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    TEST SOT23 Search Results

    TEST SOT23 Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    TBAW56 Toshiba Electronic Devices & Storage Corporation Switching Diode, 80 V, 0.215 A, SOT23 Visit Toshiba Electronic Devices & Storage Corporation
    FO-62.5LPBMT0-001 Amphenol Cables on Demand Amphenol FO-62.5LPBMT0-001 MT-RJ Connector Loopback Cable: Multimode 62.5/125 Fiber Optic Port Testing .1m Datasheet
    FO-9LPBMTRJ00-001 Amphenol Cables on Demand Amphenol FO-9LPBMTRJ00-001 MT-RJ Connector Loopback Cable: Single-Mode 9/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFP28LPB1W-3DB Amphenol Cables on Demand Amphenol SF-SFP28LPB1W-3DB SFP28 Loopback Adapter Module for SFP28 Port Compliance Testing - 3dB Attenuation & 1W Power Consumption Datasheet
    FO-50LPBMTRJ0-001 Amphenol Cables on Demand Amphenol FO-50LPBMTRJ0-001 MT-RJ Connector Loopback Cable: Multimode 50/125 Fiber Optic Port Testing .1m Datasheet

    TEST SOT23 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    g28 SOT23

    Abstract: weston 461 st 95160 9418 transistor TO-92 9742 9943 so-8 9418 transistor 9806 9928 f56 dd pack m
    Text: CONTENTS October 2000 OPERATING LIFE TEST SUMMARY . 2 HAST . 3 AUTOCLAVE TEST . 4


    Original     		PDF S-191 g28 SOT23 weston 461 st 95160 9418 transistor TO-92 9742 9943 so-8 9418 transistor 9806 9928 f56 dd pack m

    1N5224

    Abstract: BZV55C4V3 BZV55C6V2 BZV55C12 BZV55C15
    Text: Zener Diodes Part Number Package Outline Power Dissipation Pd (mW) Max. Voltage (VZ) (V) Test Current (IZT) (mA) Max Reverse Leakage Current (IR) ( A) Test Voltage (VR) (V) MAX. Zener Impedance (ZZT) (Ω) MAX. Zener Impedance (ZZk) (Ω) Test Current (IZk)


    Original     		PDF MMBZ5221B OT-23 MMBZ5222B MMBZ5223B MMBZ5225B MMBZ5226B 1N5224 BZV55C4V3 BZV55C6V2 BZV55C12 BZV55C15

    74254

    Abstract: r08 sot223 TMCT1102 ZHCS400CT-ND 293D226X9016B2TE3 SiP9122 Zener Diode SOD-323 VJ0603g105KXqCW1BC r05 sot-23 DIODE C06 15
    Text: SiP11203DB Vishay Siliconix SiP11203 Demonstration Board DEMONSTRATION BOARD TEST SETUP This demonstration board test setup information details the test procedure for using the SiP11203 demonstration board and its associated host board. The demonstration board is plugged vertically into the host


    Original     		PDF SiP11203DB SiP11203 S-60997 12-Jun-06 74254 r08 sot223 TMCT1102 ZHCS400CT-ND 293D226X9016B2TE3 SiP9122 Zener Diode SOD-323 VJ0603g105KXqCW1BC r05 sot-23 DIODE C06 15

    BAS21 SOT23

    Abstract: BAS21 BAS20 diode 2U BAS21 A82 BAS19 BAS21A82 Diode a82 10 SOT23 BAS21 pin configuration
    Text: BAS19 BAS20 BAS21 BAS19 BAS20 BAS21 SOT23 SILICON HIGH SPEED SWITCHING DIODE ISSUE 2 – JANUARY 1995 SWITCHING TIME TEST DATA PIN CONFIGURATION  Recovery Time Equivalent Test Circuit Pulse Generator DUT ! 10% SOT23 ABSOLUTE MAXIMUM RATINGS. tp tot 90% 3


    Original     		PDF BAS19 BAS20 BAS21 BAS21 SOT23 BAS21 BAS20 diode 2U BAS21 A82 BAS19 BAS21A82 Diode a82 10 SOT23 BAS21 pin configuration

