Please enter a valid full or partial manufacturer part number with a minimum of 3 letters or numbers

    TESTING Search Results

    TESTING Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    FO-62.5LPBMT0-001 Amphenol Cables on Demand Amphenol FO-62.5LPBMT0-001 MT-RJ Connector Loopback Cable: Multimode 62.5/125 Fiber Optic Port Testing .1m Datasheet
    FO-9LPBMTRJ00-001 Amphenol Cables on Demand Amphenol FO-9LPBMTRJ00-001 MT-RJ Connector Loopback Cable: Single-Mode 9/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFP28LPB1W-3DB Amphenol Cables on Demand Amphenol SF-SFP28LPB1W-3DB SFP28 Loopback Adapter Module for SFP28 Port Compliance Testing - 3dB Attenuation & 1W Power Consumption Datasheet
    FO-50LPBMTRJ0-001 Amphenol Cables on Demand Amphenol FO-50LPBMTRJ0-001 MT-RJ Connector Loopback Cable: Multimode 50/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFPPLOOPBK-003.5 Amphenol Cables on Demand Amphenol SF-SFPPLOOPBK-003.5 SFP+ Loopback Adapter Module for SFP+ Port Compliance Testing - 3.5dB Copper/Optical Cable Emulation Datasheet
    SF Impression Pixel

    TESTING Price and Stock

    Honeywell Sensing and Control GROUP-B-TESTING

    GROUP B TESTING ES1177
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey GROUP-B-TESTING Bulk 10
    • 1 -
    • 10 $14164.824
    • 100 $14164.824
    • 1000 $14164.824
    • 10000 $14164.824
    		Buy Now
    Onlinecomponents.com GROUP-B-TESTING
    • 1 -
    • 10 $14026.13
    • 100 $14026.13
    • 1000 $14026.13
    • 10000 $14026.13
    		Buy Now
    Master Electronics GROUP-B-TESTING
    • 1 -
    • 10 $14026.13
    • 100 $14026.13
    • 1000 $14026.13
    • 10000 $14026.13
    		Buy Now

    Microchip Technology Inc JANSR2N2222AUB/HRDS-XRAY_TESTING

    JANSR2N2222AUB/HRDS-XRAY_TESTING - Virtual or Non-Physical Inventory (Software & Literature) (Alt: HRDS-XRAY_TESTING)
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    Avnet Americas JANSR2N2222AUB/HRDS-XRAY_TESTING No Container 1 1
    • 1 -
    • 10 -
    • 100 -
    • 1000 -
    • 10000 -
    		Get Quote
    JANSR2N2222AUB/HRDS-XRAY_TESTING No Container 40 Weeks, 6 Days 1
    • 1 -
    • 10 -
    • 100 -
    • 1000 -
    • 10000 -
    		Get Quote

    Tri-Star Electronics International U LEVEL TESTING

    U LEVEL TESTING - Virtual or Non-Physical Inventory (Software & Literature) (Alt: U LEVEL TESTING)
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    Avnet Americas U LEVEL TESTING No Container 14 Weeks 1
    • 1 -
    • 10 -
    • 100 -
    • 1000 -
    • 10000 -
    		Get Quote

    Tri-Star Electronics International 2A016-006V-001 TESTING

    2A016-006V-001 TESTING - Virtual or Non-Physical Inventory (Software & Literature) (Alt: 2A016-006V-001 TES)
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    Avnet Americas 2A016-006V-001 TESTING No Container 14 Weeks 1
    • 1 -
    • 10 -
    • 100 -
    • 1000 -
    • 10000 -
    		Get Quote

    Amphenol Corporation GROUP A TESTING

    GROUP A TESTING - Bulk (Alt: GROUP A TESTING)
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    Avnet Americas GROUP A TESTING Bulk 16 Weeks 1
    • 1 -
    • 10 -
    • 100 -
    • 1000 -
    • 10000 -
    		Get Quote
    GROUP A TESTING Bulk 1
    • 1 -
    • 10 -
    • 100 -
    • 1000 -
    • 10000 -
    		Get Quote
    GROUP A TESTING Bulk 1
    • 1 -
    • 10 -
    • 100 -
    • 1000 -
    • 10000 -
    		Get Quote
    Find more TESTING price and stock on Findchips.com

