Untitled
Abstract: No abstract text available
Text: Auto Grip Pull Tester PT-1500 Auto Grip Pull Tester Operation Manual Order No. 63801-9100 Description Operation Maintenance Doc No: TM-638019100 Revision: C Release Date: 08-10-09 Revision Date: 07-27-12 UNCONTROLLED COPY Page 1 of 17 Auto Grip Pull Tester
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PT-1500
TM-638019100
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Untitled
Abstract: No abstract text available
Text: 3 740 Wrist strap + shoe tester MO 0765-0601 April, 2001 Operating Instructions 740 wrist strap + shoe tester < 1 MO 0765-0601 o.k. 3 > 2 1 / 11 740 wrist strap + shoe tester LED for «too low resistance» < LED for «too high resistance» > o.k. 1 3 2 Contact plate
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Untitled
Abstract: No abstract text available
Text: Weller WTT5 Torque Tester Product Details Catalog No. T0058767706 UPC Code 4003019422975 Fits Tool s WBTS12*, WBTS35* Description Torque Tester to 5 Nm Packaging Industrial Box/Carton Tech. Spec. Solder_Safety_Warnings.pdf Low Res. T0058767706_100.jpg Image
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T0058767706
WBTS12*
WBTS35*
T0058767706
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Untitled
Abstract: No abstract text available
Text: Portable Three-Phase Meter Tester/Analyzer WE-20 333 Crosspark Drive • Pearl, Mississippi 39208 USA • P: 601.933.0900 • F: 601.933.0901 E: sales@watthour.com • www.watthour.com Portable Three-Phase Meter Tester/Analyzer WE-20 WECO’s next generation Portable
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WE-20
RD-30
WE-20
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N9360A
Abstract: 1784 antenna CDMA GPRS DCS1800 GSM900 PCS1900 rs232 TRANSMITTER GMSK mobile phone repair hardware u1004 epson b 8100
Text: Agilent N9360A Mobile Station Tester Technical Overview Go/No go multi-format cellular device tester for mobile station service and repair with built-in PC When your cellular phone repair, manufacturing, or R&D testing needs require cost-effective mobile device parametric and call
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N9360A
N9360A
manufactu71571
cdma2000
5989-9559EN
1784
antenna CDMA GPRS
DCS1800
GSM900
PCS1900
rs232 TRANSMITTER GMSK
mobile phone repair hardware
u1004
epson b 8100
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Racal Instruments 6103
Abstract: IT 502 for radio remote control gsm based digital notice board using LCD monitor dell GCF-CC EN61010-1 EN61326-1 IEC60068 PC333 TS51
Text: Conformance Test 6103 AMR AIME - AMR Layer 1 & Protocol Analysis 6103 AIME AMR/CT - AMR Conformance Test Solution • Protocol analyzer, Layer 1 tester and conformance tester for GSM AMR terminals • Modular and expandable from R&D use to full Conformance Test System
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HHCD
Abstract: No abstract text available
Text: HHCD Conductivity / Total Dissolved Solids Pocket Tester Operator’s Manual Newport Electronics, Inc. GENERAL DESCRIPTION The HHCD Conductivity/Total Dissolved Solids Tester is an economical, portable handheld unit, ideal for quick field checks of water-based solutions. It features large display .5”12.7mm , for easy reading, automatic temperature
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M2402/N/0396
HHCD
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Sensor Tester
Abstract: ST-03 sensor tester namur pnp sensor ST-03 4 wire diagram
Text: Accessories Sensor Tester Type ST-03 • • • • Product Description The fastest way to verify the main function on your sensor. The tester can be used for: Namur EN 50 227 , 2wire DC, 3-wire DC and 4wire DC. Connect your sensor to the terminals on the
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ST-03
100mA
Sensor Tester
ST-03 sensor tester
namur
pnp sensor
ST-03
4 wire diagram
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Aeroflex SDX 2000
Abstract: diode KIV 63 SDX2000 mode 5 IFF sdx 2000 SDX2000-220 mode s transponders AC15527107 DME 2000 SDXOPT02
Text: Avionics SDX 2000 Transponder/Interrogator/DME Test Set ATC, DME, Mode S, Data Link, IFF and TACAN capability in a single tester Designed in cooperation with the world's leading DME Transponder and IFF manufacturers, the SDX 2000 is the first new technology, fully programmable RF tester that provides complete test
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lfsr galois
Abstract: free verilog code of prbs pattern generator lfsr fibonacci XAPP661 prbs pattern generator using analog verilog generating pwm verilog code PPC405 XAPP662 prbs using lfsr 8 bit LFSR for test pattern generation
Text: Application Note: Virtex-II Pro Family R XAPP661 v2.0 June 25, 2003 RocketIO Transceiver Bit-Error Rate Tester Author: Dai Huang and Michael Matera Summary This application note describes the implementation of a RocketIO transceiver bit-error rate tester (BERT) reference design demonstrating a serial link (1.0 Gb/s to 3.125 Gb/s) between
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XAPP661
PowerPCTM405
PPC405)
XAPP661
an2002.