    INCOMING RAW MATERIAL INSPECTION

    Abstract: INCOMING Plate INSPECTION INCOMING RAW MATERIAL INSPECTION method INCOMING RAW MATERIAL INSPECTION form INCOMING RAW MATERIAL flowchart CARSEM LINEAR TECHNOLOGY mark code mil-std-883 2015 Gold Ball Bond Shear INCOMING RAW MATERIAL INSPECTION chart INCOMING MATERIAL FLOW PROCESS
    Text: Pg. 1 of 3 ATTACHMENT 2. ASSEMBLY FLOWCHART INCOMING Vendor: Product: Package: Location of Wafer Fab: Assembly: Final Test: Q.C. Test Source Accept Test: Quality Contact: Linear Technology Corporation BIPOLAR PROCESS 3, 4, 5, 6 Lead SOT-23 Linear Technology Corp., Milpitas,


    Original     		PDF OT-23 MIL-STD-883 INCOMING RAW MATERIAL INSPECTION INCOMING Plate INSPECTION INCOMING RAW MATERIAL INSPECTION method INCOMING RAW MATERIAL INSPECTION form INCOMING RAW MATERIAL flowchart CARSEM LINEAR TECHNOLOGY mark code mil-std-883 2015 Gold Ball Bond Shear INCOMING RAW MATERIAL INSPECTION chart INCOMING MATERIAL FLOW PROCESS

    h0 sod123

    Abstract: Transistor SMD SOT363 SC70 SOT353 hf Device h0 sod123 GaAs tunnel diode gFE smd diode SOD80 footprint sot23 footprint SOT346 ZENER thyristor handbook
    Text: Philips Semiconductors RF Wideband Transistors General section • Acceptance tests on finished products to verify conformance with the device specification. The test results are used for quality feedback and corrective actions. The inspection and test requirements are


    Original     		PDF MLB049 h0 sod123 Transistor SMD SOT363 SC70 SOT353 hf Device h0 sod123 GaAs tunnel diode gFE smd diode SOD80 footprint sot23 footprint SOT346 ZENER thyristor handbook

    marking z17

    Abstract: z1 BZX84C4V7 BZX84C3V9 marking Z1 sot Z5.6 BZX84C2V7 BZX84C3 BZX84C3V3 BZX84C3V6 MMBZ5223B
    Text: SURFACE MOUNT ZENER DIODES BZX84C-SERIES 350mW CrossPart No. Marking Zener Max.Dyn. Test Max.Dyn. Test Temp. Rev. Code Voltage Imped. Current Imped. Current Coeff. Current @ Izt @ Izt @ Izt @Vr Vz V Zzt(Ω) Reference @ Izk Izt(mA) Zzk(Ω) Izk(mA) avz(%/k)


    Original     		PDF BZX84C-SERIES 350mW BZX84C2V7 MMBZ5223B BZX84C3 MMBZ5225B BZX84C3V3 MMBZ5226B BZX84C3V6 MMBZ5227B marking z17 z1 BZX84C4V7 BZX84C3V9 marking Z1 sot Z5.6 BZX84C3 MMBZ5223B

    603 capacitor

    Abstract: TPS2420
    Text: Using the TPS2420, TPS2421-1 and TPS2421-2 User's Guide Literature Number: SLUU343 January 2009 User's Guide SLUU343 – January 2009 TPS2420 Hot Swap Controller System Test Board This user’s guide describes the setup and operation of the TPS2420 system test board.


    Original     		PDF TPS2420, TPS2421-1 TPS2421-2 SLUU343 SLUU343 TPS2420 TPS242X TPS2420/21 603 capacitor

    MIC29151WU

    Abstract: MIC2171WU MIC29151BU MIC2177YWM 20L SOT-23 UNISEM Preconditioning 3a204
    Text: RELIABILITY REPORT DATE: 4/28/2004 QUALITY ENG : Herb Grimm PURPOSE: Matte Tin Reliability Test Summary. HTOL - High Temperature Operating Life Test TA= + 125°C PACKAGE TYPE : PART NO. LOT ID. 168 HR 500 HR 1000HR SSOP 28L MIC2563AYSM 2A28088M01 0/116 0/116


    Original     		PDF 1000HR MIC2563AYSM 2A28088M01 MIC2177YWM 3A02058MEA OT-23 MIC5248YM 2A09099MEA O-263 MIC29151WU MIC29151WU MIC2171WU MIC29151BU MIC2177YWM 20L SOT-23 UNISEM Preconditioning 3a204

