Untitled
Abstract: No abstract text available
Text: SN54ABT374, SN74ABT374 OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCBS111D – FEBRUARY 1991 – REVISED JULY 1994 • • • • State-of-the-Art EPIC-ΙΙB BiCMOS Design Significantly Reduces Power Dissipation Latch-Up Performance Exceeds 500 mA
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SN54ABT374,
SN74ABT374
SCBS111D
JESD-17
32-mA
64-mA
SN54ABT374
SN74ABT374
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Untitled
Abstract: No abstract text available
Text: SN54ABT623A, SN74ABT623 OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS SCBS114D – FEBRUARY 1991 – REVISED MAY 1997 D D D D SN54ABT623A . . . JT OR W PACKAGE SN74ABT623 . . . DB, DW, N, OR PW PACKAGE TOP VIEW OEAB A1 A2 A3 A4 A5 A6 A7 A8 GND 1 20 2 19 3
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SN54ABT623A,
SN74ABT623
SCBS114D
MIL-STD-883,
JESD-17
32-mA
64-mA
SN54ABT623A
SN74ABT623PW
SN74ABT623PWLE
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Untitled
Abstract: No abstract text available
Text: SN54ABT16541, SN74ABT16541A 16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS118C – FEBRUARY 1991 – REVISED JANUARY 1997 D D D D D D D D SN54ABT16541 . . . WD PACKAGE SN74ABT16541A . . . DGG, DGV, OR DL PACKAGE TOP VIEW Members of the Texas Instruments
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SN54ABT16541,
SN74ABT16541A
16-BIT
SCBS118C
SN54ABT16541
JESD-17
32-mA
64-mA
300-mil
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Untitled
Abstract: No abstract text available
Text: SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999 D D D D D D Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments Widebus Family
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SN54ABT18245A,
SN74ABT18245A
18-BIT
SCBS110H
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Untitled
Abstract: No abstract text available
Text: SN54ABT623A, SN74ABT623 OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS SCBS114D – FEBRUARY 1991 – REVISED MAY 1997 D D D D SN54ABT623A . . . JT OR W PACKAGE SN74ABT623 . . . DB, DW, N, OR PW PACKAGE TOP VIEW OEAB A1 A2 A3 A4 A5 A6 A7 A8 GND 1 20 2 19 3
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SN54ABT623A,
SN74ABT623
SCBS114D
SN54ABT623A
SN54ABT623A
SN74ABT623
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SN54ABT620
Abstract: SN74ABT620 ma5250
Text: SN54ABT620, SN74ABT620 OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS SCBS113D – FEBRUARY 1991 – REVISED APRIL 1998 D D D D SN54ABT620 . . . J PACKAGE SN74ABT620 . . . DB, DW, N, OR PW PACKAGE TOP VIEW OEAB A1 A2 A3 A4 A5 A6 A7 A8 GND 20 2 19 3 18 4 17
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SN54ABT620,
SN74ABT620
SCBS113D
SN54ABT620
ABT620
SN54ABT620
SN74ABT620
ma5250
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Untitled
Abstract: No abstract text available
Text: SN54ABT16541, SN74ABT16541A 16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS118C – FEBRUARY 1991 – REVISED JANUARY 1997 D D D D D D D D SN54ABT16541 . . . WD PACKAGE SN74ABT16541A . . . DGG, DGV, OR DL PACKAGE TOP VIEW Members of the Texas Instruments
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SN54ABT16541,
SN74ABT16541A
16-BIT
SCBS118C
JESD-17
32-mA
64-mA
300-mil
380-mil
scyd013
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Untitled
Abstract: No abstract text available
Text: CDC328 1-LINE TO 6-LINE CLOCK DRIVER WITH SELECTABLE POLARITY SCBS116B – JANUARY 1991 – REVISED MARCH 1994 • • • • • • • • • D OR DB PACKAGE TOP VIEW Replaces SN74ABT328 Low Output Skew for Clock-Distribution and Clock-Generation Applications
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CDC328
SCBS116B
SN74ABT328
15-mA
64-mA
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Untitled
Abstract: No abstract text available
