TESTING Search Results

TESTING Result Highlights (5)

Part	Manufacturer	Description	Download
FO-62.5LPBMT0-001	Amphenol Cables on Demand	Amphenol FO-62.5LPBMT0-001 MT-RJ Connector Loopback Cable: Multimode 62.5/125 Fiber Optic Port Testing .1m	Datasheet
FO-9LPBMTRJ00-001	Amphenol Cables on Demand	Amphenol FO-9LPBMTRJ00-001 MT-RJ Connector Loopback Cable: Single-Mode 9/125 Fiber Optic Port Testing .1m	Datasheet
SF-SFP28LPB1W-3DB	Amphenol Cables on Demand	Amphenol SF-SFP28LPB1W-3DB SFP28 Loopback Adapter Module for SFP28 Port Compliance Testing - 3dB Attenuation & 1W Power Consumption	Datasheet
FO-50LPBMTRJ0-001	Amphenol Cables on Demand	Amphenol FO-50LPBMTRJ0-001 MT-RJ Connector Loopback Cable: Multimode 50/125 Fiber Optic Port Testing .1m	Datasheet
SF-SFPPLOOPBK-003.5	Amphenol Cables on Demand	Amphenol SF-SFPPLOOPBK-003.5 SFP+ Loopback Adapter Module for SFP+ Port Compliance Testing - 3.5dB Copper/Optical Cable Emulation	Datasheet

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Honeywell Sensing and Control GROUP-B-TESTING GROUP B TESTING ES1177
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
DigiKey	GROUP-B-TESTING	Bulk			10	1 - 10 $14164.824 100 $14164.824 1000 $14164.824 10000 $14164.824	Buy Now
Onlinecomponents.com	GROUP-B-TESTING					1 - 10 $14026.13 100 $14026.13 1000 $14026.13 10000 $14026.13	Buy Now
Master Electronics	GROUP-B-TESTING					1 - 10 $14026.13 100 $14026.13 1000 $14026.13 10000 $14026.13	Buy Now
Microchip Technology Inc JANSR2N2222AUB/HRDS-XRAY_TESTING JANSR2N2222AUB/HRDS-XRAY_TESTING - Virtual or Non-Physical Inventory (Software & Literature) (Alt: HRDS-XRAY_TESTING)
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Avnet Americas	JANSR2N2222AUB/HRDS-XRAY_TESTING	No Container	1		1	1 - 10 - 100 - 1000 - 10000 -	Get Quote
Infineon Technologies AG GROUP_C3_TESTING GROUP_C3_TESTING - Virtual or Non-Physical Inventory (Software & Literature) (Alt: GROUP_C3_TESTING)
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Avnet Americas	GROUP_C3_TESTING	No Container			1	1 - 10 - 100 - 1000 - 10000 -	Get Quote
Microchip Technology Inc GROUP C TESTING/MV1N5988D-1 Diode Zener Single 3.3V 1% 0.5W 2-Pin Axial - Bulk (Alt: GROUP C TESTING/MV1N5988D-1)
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
Avnet Americas	GROUP C TESTING/MV1N5988D-1	Bulk			1	1 - 10 - 100 - 1000 - 10000 -	Get Quote
Microchip Technology Inc GROUP B TESTING/MV1N5988D-1 Diode Zener Single 3.3V 1% 0.5W 2-Pin Axial - Virtual or Non-Physical Inventory (Software & Literature) (Alt: GROUP B TESTING/MV1N5988D-1)
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
Avnet Americas	GROUP B TESTING/MV1N5988D-1	No Container			1	1 - 10 - 100 - 1000 - 10000 -	Get Quote

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TESTING Datasheets (1)

Part	ECAD Model	Manufacturer	Description	Curated	Datasheet Type	PDF
Testing and specifying FAST logic		NXP Semiconductors	AN202 - Testing and specifying FAST logic		Original	PDF