    MO-193

    Abstract: MO-178 mo178 MO-203 MO-223 to253 marking CODE MO MO marking code sot23 sc 13 transistor MO chip Transistor
    Text: LEADFRAME data sheet TSOT/SOT/SC Features Amkor’s SOT / SC packages offer: • Cu wire interconnect for low cost • Standard JEDEC and EIAJ package outlines • Turnkey test services, including strip test options • Green materials are standard - Pb free and RoHS compliant


    Original     		PDF

    free circuit diagram for voltage controlled oscillator

    Abstract: MAX5436 MAX8595 DS1669 DS4303 DS4305 DS4422 MAX1452 MAX532 MAX6008
    Text: Maxim > Design Support > App Notes > A/D and D/A Conversion/Sampling Circuits > APP 5036 Maxim > Design Support > App Notes > Digital Potentiometers > APP 5036 Maxim > Design Support > App Notes > Sensors > APP 5036 Keywords: digital calibration, replacing potentiometers, automated testing, increased reliability, reduced test time, reduced test cost,


    Original     		PDF com/an5036 AN5036, APP5036, Appnote5036, free circuit diagram for voltage controlled oscillator MAX5436 MAX8595 DS1669 DS4303 DS4305 DS4422 MAX1452 MAX532 MAX6008

    transorb motorola

    Abstract: temperature gague TP10 TPS2590
    Text: Using the TPS2590EVM User's Guide Literature Number: SLUU373 July 2009 User's Guide SLUU373 – July 2009 TPS2590 Hot Swap Controller System Test Board This User’s Guide describes the setup and operation of the TPS2590 System Test Board. 1 Introduction This User’s Guide describes the features of the TPS2590EVM. The TPS2590 schematic, layout and List


    Original     		PDF TPS2590EVM SLUU373 TPS2590 TPS2590EVM. TPS2590/91 transorb motorola temperature gague TP10

    zener 8m

    Abstract: FMMZ5232 8Y SOT23 FMMZ5233 FMMZ5234 FMMZ5235 FMMZ5236 FMMZ5237 FMMZ5238 FMMZ5239
    Text: FMMZ5232 to FMMZ5257 ISSUE 2 - SEPTEMBER 1995 ELECTRICAL CHARACTERISTICS at Tamb = 25°C . Type No FMMZ5232 to FMMZ5257 SOT23 SILICON VOLTAGE REGULATOR DIODES ✪ PIN CONFIGURATION Test Max. Zener Max. Reverse Leakage Current Max. Zener Nominal Current Impedance


    Original     		PDF FMMZ5232 FMMZ5257 FMMZ5233 FMMZ5234 FMMZ5235 FMMZ5236 FMMZ5254 zener 8m FMMZ5232 8Y SOT23 FMMZ5233 FMMZ5234 FMMZ5235 FMMZ5236 FMMZ5237 FMMZ5238 FMMZ5239

    ATML

    Abstract: ATML U 0420g MIC5205M5 ATML H Unisem 0116E ATML 28 SPN860003 MIC2211
    Text: High Temp Bias Moisture Life Test TA = 85C / 85%RH at rated voltage or Highly Accelerated Stress Test HAST +131C / 85%RH MSL Pkg Lds Device D/C Process L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 L2 6 6 6 10 10 10 10


    Original     		PDF 0144B 0207B 0217B 0219B 0245B 0252C 0307E 0321D 0321E SY88923KC ATML ATML U 0420g MIC5205M5 ATML H Unisem 0116E ATML 28 SPN860003 MIC2211

    Untitled

    Abstract: No abstract text available
    Text: PJESD5V6LC-4~PJESD6V8LC-4 Unit：inch mm SOT23-5L FEATURES • Based on the electrostatic discharge immunity test (IEC61000-4-2), the product assures the minmum endurance of 8kV. • Capacitance is small with 10pF (at V R =0V,f=1MHz) between the 0.119(3.00)