    TESTING Datasheets (1)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    Testing and specifying FAST logic NXP Semiconductors AN202 - Testing and specifying FAST logic Original PDF

    TESTING Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    Upscreening

    Abstract: ACT-5271SC-F10-M21C AMPF-128MDA coil gold detector military mcm cpu
    Text: Custom Hybrid, MCM, Module, Box Assembly and Testing Services Fact Sheet June 2012 www.aeroflex.com/EMS INTRODUCTION PRODUCTION CAPABILITIES Aeroflex Plainview, a supplier of standard products and custom microelectronic solutions offers Space and Military


    Original     		PDF MIL-PRF-38534 Upscreening ACT-5271SC-F10-M21C AMPF-128MDA coil gold detector military mcm cpu

    Untitled

    Abstract: No abstract text available
    Text: Package Reliability www.vishay.com Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR TSOP-6 STRESS SAMPLE SIZE DEVICE HR./CYC CONDITION TOTAL FAILS BOND INT 1040 520 000 200 C + N2 FAIL PERCENTAGE 0.00 HAST 4045 408 010 130 C, 85 % RH 0.00


    Original     		PDF M2003 08-May-12

    Untitled

    Abstract: No abstract text available
    Text: Package Reliability www.vishay.com Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR MICRO FOOT STRESS SAMPLE SIZE DEVICE HR./CYC CONDITION TOTAL FAILS HAST 2805 280 500 130 °C, 85 % RH 0.00 Pressure Pot 1900 182 400 121°, 15 PSIG 0.00 Temp. Cycle


    Original     		PDF 08-May-12

    Untitled

    Abstract: No abstract text available
    Text: Package Reliability www.vishay.com Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR DPAK, TO-252, TO-251 STRESS SAMPLE SIZE DEVICE HR./CYC CONDITION TOTAL FAILS BOND INT 40 20 000 200 C + N2 FAIL PERCENTAGE 0.00 HAST 1691 169 100 130 C, 85 % RH


    Original     		PDF O-252, O-251 M2003 08-May-12

    Untitled

    Abstract: No abstract text available
    Text: Package Reliability www.vishay.com Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR SC-89 STRESS SAMPLE SIZE DEVICE HR./CYC CONDITION TOTAL FAILS BOND INT 160 80 000 200 C + N2 FAIL PERCENTAGE 0.00 HAST 1705 180 500 130 C, 85 % RH 0.00 0.00


    Original     		PDF SC-89 M2003 08-May-12

    AQV25P

    Abstract: AQV257 AQV252A AQV255A AQV257A AQV253A aqv252ax
    Text: HE 1 Form A AQV25P (Standard type) DIP6-pin type with low on-resistance and high cost-performance TESTING (Reinforced type) HE 1 Form A (AQV25P) AQV25P 6.4 .252 8.8 .346 3.9 .154 6.4 .252 8.8 .346 3.6 .142 Height includes standoff FEATURES TYPICAL APPLICATIONS


    Original     		PDF AQV25P) AQV25P AQV251) AQV251, AQV252 AQV253 AQV254 AQV259; AQV253H AQV25P AQV257 AQV252A AQV255A AQV257A AQV253A aqv252ax

    *216EH

    Abstract: AQW212EH
    Text: GU-E 2 Form A AQW21PEH TESTING High cost-performance DIP8-pin type with reinforced insulation GU-E 2 Form A (AQW21PEH) AQW21PEH 6.4 .252 9.86 .388 3.2 .126 6.4 .252 9.86 .388 2.9 .114 CAD Data mm inch 1 8 2 7 3 6 4 5 FEATURES TYPICAL APPLICATIONS 1. Reinforced insulation of 5,000 V


    Original     		PDF AQW21PEH) AQW21PEH EN41003, EN60950 AQW210EH AQW214EH AQW216EH AQW212EH aqw21eh: *216EH AQW212EH

    Untitled

    Abstract: No abstract text available
    Text: Product Number: 19276 TESTER, X3 COMBO, WITH DUAL PLATE Features & Benefits: • • • • • • • • Simultaneous Testing Of Wrist Strap* And Foot Wear In Up To 3 Seconds Reduces time spent testing personal grounding devices* used in ESD Control Plans