TESTING Datasheets Context Search

Catalog Datasheet	MFG & Type	Document Tags	PDF
Upscreening Abstract: ACT-5271SC-F10-M21C AMPF-128MDA coil gold detector military mcm cpu Text: Custom Hybrid, MCM, Module, Box Assembly and Testing Services Fact Sheet June 2012 www.aeroflex.com/EMS INTRODUCTION PRODUCTION CAPABILITIES Aeroflex Plainview, a supplier of standard products and custom microelectronic solutions offers Space and Military	Original	MIL-PRF-38534 Upscreening ACT-5271SC-F10-M21C AMPF-128MDA coil gold detector military mcm cpu	PDF
Untitled Abstract: No abstract text available Text: Package Reliability www.vishay.com Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR TSOP-6 STRESS SAMPLE SIZE DEVICE HR./CYC CONDITION TOTAL FAILS BOND INT 1040 520 000 200 C + N2 FAIL PERCENTAGE 0.00 HAST 4045 408 010 130 C, 85 % RH 0.00	Original	M2003 08-May-12	PDF
Untitled Abstract: No abstract text available Text: Package Reliability www.vishay.com Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR MICRO FOOT STRESS SAMPLE SIZE DEVICE HR./CYC CONDITION TOTAL FAILS HAST 2805 280 500 130 °C, 85 % RH 0.00 Pressure Pot 1900 182 400 121°, 15 PSIG 0.00 Temp. Cycle	Original	08-May-12	PDF
Untitled Abstract: No abstract text available Text: Package Reliability www.vishay.com Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR DPAK, TO-252, TO-251 STRESS SAMPLE SIZE DEVICE HR./CYC CONDITION TOTAL FAILS BOND INT 40 20 000 200 C + N2 FAIL PERCENTAGE 0.00 HAST 1691 169 100 130 C, 85 % RH	Original	O-252, O-251 M2003 08-May-12	PDF
Untitled Abstract: No abstract text available Text: Package Reliability www.vishay.com Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR SC-89 STRESS SAMPLE SIZE DEVICE HR./CYC CONDITION TOTAL FAILS BOND INT 160 80 000 200 C + N2 FAIL PERCENTAGE 0.00 HAST 1705 180 500 130 C, 85 % RH 0.00 0.00	Original	SC-89 M2003 08-May-12	PDF
AQV25P Abstract: AQV257 AQV252A AQV255A AQV257A AQV253A aqv252ax Text: HE 1 Form A AQV25P (Standard type) DIP6-pin type with low on-resistance and high cost-performance TESTING (Reinforced type) HE 1 Form A (AQV25P) AQV25P 6.4 .252 8.8 .346 3.9 .154 6.4 .252 8.8 .346 3.6 .142 Height includes standoff FEATURES TYPICAL APPLICATIONS	Original	AQV25P) AQV25P AQV251) AQV251, AQV252 AQV253 AQV254 AQV259; AQV253H AQV25P AQV257 AQV252A AQV255A AQV257A AQV253A aqv252ax	PDF
*216EH Abstract: AQW212EH Text: GU-E 2 Form A AQW21PEH TESTING High cost-performance DIP8-pin type with reinforced insulation GU-E 2 Form A (AQW21PEH) AQW21PEH 6.4 .252 9.86 .388 3.2 .126 6.4 .252 9.86 .388 2.9 .114 CAD Data mm inch 1 8 2 7 3 6 4 5 FEATURES TYPICAL APPLICATIONS 1. Reinforced insulation of 5,000 V	Original	AQW21PEH) AQW21PEH EN41003, EN60950 AQW210EH AQW214EH AQW216EH AQW212EH aqw21eh: *216EH AQW212EH	PDF
