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    SN74BCT8373A, Search Results

    SN74BCT8373A, Result Highlights (1)

    Part ECAD Model Manufacturer Description Download Buy
    SN74BCT8373ADW Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Visit Texas Instruments Buy
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    SN74BCT8373A, Price and Stock

    Texas Instruments SN74BCT8373ADW

    IC SCAN TEST DEVICE LATCH 24SOIC
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey SN74BCT8373ADW Tube 125
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    Mouser Electronics SN74BCT8373ADW
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    Verical SN74BCT8373ADW 2,971 47
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    Arrow Electronics SN74BCT8373ADW 50 12 Weeks 25
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    Rochester Electronics SN74BCT8373ADW 2,976 1
    • 1 $6.57
    • 10 $6.57
    • 100 $6.18
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    Texas Instruments SN74BCT8373ANT

    IC SCAN TEST DEVICE LATCH 24-DIP
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey SN74BCT8373ANT Tube
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    Verical SN74BCT8373ANT 915 53
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    SN74BCT8373ANT 790 53
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    SN74BCT8373ANT 235 53
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    SN74BCT8373ANT 229 53
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    Rochester Electronics SN74BCT8373ANT 2,169 1
    • 1 $5.79
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    • 100 $5.44
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    Rochester Electronics LLC SN74BCT8373ADW

    SN74BCT8373A IEEE STD 1149.1 (JT
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey SN74BCT8373ADW Bulk 44
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    • 100 $6.83
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    Rochester Electronics LLC SN74BCT8373ANT

    BUS DRIVER
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey SN74BCT8373ANT Tube 50
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    • 100 $6.02
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    Texas Instruments SN74BCT8373ADWR

    IC SCAN TEST DEVICE LATCH 24SOIC
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey SN74BCT8373ADWR Reel 2,000
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    • 10000 $5.80746
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    Quest Components SN74BCT8373ADWR 30
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    Rochester Electronics SN74BCT8373ADWR 26,356 1
    • 1 $3.58
    • 10 $3.58
    • 100 $3.37
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    Find more SN74BCT8373A, price and stock on Findchips.com

    SN74BCT8373A, Datasheets (24)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    SN74BCT8373A Texas Instruments SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES Original PDF
    SN74BCT8373A Texas Instruments SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES Original PDF
    SN74BCT8373ADW Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Original PDF
    SN74BCT8373ADW Texas Instruments SCAN Bridge, JTAG Test Port Original PDF
    SN74BCT8373ADW Texas Instruments SN74BCT8373 - IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Original PDF
    SN74BCT8373ADWE4 Texas Instruments SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES Original PDF
    SN74BCT8373ADWE4 Texas Instruments SN74BCT8373 - IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Original PDF
    SN74BCT8373ADWG4 Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Original PDF
    SN74BCT8373ADWG4 Texas Instruments SN74BCT8373 - IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Original PDF
    SN74BCT8373ADWR Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches Original PDF
    SN74BCT8373ADWR Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Original PDF
    SN74BCT8373ADWR Texas Instruments Logic - Specialty Logic, Integrated Circuits (ICs), IC SCAN TEST DEVICE LATCH 24SOIC Original PDF
    SN74BCT8373ADWR Texas Instruments SN74BCT8373 - IC BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24, PLASTIC, SO-24, Bus Driver/Transceiver Original PDF
    SN74BCT8373ADWRE4 Texas Instruments SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES Original PDF
    SN74BCT8373ADWRE4 Texas Instruments Logic - Specialty Logic, Integrated Circuits (ICs), IC SCAN TEST DEVICE LATCH 24SOIC Original PDF
    SN74BCT8373ADWRE4 Texas Instruments SN74BCT8373 - IC BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24, PLASTIC, SO-24, Bus Driver/Transceiver Original PDF
    SN74BCT8373ADWRG4 Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Original PDF
    SN74BCT8373ADWRG4 Texas Instruments Logic - Specialty Logic, Integrated Circuits (ICs), IC SCAN TEST DEVICE 24SOIC Original PDF
    SN74BCT8373ADWRG4 Texas Instruments SN74BCT8373 - IC BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24, PLASTIC, SO-24, Bus Driver/Transceiver Original PDF
    SN74BCT8373ANT Texas Instruments SCAN Bridge, JTAG Test Port Original PDF