Reliability Qualification using the SPX2945 Prepared By: Salvador Wu & Greg West QA Engineering Date: November 29, 2006 SPX2945 Reliability Report Reviewed By: Fred Claussen VP Quality & Reliability Date: November 29, 2006


    Original     		PDF SPX2945 SPX2945 O-263 130C/85 96hrs 48hrs SPX2951 SPX2954 MS1595

    130C

    Abstract: SP6128A reliability testing report SP6128
    Text: Reliability and Qualification Report Silan BC1 Process Reliability Qualification using the SP6128A Prepared By: Salvador Wu & Greg West QA Engineering Date: January 2, 2007 SP6128A Reliability Report Reviewed By: Fred Claussen VP Quality & Reliability Date: January 2, 2007


    Original     		PDF SP6128A SP6128A /-200mA. 130C/85 96hrs 48hrs 130C reliability testing report SP6128

    quality control assurance and reliability

    Abstract: reliability ESD audit mechanical engineering reliability report quality and reliability report product audit semiconductor quality assurance office organization
    Text: Quality and Reliability Report 2. Quality and Reliability Organization The Quality and Reliability Assurance Division quality and reliability monitoring and im- at Winbond reports directly to the President's provement programs, which ensure that prod- Office. One of the division's main responsibili-


    Original     		PDF

    koike relays

    Abstract: ed27 smd diode EM 231 WIRING DIAGRAM corona discharge circuit simulation smd transistor marking xy TOSHIBA Thyristor tunnel diode GaAs QFP100 injection molding machine wire diagram position sensitive diode circuit
    Text: [ 2 ] Semiconductor Reliability Contents 1. Reliability Concept . 1 1.1 Defining and Quantifying Reliability. 1 1.2 1.3 Reliability and Time. 1


    Original     		PDF NS-15, koike relays ed27 smd diode EM 231 WIRING DIAGRAM corona discharge circuit simulation smd transistor marking xy TOSHIBA Thyristor tunnel diode GaAs QFP100 injection molding machine wire diagram position sensitive diode circuit

    68hc26

    Abstract: 68HC05C4 68hc705p9 68HC05B6 JPC3400 68hc805b6 68705r3 68HC05C12 68HC705B5 68HC68SE
    Text: CSIC Microcontroller Division Reliability and Quality Quarter 2, 1996 Report MOTOROLA INC., 1996 CSIC MICROCONTROLLER DIVISION RELIABILITY AND QUALITY REPORT TECHNICAL INFORMATION . 1-1 RELIABILITY DATA BY TECHNOLOGY. 2-1


    Original     		PDF

    D87C257

    Abstract: ic 41315 D27256 US94V D2732A intel 2708 eprom intel 4308 intel EPROM RR-35 D27C256
    Text: in ter RELIABILITY REPORT RR-35 November 1990 EPROM RELIABILITY DATA SUMMARY Order Number: 210473-007 5-287 5 RR-35 INTEL EPROM RELIABILITY DATA SUMMARY CONTENTS page The Importance of Reliability. 5-289 EPROM Reliability Data Summary . 5-289


    OCR Scan     		PDF RR-35 D2732A D2764A D27128A D27256 D27C256 D87C257 P2764A. 27C256 D87C257 ic 41315 D27256 US94V D2732A intel 2708 eprom intel 4308 intel EPROM RR-35 D27C256

    P21256

    Abstract: p21464 411K intel 21256 p21010
    Text: intei RELIABILITY REPORT RR-62 September 1989 Dynamic RAM Reliability Report MADHU NIMGAONKAR COMPONENTS CONTRACTING DIVISION QUALITY AND RELIABILITY ENGINEERING Order Number: 240543-001 3-158 DRAM RELIABILITY DATA SUMMARY CONTENTS PAGE 1.0 OVERVIEW . 3-160


    OCR Scan     		PDF RR-62 P21256 p21464 411K intel 21256 p21010

    Sample form for INPROCESS Inspection of RAW MATERIAL

    Abstract: No abstract text available
    Text: RELIABILITY REPORT THE RELIABILITY APPROACH To ensure maximum reliability is one of the prime goals of the SGS-THOMSON Discrete and Standard Circuits Division. Reliability is an intrinsic factor in the fabrication of any device even from the design stage.


    OCR Scan     		PDF subj2009; Sample form for INPROCESS Inspection of RAW MATERIAL

    RR-63

    Abstract: No abstract text available
    Text: inteT RELIABILITY REPORT RR-63 August 1989 4 Static RAM Reliability Report MADHU NIMGAONKAR COMPONENTS CONTRACTING DIVISION QUALITY AND RELIABILITY ENGINEERING Order Number: 240544-001 4-63 SRAM RELIABILITY DATA SUMMARY CONTENTS PAGE 1.0 IN T R O D U C T IO N .4-65


    OCR Scan     		PDF RR-63 RR-63