    Original     		PDF OT23-5L IEC61000-4-2) 2002/95/EC IEC61249 OT-23

    EPA018A-SOT23

    Abstract: No abstract text available
    Text: Excelics EPA018A-SOT23 PRELIMINARY DATA SHEET DC-6GHz High Efficiency Heterojunction Power FET • • • 110-120 15-20 27 SOURCE 2-4 DRAIN GATE 38 37-47 75.5 Top View All Dimensions In Mils ELECTRICAL CHARACTERISTICS (Ta = 25 OC) SYMBOLS PARAMETERS/TEST CONDITIONS


    Original     		PDF EPA018A-SOT23 EPA018A-SOT23

    marking code R300 SOT 23

    Abstract: No abstract text available
    Text: PJESD5V6LC-4~PJESD6V8LC-4 SOT23-5L FEATURES Unit：inch mm • Based on the electrostatic discharge immunity test (IEC61000-4-2), the product assures the minmum endurance of 8kV. • Capacitance is small with 10pF (at V R =0V,f=1MHz) between the 0.119(3.00)


    Original     		PDF IEC61000-4-2) 2002/95/EC IEC61249 OT23-5L OT23-5L, MIL-STD-750, marking code R300 SOT 23

    Untitled

    Abstract: No abstract text available
    Text: PJESD5V6LC-4~PJESD6V8LC-4 SOT23-5L FEATURES Unit：inch mm • Based on the electrostatic discharge immunity test (IEC61000-4-2), the product assures the minmum endurance of 8kV. • Capacitance is small with 10pF (at V R =0V,f=1MHz) between the 0.119(3.00)


    Original     		PDF OT23-5L IEC61000-4-2) 2011/65/EU IEC61249

    Untitled

    Abstract: No abstract text available
    Text: FMMT2369 FMMT2369A t0 N CIRCUIT 270Q 3V i 3K3Í2 < Pulse width t1 =300ns Duty cycle = 2% t0 FF CIRCUIT Duty cycle = 2% STORAGE TEST CIRCUIT Duty cycle = 2% * Total shunt capacitance of test jig and connectors 3-69 Cg<4pF4 FMMT2369 | FMMT2369A SOT23 NPN SILICON PLANAR


    OCR Scan     		PDF FMMT2369 FMMT2369A 300ns FMMT2369R FMMTA2369A FMMTA2369AR FMMT2369 10iiA,

    RF power transistors cross reference

    Abstract: transistors cross reference list HF RF Power Transistors cross reference rf transistors cross reference
    Text: Philips Semiconductors RF Wideband Transistors Generai section QUALITY • Acceptance tests on finished products to verify conformance with the device specification. The test results are used for quality feedback and corrective actions. The inspection and test requirements are


    OCR Scan     		PDF MEA471 OT323 OT143 OT143R OT143, OT143R OT223 RF power transistors cross reference transistors cross reference list HF RF Power Transistors cross reference rf transistors cross reference

    Untitled

    Abstract: No abstract text available
    Text: Philips Sem iconductors Small-signal Transistors General • Acceptance tests on finished products to verify conform ance with the device specification. The test results are used for quality feedback and corrective actions. The inspection and test requirem ents are


    OCR Scan     		PDF

    JJ SOT23

    Abstract: 0A81 IR100
    Text: BAS19 BAS20 BAS21 SWITCHING TIME TEST DATA Recovery Time Equivalent Test Circuit Pulse Generator DUT Sampling Oscilloscope Rin =50n RS =50fi +|F trr t Input Signal Output Signal Input Signal Reverse Pulse Duration tp 100ns Rise Tim e tr 0.35ns C ircuit Capacitance*


    OCR Scan     		PDF BAS19 BAS20 BAS21 100ns 100mA JJ SOT23 0A81 IR100

    Rectifiers

    Abstract: cross reference zener diodes
    Text: SURGI TABLE OF CONTENTS PAGE NO ALPHANUMERIC HIGH RELIABILITY TEST CONDITIONS. 3


    OCR Scan     		PDF

    reflow profile 00802

    Abstract: sod323 reflow sod323 wave soldering
    Text: SIEM EN S Notes on Processing Table 1 Solderability Test to Siemens Standard Test criterion Solder bath temperature °C Dwell time in bath s Components for wave and reflow soldering Wetting 215 ± 3 3 ±0.3 Dewetting and leaching 260 ± 5 30 ±1 Components for reflow soldering only


    OCR Scan     		PDF OT-89 OT-143 HLG05515 OT-223 reflow profile 00802 sod323 reflow sod323 wave soldering