Untitled Abstract: No abstract text available Text: Product Number: 19276 TESTER, X3 COMBO, WITH DUAL PLATE Features & Benefits: • • • • • • • • Simultaneous Testing Of Wrist Strap* And Foot Wear In Up To 3 Seconds Reduces time spent testing personal grounding devices* used in ESD Control Plans	Original		PDF
Multimeter fluke 114 Abstract: N10140 4000 Counts Digital Multimeter Text: Fluke 114 Electrical Multimeter Technical Data Compact true-rms meter for electrical troubleshooting The Fluke 114 is the troubleshooting tool for “go/no-go” testing. It includes a feature to prevent false readings caused by ghost voltage. Features include:	Original	Fluke-114 -36-FLUKE Multimeter fluke 114 N10140 4000 Counts Digital Multimeter	PDF
AQY412 Abstract: led cross reference AQY410 Text: GU SOP 1 Form B AQY41S TESTING VDE (AQY410S, 414S) (AQY412S) Normally closed SOP4-pin type of 60V/350V/400V load voltage GU SOP 1 Form B (AQY41S) AQY41S FEATURES 4.3 .169 4.4 .173 2.1 .083 CAD Data mm inch 1 4 2 3 1. Small SOP4-pin package The device comes in a super-miniature	Original	AQY41S) AQY410S, AQY412S) 0V/350V/400V AQY41S AQY410S AQY414S AQY412S AQY412 led cross reference AQY410	PDF
Untitled Abstract: No abstract text available Text: 6235 POWER INDUCTORS High-Reliability Power Inductors ML512PJB • High temperature materials allow operation in ambient temperatures up to 155°C. ■ Special construction allows it to pass vibration testing to 80 G and shock testing to 1000 G. Core material Ferrite	Original	ML512PJB ML587-1â	PDF
Untitled Abstract: No abstract text available Text: 6020 POWER INDUCTORS High Reliability Power Inductors MS483PYA • High temperature materials allow operation in ambient temperatures up to 155°C ■ Passes vibration testing to 80 G and shock testing to 1000 G ■ Exceptionally low DCR – 1.6 mOhm ■ Soft saturation makes them ideal for VRM/VRD applications.	Original	MS483PYA MS801-3â	PDF
Untitled Abstract: No abstract text available Text: 4040 POWER INDUCTORS OutgassingCompliantPowerInductors AE465PYA • Exceptionally low DCR; soft saturation ■ Passes NASA low outgassing specifications ■ High temperature materials allow operation in ambient temperatures up to 155°C. ■ Passes vibration testing to 80 G and shock testing to 1000 G	Original	AE465PYA AE803-3â	PDF
Untitled Abstract: No abstract text available Text: 7070 POWER INDUCTORS High-Reliability Power Inductors ML541PYA • High temperature materials allow operation in ambient temperatures up to 155°C ■ Passes vibration testing to 80 G and shock testing to 1000 G ■ High current and very low DCR ■ Soft saturation makes them ideal for VRM/VRD applications.	Original	ML541PYA ML856-4â	PDF

