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    SIC PHOTODIODES Search Results

    SIC PHOTODIODES Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    MG800FXF1ZMS3 Toshiba Electronic Devices & Storage Corporation N-ch SiC MOSFET Module, 3300 V, 800 A, iXPLV, High-side: SiC MOSFET、Low-side: SiC SBD Visit Toshiba Electronic Devices & Storage Corporation
    MG800FXF1JMS3 Toshiba Electronic Devices & Storage Corporation N-ch SiC MOSFET Module, 3300 V, 800 A, iXPLV, High-side: SiC SBD、Low-side: SiC MOSFET Visit Toshiba Electronic Devices & Storage Corporation
    TRS8E65H Toshiba Electronic Devices & Storage Corporation SiC Schottky Barrier Diode (SBD), 650 V, 8 A, TO-220-2L Visit Toshiba Electronic Devices & Storage Corporation
    TRS10E65H Toshiba Electronic Devices & Storage Corporation SiC Schottky Barrier Diode (SBD), 650 V, 10 A, TO-220-2L Visit Toshiba Electronic Devices & Storage Corporation
    TRS6E65H Toshiba Electronic Devices & Storage Corporation SiC Schottky Barrier Diode (SBD), 650 V, 6 A, TO-220-2L Visit Toshiba Electronic Devices & Storage Corporation

    SIC PHOTODIODES Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    JEC 0.1 S

    Abstract: JEC ELECTRONICS uv light PHOTO detector JEC 400 JEC 0.1 SO uv PHOTO detector UV photodiodes UV diode 280 nm solar photodiodes UV flame detection
    Text: JEC Series SiC Ultraviolet Photodiodes SiC Ultraviolet Photodiodes Boston Electronics’s Silicon Carbide SiC photodetectors are photovoltaic devices similar to silicon solar cells, and need no external power supply (bias) to operate. Only light shorter than a wavelength of ~400 nm is absorbed and produces photocurrent.


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    SIC01S-18ISO90

    Abstract: SiC Photodiodes
    Text: SIC01S-18ISO90 v 6.0 Description SiC provides the unique property of extreme radiation hardness, near-perfect visible blindness, low dark current, high speed and low noise. These features make SiC the best available material for visible blind semiconductor UV detectors. The SiC


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    PDF SIC01S-18ISO90 SIC01S-18ISO90 SiC Photodiodes

    SIC01S-C18

    Abstract: No abstract text available
    Text: SIC01S-C18 v 6.0 Description SiC provides the unique property of extreme radiation hardness, near-perfect visible blindness, low dark current, high speed and low noise. These features make SiC the best available material for visible blind semiconductor UV detectors. The SiC detectors can be permanently operated at up to 170°C 338°F . The


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    PDF SIC01S-C18 SIC01S-C18

    SIC01L-18

    Abstract: No abstract text available
    Text: SIC01L-18 v 6.0 Description SiC provides the unique property of extreme radiation hardness, near-perfect visible blindness, low dark current, high speed and low noise. These features make SiC the best available material for visible blind semiconductor UV detectors. The SiC detectors can be permanently operated at up to 170°C 338°F . The


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    PDF SIC01L-18 SIC01L-18

    SIC01S-18

    Abstract: No abstract text available
    Text: SIC01S-18 v 6.0 Description SiC provides the unique property of extreme radiation hardness, near-perfect visible blindness, low dark current, high speed and low noise. These features make SiC the best available material for visible blind semiconductor UV detectors. The SiC detectors can be permanently operated at up to 170°C 338°F . The


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    PDF SIC01S-18 SIC01S-18

    SIC01XL-5

    Abstract: No abstract text available
    Text: SIC01XL-5 v 6.0 Description SiC provides the unique property of extreme radiation hardness, near-perfect visible blindness, low dark current, high speed and low noise. These features make SiC the best available material for visible blind semiconductor UV detectors. The SiC detectors can be permanently operated at up to 170°C 338°F . The