Text: SN54ABT620, SN74ABT620 OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS SCBS113D – FEBRUARY 1991 – REVISED APRIL 1998 D D D D SN54ABT620 . . . J PACKAGE SN74ABT620 . . . DB, DW, N, OR PW PACKAGE TOP VIEW OEAB A1 A2 A3 A4 A5 A6 A7 A8 GND 20 2 19 3 18 4 17
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SN54ABT620,
SN74ABT620
SCBS113D
ABT620
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Untitled
Abstract: No abstract text available
Text: SN54ABT374, SN74ABT374A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCBS111G – FEBRUARY 1991 – REVISED JANUARY 1997 D D D D SN54ABT374 . . . J OR W PACKAGE SN74ABT374A . . . DB, DW, N, OR PW PACKAGE TOP VIEW OE 1Q 1D 2D 2Q 3Q 3D 4D 4Q
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SN54ABT374,
SN74ABT374A
SCBS111G
JESD-17
32-mA
64-mA
MIL-STD-883,
SN54ABT374
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Untitled
Abstract: No abstract text available
Text: SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999 D D D D D D Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments Widebus Family
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SN54ABT18245A,
SN74ABT18245A
18-BIT
SCBS110H
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abt374a
Abstract: No abstract text available
Text: SN54ABT374, SN74ABT374A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCBS111G – FEBRUARY 1991 – REVISED JANUARY 1997 D D D D SN54ABT374 . . . J OR W PACKAGE SN74ABT374A . . . DB, DW, N, OR PW PACKAGE TOP VIEW OE 1Q 1D 2D 2Q 3Q 3D 4D 4Q
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SN54ABT374,
SN74ABT374A
SCBS111G
JESD-17
32-mA
64-mA
MIL-STD-883,
SN54ABT374
abt374a
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Untitled
Abstract: No abstract text available
Text: SN54ABT623A, SN74ABT623 OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS SCBS114D – FEBRUARY 1991 – REVISED MAY 1997 D D D D SN54ABT623A . . . JT OR W PACKAGE SN74ABT623 . . . DB, DW, N, OR PW PACKAGE TOP VIEW OEAB A1 A2 A3 A4 A5 A6 A7 A8 GND 1 20 2 19 3
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SN54ABT623A,
SN74ABT623
SCBS114D
MIL-STD-883,
JESD-17
32-mA
64-mA
SN54ABT623A
SN74ABT623N
SN74ABT623NSR
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SN54ABT18245A
Abstract: SN74ABT18245A
Text: SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999 D D D D D D Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments Widebus Family
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SN54ABT18245A,
SN74ABT18245A
18-BIT
SCBS110H
SN54ABT18245A
SN74ABT18245A
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5962-9314901QRA
Abstract: 5962-9314901QSA SN54ABT374 SN74ABT374 5962-9314901Q2A
Text: SN54ABT374, SN74ABT374 OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCBS111D – FEBRUARY 1991 – REVISED JULY 1994 • • • • State-of-the-Art EPIC-ΙΙB BiCMOS Design Significantly Reduces Power Dissipation Latch-Up Performance Exceeds 500 mA
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SN54ABT374,
SN74ABT374
SCBS111D
JESD-17
32-mA
64-mA
SN54ABT374
5962-9314901QRA
5962-9314901QSA
SN54ABT374
SN74ABT374
5962-9314901Q2A
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Untitled
Abstract: No abstract text available
Text: SN54ABT620, SN74ABT620 OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS SCBS113D – FEBRUARY 1991 – REVISED APRIL 1998 D D D D SN54ABT620 . . . J PACKAGE SN74ABT620 . . . DB, DW, N, OR PW PACKAGE TOP VIEW OEAB A1 A2 A3 A4 A5 A6 A7 A8 GND 20 2 19 3 18 4 17
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SN54ABT620,
SN74ABT620
SCBS113D
ABT620
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Untitled
Abstract: No abstract text available
Text: SN54ABT374, SN74ABT374 OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCBS111D – FEBRUARY 1991 – REVISED JULY 1994 • • • • State-of-the-Art EPIC-ΙΙB BiCMOS Design Significantly Reduces Power Dissipation Latch-Up Performance Exceeds 500 mA