how to make an ide to usb adapter Abstract: 4313-DAPB how to make an ide to usb adapter ec3 Si4010C2 4010-DKPB434-BM si4010 Silabs DKEB bUTTON PCB 4pin Keil uVision 4 user manual Text: Si4010-Key Fob-DK Si4010 K EY F O B D EVELOPMENT K IT U SER ’ S G UIDE 1. Key Fob Development Platform The Si4010 key fob development platform is a flexible platform for comfortably developing software and testing the whole system using the Silicon Laboratories software development IDE. The platform also allows programming of	Original	Si4010-Key Si4010 4010-DKKF Si4010-C2-GS 4010-DKPB434-BM CRD2032 how to make an ide to usb adapter 4313-DAPB how to make an ide to usb adapter ec3 Si4010C2 Silabs DKEB bUTTON PCB 4pin Keil uVision 4 user manual	PDF
474 3.5v Abstract: c2012 0805 cc0402 x7r CGA Series 475 16V 104 630v 2r2 101 tdk CGA4 TDK X7R 630V CGA3 Text: CGA SERIES \| Automotive Grade TDK CGA series multilayer ceramic chip capacitors MLCCs are qualified to automotive industry’s Q200 testing standard. CGA parts are manufactured using TDK’s most advanced and stable manufacturing process. Parts are subjected to increased inspections to offer a	Original	C2012/CC0805 474 3.5v c2012 0805 cc0402 x7r CGA Series 475 16V 104 630v 2r2 101 tdk CGA4 TDK X7R 630V CGA3	PDF
loudness control Abstract: j-900 Text: TAS5508B 8-Channel Digital Audio PWM Processor Data Manual PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.	Original	TAS5508B SLES162C TAS5508B SLES162C loudness control j-900	PDF
AQV21EH Abstract: AQV210E AQV214 Text: GU-E 1 Form A AQV210E, AQV21EH (Standard type) High cost-performance DIP6-pin type, reinforced insulation available TESTING (Reinforced type) GU-E 1 Form A (AQV21E, AQV21EH) AQV21E, 6.4 .252 8.8 .346 3.9 .154 6.4 .252 8.8 .346 3.6 .142 CAD Data	Original	AQV210E, AQV21EH) AQV21E, AQV214E AQV210E AQV210EH, AQV214EH aqv21e: AQV21EH AQV210E AQV214	PDF
MIKRO Abstract: No abstract text available Text: All Mikroelektronika’s development systems feature a large number of peripheral modules expanding microcontroller’s range of application and making the process of program testing easier. In addition to these modules, it is also possible to use numerous additional modules linked to the development system	Original	932-MIKROE-605 MIKROE-605 MIKRO	PDF
MS16106-1 Abstract: 9AC12-3 2AC59 MS16106-2 9AC4 MS16106-5 MS-16106-1 23ac1 ms16106 MS16106-3 Text: Basic Switches Door Style 1 Style 2 AC Series FEATURES ɀ Automatically cut power when service door or drawer is opened, helping protect personnel and equipment. ɀ Enables circuit testing with power On by manually pulling rod actuator to maintained-On position. Closing door	Original	UL1054 MS16106-3) 22AC1 22AC2 23AC1 23AC2 24AC1 24AC2 4AC54* MS16106-2) MS16106-1 9AC12-3 2AC59 MS16106-2 9AC4 MS16106-5 MS-16106-1 ms16106 MS16106-3	PDF
AGN20 Abstract: AGN20024 938M AGN2004H Text: GN AGN TESTING High sensitivity of nominal operating power 100mW is achieved. Compact slim body saves space. GN RELAYS (AGN) FEATURES 1. Compact slim body saves space. Thanks to the small surface area of 5.7 mm  10.6 mm .224 inch  .417 inch and low height of 9.0 mm .354 inch,	Original	100mW 500gf} 010811J AGN20 AGN20024 938M AGN2004H	PDF
pogo pins Abstract: No abstract text available Text: CRYSTAL OSCILLATOR TEST & BURN IN SOCKET AXS-7050-06-13 Precision test socket for 7x5mm, Pb RoHS 6 pad crystal oscillator packages. Compliant FEATURES: \| \| \| \| \| \| \| \| \| \| \| \| \| \| \| APPLICATIONS: APPLICATIONS: APPLICATIONS: • Accurate and reliable testing of frequency control devices	Original	AXS-7050-06-13 815-AXS-7050-06-13 pogo pins	PDF
Untitled Abstract: No abstract text available Text: Coaxial Ampliﬁer 50Ω High Isolation ZFL-2HAD 50 to 1000 MHz Features • wideband, 50 to 1000 MHz • active directivity isolation-gain , 30 dB typ. at 50-500 MHz Applications CASE STYLE: SS98 • VHF/UHF • cellular • receivers • two-tone, 3rd order IM testing	Original		PDF
Untitled Abstract: No abstract text available Text: Coaxial Ampliﬁer 50Ω High Isolation ZFL-1HAD 10 to 500 MHz Features • wideband, 10 to 500 MHz • active directivity isolation-gain , 30 dB typ. Applications • VHF/UHF • laboratory use • receivers • two-tone, 3rd order IM testing CASE STYLE: SS98	Original		PDF

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TESTING Search Results

TESTING Result Highlights (5)

TESTING Price and Stock

Honeywell Sensing and Control GROUP-B-TESTING

Microchip Technology Inc JANSR2N2222AUB/HRDS-XRAY_TESTING

Infineon Technologies AG GROUP_C3_TESTING

Microchip Technology Inc GROUP C TESTING/MV1N5988D-1

Microchip Technology Inc GROUP B TESTING/MV1N5988D-1

TESTING Datasheets (1)

TESTING Datasheets Context Search

Upscreening

Untitled

Untitled

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AQV25P

*216EH

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Multimeter fluke 114

AQY412

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how to make an ide to usb adapter

474 3.5v

loudness control

AQV21EH

MIKRO

MS16106-1

AGN20

pogo pins

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