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    PDF SIC01XL-5 SIC01XL-5

    SIC01M-18

    Abstract: No abstract text available
    Text: SIC01M-18 v 6.0 Description SiC provides the unique property of extreme radiation hardness, near-perfect visible blindness, low dark current, high speed and low noise. These features make SiC the best available material for visible blind semiconductor UV detectors. The SiC detectors can be permanently operated at up to 170°C 338°F . The


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    PDF SIC01M-18 SIC01M-18

    SIC01L-5

    Abstract: No abstract text available
    Text: SIC01L-5 v 6.0 Description SiC provides the unique property of extreme radiation hardness, near-perfect visible blindness, low dark current, high speed and low noise. These features make SiC the best available material for visible blind semiconductor UV detectors. The SiC detectors can be permanently operated at up to 170°C 338°F . The


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    PDF SIC01L-5 SIC01L-5

    SIC01L-C5

    Abstract: No abstract text available
    Text: SIC01L-C5 v 6.0 Description SiC provides the unique property of extreme radiation hardness, near-perfect visible blindness, low dark current, high speed and low noise. These features make SiC the best available material for visible blind semiconductor UV detectors. The SiC detectors can be permanently operated at up to 170°C 338°F . The


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    PDF SIC01L-C5 SIC01L-C5

    SIC01M-5LENS

    Abstract: No abstract text available
    Text: SIC01M-5LENS V 6.0 Description SiC provides the unique property of extreme radiation hardness, near-perfect visible blindness, low dark current, high speed and low noise. These features make SiC the best available material for visible blind semiconductor UV detectors. The SiC detectors can be permanently operated at up to 170°C 338°F . The


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    PDF SIC01M-5LENS SIC01M-5LENS

    SIC01S-B18

    Abstract: No abstract text available
    Text: SIC01S-B18 v 6.0 Description SiC provides the unique property of extreme radiation hardness, near-perfect visible blindness, low dark current, high speed and low noise. These features make SiC the best available material for visible blind semiconductor UV detectors. The SiC detectors can be permanently operated at up to 170°C 338°F . The


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    PDF SIC01S-B18 SIC01S-B18

    Untitled

    Abstract: No abstract text available
    Text: SiC-photodiodes JEC1,6I / JEC5I preliminary data sheet characteristics : ♦ ♦ ♦ ♦ ♦ ♦ ♦ large area monolithic SiC photodiodes active aerea: 1,55 or 5 mm² spectral range: 215 … 360 nm high UV-responsivity: 0,16 A/W photodiode isolated to package


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    PDF O39-package AD795,

    EPD-310-0-0

    Abstract: 320nm
    Text: EPD-310-0-0.3-C/D* UV-Photodiodes Wavelength range Type Technology Case UVB UV glass with filter SiC TO-5 Description High spectral sensitivity in the UVB range 290 nm - 330nm , low cost chip based on SiC 1,2 Environmental technology, analytical techniques,


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    PDF EPD-310-0-0 330nm) 320nm D-12555 320nm

    Untitled

    Abstract: No abstract text available
    Text: SIC01D-B18 rev.6.1 04/15 Description SiC provides the unique property of extreme radiation hardness, near-perfect visible blindness, low dark current, high speed and low noise. These features make SiC the best available material for visible blind semiconductor UV detectors. The SiC detectors can be permanently operated at up to 170°C 338°F . The


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    PDF SIC01D-B18

    Untitled

    Abstract: No abstract text available
    Text: EPD-270-0-0.3-C/D* UV-Photodiodes Wavelength range Type Technology Case UVC UV glass with filter SiC TO-5 / TO-18 Description High spectral sensitivity in the UVC range 230 nm - 285nm , low cost chip based on SiC 1,2 Applications Environmental technology, analytical techniques,


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    PDF EPD-270-0-0 285nm) 254nm D-12555

    Untitled

    Abstract: No abstract text available
    Text: EPD-280-0-0.3-C/D* UV-Photodiodes Wavelength range Type Technology Case UVA - UVC UV glass SiC TO-5 / TO-18 Description High spectral sensitivity in the UVA-UVC range 220 nm - 380nm , low cost chip based on SiC, excellence stability on high irradiance Environmental