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Original
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SN54ABT374,
SN74ABT374
SCBS111D
JESD-17
32-mA
64-mA
SN54ABT374
SN74ABT374
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5962-9314901Q2A
Abstract: 5962-9314901QRA 5962-9314901QSA SN54ABT374 SN74ABT374A
Text: SN54ABT374, SN74ABT374A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCBS111G – FEBRUARY 1991 – REVISED JANUARY 1997 D D D D SN54ABT374 . . . J OR W PACKAGE SN74ABT374A . . . DB, DW, N, OR PW PACKAGE TOP VIEW OE 1Q 1D 2D 2Q 3Q 3D 4D 4Q
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SN54ABT374,
SN74ABT374A
SCBS111G
SN54ABT374
5962-9314901Q2A
5962-9314901QRA
5962-9314901QSA
SN54ABT374
SN74ABT374A
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Untitled
Abstract: No abstract text available
Text: SN54ABT623A, SN74ABT623 OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS SCBS114D – FEBRUARY 1991 – REVISED MAY 1997 D D D D SN54ABT623A . . . JT OR W PACKAGE SN74ABT623 . . . DB, DW, N, OR PW PACKAGE TOP VIEW OEAB A1 A2 A3 A4 A5 A6 A7 A8 GND 1 20 2 19 3
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SN54ABT623A,
SN74ABT623
SCBS114D
SN54ABT623A
SN54ABT623A
SN74ABT623
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SN74BCT2410
Abstract: SN74BCT2410DW
Text: SN74BCT2410 11ĆBIT MOS MEMORY DRIVER WITH 3ĆSTATE OUTPUTS SCBS119B − JUNE 1990 − REVISED NOVEMBER 1993 • • • • DW PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces ICCZ ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015; Exceeds
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SN74BCT2410
11BIT
SCBS119B
MIL-STD-883C,
SN74BCT2410
11-bit
SN74BCT2410DW
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SN54ABT18245A
Abstract: SN74ABT18245A SCBS110g
Text: SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110G – AUGUST 1992 – REVISED DECEMBER 1996 D D D D D D Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments Widebus Family
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SN54ABT18245A,
SN74ABT18245A
18-BIT
SCBS110G
SN54ABT18245A
SN74ABT18245A
SCBS110g
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Untitled
Abstract: No abstract text available
Text: SN54ABT620, SN74ABT620 OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS SCBS113D – FEBRUARY 1991 – REVISED APRIL 1998 D D D D SN54ABT620 . . . J PACKAGE SN74ABT620 . . . DB, DW, N, OR PW PACKAGE TOP VIEW OEAB A1 A2 A3 A4 A5 A6 A7 A8 GND 20 2 19 3 18 4 17
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SN54ABT620,
SN74ABT620
SCBS113D
SN54ABT620
ABT620
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Untitled
Abstract: No abstract text available
Text: SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110G-AUGUST 1992-REVISED DECEMBER 1996 M e m b e r s of the Texas I n s t r u m e nt s S C O P E F a mi l y of Testabil ity P r o d u c t s SN54ABT1 8245A . . . WD PACKAGE
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OCR Scan
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PDF
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SN54ABT18245A,
SN74ABT18245A
18-BIT
SCBS110G-AUGUST
1992-REVISED
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Untitled
Abstract: No abstract text available
Text: SN54ABT16541, SN74ABT16541A 16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS118C- FEBRUARY 1991 - REVISED JANUARY 1997 I I • Members of the Texas Instruments Widebus Family I • State-of-the-Art EPIC-UB™ BICMOS Design Significantly Reduces Power Dissipation
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OCR Scan
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SN54ABT16541,
SN74ABT16541A
16-BIT
SCBS118C-
JESD-17
SN54ABT16
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