    Original     		PDF

    Multimeter fluke 114

    Abstract: N10140 4000 Counts Digital Multimeter
    Text: Fluke 114 Electrical Multimeter Technical Data Compact true-rms meter for electrical troubleshooting The Fluke 114 is the troubleshooting tool for “go/no-go” testing. It includes a feature to prevent false readings caused by ghost voltage. Features include:


    Original     		PDF Fluke-114 -36-FLUKE Multimeter fluke 114 N10140 4000 Counts Digital Multimeter

    AQY412

    Abstract: led cross reference AQY410
    Text: GU SOP 1 Form B AQY41S TESTING VDE (AQY410S, 414S) (AQY412S) Normally closed SOP4-pin type of 60V/350V/400V load voltage GU SOP 1 Form B (AQY41S) AQY41S FEATURES 4.3 .169 4.4 .173 2.1 .083 CAD Data mm inch 1 4 2 3 1. Small SOP4-pin package The device comes in a super-miniature


    Original     		PDF AQY41S) AQY410S, AQY412S) 0V/350V/400V AQY41S AQY410S AQY414S AQY412S AQY412 led cross reference AQY410

    Untitled

    Abstract: No abstract text available
    Text: 6235 POWER INDUCTORS High-Reliability Power Inductors ML512PJB • High temperature materials allow operation in ambient temperatures up to 155°C. ■ Special construction allows it to pass vibration testing to 80 G and shock testing to 1000 G. Core material Ferrite


    Original     		PDF ML512PJB ML587-1â

    Untitled

    Abstract: No abstract text available
    Text: 6020 POWER INDUCTORS High Reliability Power Inductors MS483PYA • High temperature materials allow operation in ambient temperatures up to 155°C ■ Passes vibration testing to 80 G and shock testing to 1000 G ■ Exceptionally low DCR – 1.6 mOhm ■ Soft saturation makes them ideal for VRM/VRD applications.


    Original     		PDF MS483PYA MS801-3â

    Untitled

    Abstract: No abstract text available
    Text: 4040 POWER INDUCTORS OutgassingCompliantPowerInductors AE465PYA • Exceptionally low DCR; soft saturation ■ Passes NASA low outgassing specifications ■ High temperature materials allow operation in ambient temperatures up to 155°C. ■ Passes vibration testing to 80 G and shock testing to 1000 G


    Original     		PDF AE465PYA AE803-3â

    Untitled

    Abstract: No abstract text available
    Text: 7070 POWER INDUCTORS High-Reliability Power Inductors ML541PYA • High temperature materials allow operation in ambient temperatures up to 155°C ■ Passes vibration testing to 80 G and shock testing to 1000 G ■ High current and very low DCR ■ Soft saturation makes them ideal for VRM/VRD applications.


    Original     		PDF ML541PYA ML856-4â

    how to make an ide to usb adapter

    Abstract: 4313-DAPB how to make an ide to usb adapter ec3 Si4010C2 4010-DKPB434-BM si4010 Silabs DKEB bUTTON PCB 4pin Keil uVision 4 user manual
    Text: Si4010-Key Fob-DK Si4010 K EY F O B D EVELOPMENT K IT U SER ’ S G UIDE 1. Key Fob Development Platform The Si4010 key fob development platform is a flexible platform for comfortably developing software and testing the whole system using the Silicon Laboratories software development IDE. The platform also allows programming of


    Original     		PDF Si4010-Key Si4010 4010-DKKF Si4010-C2-GS 4010-DKPB434-BM CRD2032 how to make an ide to usb adapter 4313-DAPB how to make an ide to usb adapter ec3 Si4010C2 Silabs DKEB bUTTON PCB 4pin Keil uVision 4 user manual

    474 3.5v

    Abstract: c2012 0805 cc0402 x7r CGA Series 475 16V 104 630v 2r2 101 tdk CGA4 TDK X7R 630V CGA3
    Text: CGA SERIES | Automotive Grade TDK CGA series multilayer ceramic chip capacitors MLCCs are qualified to automotive industry’s Q200 testing standard. CGA parts are manufactured using TDK’s most advanced and stable manufacturing process. Parts are subjected to increased inspections to offer a


    Original     		PDF C2012/CC0805 474 3.5v c2012 0805 cc0402 x7r CGA Series 475 16V 104 630v 2r2 101 tdk CGA4 TDK X7R 630V CGA3

    loudness control

    Abstract: j-900
    Text: TAS5508B 8-Channel Digital Audio PWM Processor Data Manual PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.