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    PDF EPD-280-0-0 380nm) 254nm D-12555

    Untitled

    Abstract: No abstract text available
    Text: UV-Photodiodes EPD-280-0-0.3-L* Wavelength range Type Technology Case UVA - UVC UV glass with lens SiC TO-5 Description High spectral sensitivity by lens in the UVA-UVC range 220 nm - 380nm , low cost chip based on SiC 1,2 Responsivity 1 Applications Environmental technology, analytical techniques,


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    PDF EPD-280-0-0 380nm) 254nm D-12555

    westinghouse transistors

    Abstract: No abstract text available
    Text: IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 55, NO. 8, AUGUST 2008 1807 A 10-kV Large-Area 4H-SiC Power DMOSFET With Stable Subthreshold Behavior Independent of Temperature Robert S. Howell, Member, IEEE, Steven Buchoff, Stephen Van Campen, Member, IEEE, Ty R. McNutt, Member, IEEE, Andris Ezis, Senior Member, IEEE, Bettina Nechay, Member, IEEE,


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    PDF 10-kV westinghouse transistors

    uv-tiamo-m

    Abstract: No abstract text available
    Text: UV-TIAMO-M v 3.0 Description The UV-TIAMO devices are using modern hybride technology to cancel unwanted signal disturbances caused by moisture or electromagnetic radiation. The stable 0…5V output voltage can be directly connected to a SPC controller or a voltage multimeter. No external amplifier is needed.


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    uv-tiamo-s

    Abstract: No abstract text available
    Text: UV-TIAMO-S v 3.0 Description The UV-TIAMO devices are using modern hybride technology to cancel unwanted signal disturbances caused by moisture or electromagnetic radiation. The stable 0…5V output voltage can be directly connected to a SPC controller or a voltage multimeter. No external amplifier is needed.


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    uv-tiamo

    Abstract: No abstract text available
    Text: UV-TIAMO v 3.0 Description The UV-TIAMO devices are using modern hybride technology to cancel unwanted signal disturbances caused by moisture or electromagnetic radiation. The stable 0…5V output voltage can be directly connected to a SPC controller or a voltage multimeter. No external amplifier is needed.


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    uv-tiamo-bl

    Abstract: No abstract text available
    Text: UV-TIAMO-BL v 3.0 Description The UV-TIAMO devices are using modern hybride technology to cancel unwanted signal disturbances caused by moisture or electromagnetic radiation. The stable 0…5V output voltage can be directly connected to a SPC controller or a voltage multimeter. No external amplifier is needed.


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    E3081

    Abstract: HT2080 CINOX OSCILLATOR CMOS technology length 0.4um 12GE 88Au HT1104HZ HT2160 IC CD4066 quad bilateral switch HTMOS
    Text: High Temperature Electronics for Sensor Interface and Data Acquisition Sensors Expo, October 7, 1998 Jay Goetz – Applications Engineer Honeywell SSEC 12001 St Hwy 55 Plymouth MN 55441 612 954-2520 jay.goetz@corp.honeywell.com Introduction High Temperature designs need components rated to operate in the harsh environment in which they will be


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    PDF Report-1997, E3081 HT2080 CINOX OSCILLATOR CMOS technology length 0.4um 12GE 88Au HT1104HZ HT2160 IC CD4066 quad bilateral switch HTMOS

    FPT102

    Abstract: FPT720
    Text: 1-15 Photodiodes BV lR - 5.0 iiA, H < 0.1 IIW/cm» Min Typ vn V R Tungsten R Q 0.9 ii Responïivtty. Respontivity •r ■l T (jA/mW/cm1 iiA/mW/cm' V „« -1 0 V V „ = -1 0 V H £ 0.1 MW/cm> H —20 mW/em* Tc = 2854K No bias, GaAs Typ Max Min Typ Min Typ


    OCR Scan
    PDF --10V 2854K FPT102 FPT720 FPT1I02