lfsr galois
free verilog code of prbs pattern generator
lfsr fibonacci
prbs pattern generator using analog verilog
generating pwm verilog code
PPC405
XAPP662
prbs using lfsr
8 bit LFSR for test pattern generation
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symbol for rj45
Abstract: sub-d9 sub-d9 F SUB D9
Text: Verbindungstester UCT J Connection tester UCT 7 Verbindungstester UCT Connection tester UCT D er V erbindungstester UCT erm ö glicht eine schnelle und einfache Ü b erprüfung von V or-O rt-M o ntagen in lokalen N etzw erken. In nur 2 Sekunden analysiert der U CT vollautom atisch eine Kabelstrecke a uf U nterbrechungen,
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OCR Scan
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D-71144
symbol for rj45
sub-d9
sub-d9 F
SUB D9
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CD 4501
Abstract: CHINA MOBILE china tv mobile transistor cd 4400 DOWN-CONVERTER
Text: 1209 Downconverter Highlights • Supports the 4400 Mobile Phone Tester Series • Basic tests at WLAN, GPS, Bluetooth and Mobile TV frequencies The 1209 Downconverter can be used under remote control from an external computer or from a RAPID! test script on the
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TB-4009
Abstract: BATTERY TESTER
Text: TECHNICAL BULLETIN TB-4009 Low Resistance Tester Operation and Maintenance Made in America Battery Replacement Batteries are easily replaced by removing the rear cover where the wire lead exits . Remove the 2 screws and simply slide the circuit board assembly out. Remove the old batteries
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TB-4009
TB-4009
BATTERY TESTER
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6103G-93
Abstract: No abstract text available
Text: Protocol Test Instruments Wireless Solutions 6401 AIME/CT ISHO GSM/GPRS-UMTS Handover Conformance/Protocol Analysis Test Solution The 6401 AIME/CT is a 3GPP TS 34.123 and TS 51.010 UMTS Compliant mobile protocol analyzer and conformance tester. Features include:
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FLUKE 79 manual
Abstract: FLUKE 910r e122x Fluke 79 E4438C E4419B E8247C Fluke 77 user manual E441
Text: MINT RF Tester • Modular test platform covering 2G, 2.5G and 3G standards • RF calibration routines and automated signal switching ensure high accuracy and repeatability • Automated execution of test cases • Development mode allows execution of customized tests
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1736AB
Abstract: 1736a N5541 N5541A 8gig 1733a A/1736AB E7900-64207 N5543B N5540
Text: 1736A 1, 2, 4 and 8G Fibre Channel Dual Purpose Module SAN Tester and Protocol Analyzer Data Sheet • Simplify Test Environment: Traffic Generation, Performance Test and Protocol Analysis all in one hardware. • Time to Market: Accelerate your development
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5989-6903EN
1736AB
1736a
N5541
N5541A
8gig
1733a
A/1736AB
E7900-64207
N5543B
N5540
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SMPTE 296M timing 720p30
Abstract: stanag 4444 DMT0660 DMT1260G smpte 296m timing 750 pr 8501 b CVT1960D-R 720p25 SMPTE 296M stanag
Text: Agilent U8101A Display Tester Customizable and Fewer Steps to Test Data Sheet Features Customizable cards to suit testing needs Batch testing of up to five displays simultaneously Thumbnail view of test patterns on large color LCD display Intuitive GUI and hotkeys for quicker
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U8101A
5989-9117EN
SMPTE 296M timing 720p30
stanag 4444
DMT0660
DMT1260G
smpte 296m timing 750
pr 8501 b
CVT1960D-R
720p25
SMPTE 296M
stanag
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soic 208 mil
Abstract: SOIC EEPROM DS2433 DS2433S-Z01 DS2433T-Z01 DS2433X-Z01 DS2433Y-Z01 DS2433-Z01