    Original     		PDF TAS5508B SLES162C TAS5508B SLES162C loudness control j-900

    AQV21EH

    Abstract: AQV210E AQV214
    Text: GU-E 1 Form A AQV210E, AQV21EH (Standard type) High cost-performance DIP6-pin type, reinforced insulation available TESTING (Reinforced type) GU-E 1 Form A (AQV21E, AQV21EH) AQV21E, 6.4 .252 8.8 .346 3.9 .154 6.4 .252 8.8 .346 3.6 .142 CAD Data


    Original     		PDF AQV210E, AQV21EH) AQV21E, AQV214E AQV210E AQV210EH, AQV214EH aqv21e: AQV21EH AQV210E AQV214

    MIKRO

    Abstract: No abstract text available
    Text: All Mikroelektronika’s development systems feature a large number of peripheral modules expanding microcontroller’s range of application and making the process of program testing easier. In addition to these modules, it is also possible to use numerous additional modules linked to the development system


    Original     		PDF 932-MIKROE-605 MIKROE-605 MIKRO

    MS16106-1

    Abstract: 9AC12-3 2AC59 MS16106-2 9AC4 MS16106-5 MS-16106-1 23ac1 ms16106 MS16106-3
    Text: Basic Switches Door Style 1 Style 2 AC Series FEATURES ɀ Automatically cut power when service door or drawer is opened, helping protect personnel and equipment. ɀ Enables circuit testing with power On by manually pulling rod actuator to maintained-On position. Closing door


    Original     		PDF UL1054 MS16106-3) 22AC1 22AC2 23AC1 23AC2 24AC1 24AC2 4AC54* MS16106-2) MS16106-1 9AC12-3 2AC59 MS16106-2 9AC4 MS16106-5 MS-16106-1 ms16106 MS16106-3

    AGN20

    Abstract: AGN20024 938M AGN2004H
    Text: GN AGN TESTING High sensitivity of nominal operating power 100mW is achieved. Compact slim body saves space. GN RELAYS (AGN) FEATURES 1. Compact slim body saves space. Thanks to the small surface area of 5.7 mm  10.6 mm .224 inch  .417 inch and low height of 9.0 mm .354 inch,


    Original     		PDF 100mW 500gf} 010811J AGN20 AGN20024 938M AGN2004H

    pogo pins

    Abstract: No abstract text available
    Text: CRYSTAL OSCILLATOR TEST & BURN IN SOCKET AXS-7050-06-13 Precision test socket for 7x5mm, Pb RoHS 6 pad crystal oscillator packages. Compliant FEATURES: | | | | | | | | | | | | | | | APPLICATIONS: APPLICATIONS: APPLICATIONS: • Accurate and reliable testing of frequency control devices


    Original     		PDF AXS-7050-06-13 815-AXS-7050-06-13 pogo pins

    Untitled

    Abstract: No abstract text available
    Text: Coaxial Amplifier 50Ω High Isolation ZFL-2HAD 50 to 1000 MHz Features • wideband, 50 to 1000 MHz • active directivity isolation-gain , 30 dB typ. at 50-500 MHz Applications CASE STYLE: SS98 • VHF/UHF • cellular • receivers • two-tone, 3rd order IM testing


    Original     		PDF

    Untitled

    Abstract: No abstract text available
    Text: Coaxial Amplifier 50Ω High Isolation ZFL-1HAD 10 to 500 MHz Features • wideband, 10 to 500 MHz • active directivity isolation-gain , 30 dB typ. Applications • VHF/UHF • laboratory use • receivers • two-tone, 3rd order IM testing CASE STYLE: SS98


    Original     		PDF