Text: PRELIMINARY DS2433-Z01 4K-Bit 1-WireTM EEPROM www.dalsemi.com FEATURES PIN ASSIGNMENT 4096 bits Electrically Erasable Programmable Read Only Memory EEPROM Unique, factory-lasered and tested 64-bit registration number (8-bit family code + 48bit serial number + 8-bit CRC tester) assures
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DS2433-Z01
64-bit
48bit
256-bit
256-bit
DS2433X-Z01
DS2433
soic 208 mil
SOIC EEPROM
DS2433S-Z01
DS2433T-Z01
DS2433Y-Z01
DS2433-Z01
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Agilent 3070 Tester
Abstract: Agilent 3070 Manual svf2pcf "1511 max" AGILENT 3070
Text: Chapter 15. Using the Agilent 3070 Tester for In-System Programming MII51016-1.3 Introduction In-system programming is a mainstream feature in programmable logic devices PLDs , offering system designers and test engineers significant cost benefits by integrating PLD programming into board-level testing.
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MII51016-1
Agilent 3070 Tester
Agilent 3070 Manual
svf2pcf
"1511 max"
AGILENT 3070
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mobile phone repair
Abstract: mobile phone circuit diagram cdma QPSK modulation Walsh pilot NMT-450 Sim AG 860 164 aeroflex 4400 television service mode manual GSM transmitter receiver china mobile phone circuit diagram 4 channel long range RF based remote control pn sequence generator
Text: 4400 Mobile Phone Tester Series Highlights • All major mobile communication standards Unless indicated otherwise, all information in this data sheet relates to both the 4403 and the 4405 Mobile Phone Testers. • Remote control through GPIB, LAN, USB Improving Manufacturing Throughput
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Application Note ds2433
Abstract: DS2433 RX-2 -G s CRC16 DS2433S DS2433T DS2433X DS2433Y
Text: PRELIMINARY 4k-Bit 1-Wire TM DS2433 EEPROM www.dalsemi.com FEATURES § 4096 bits Electrically Erasable Programmable Read Only Memory EEPROM § Unique, factory-lasered and tested 64-bit registration number (8-bit family code + 48bit serial number + 8-bit CRC tester) assures
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DS2433
64-bit
48bit
256-bit
DS2433
Application Note ds2433
RX-2 -G s
CRC16
DS2433S
DS2433T
DS2433X
DS2433Y
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cpu aeroflex
Abstract: Racal Instruments 6103 CD 4501 EN61010-1 EN61326-1 AC6401
Text: Protocol Test Racal Instruments Wireless Solutions 6401 AIME/CT UMTS Conformance and Protocol Analysis Test Solution • 3GPP UMTS Compliant mobile protocol analyzer and conformance tester • ETSI sourced 3GPP test cases market, the design and development process is accelerated if the
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mobile phone repair
Abstract: GSM home automation source code mobile phone repair circuit 3g call flow GSM based home automation HOME AUTOMATION USING GSM 3.5G HSDPA 3110 GSM ul 1980 mobile phone accessories reference
Text: 3110 Mobile Service Tester Highlights • Enables accurate and no-fault identification of GSM/GPRS, EDGE, WCDMA and HSDPA mobile devices • Separates faulty and no-fault-found NFF mobile phones to maximize revenues • Provides intuitive operation through a Windows based
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DS2172
Abstract: pattern generator
Text: Application Note 331 DS2172 Bit Error Rate Tester, V.54 Modem Test Patterns The DS2172 can be used to generate and detect the PREPARATORY, ACKNOWLEDGE, and TERMINATION patterns for V.54 modem testing. Figure 1 shows the pattern generator depicted in V.54.
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DS2172
DS2172.
DS2172
pattern generator
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