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    TESTING REPORT Search Results

    TESTING REPORT Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    FO-62.5LPBMT0-001 Amphenol Cables on Demand Amphenol FO-62.5LPBMT0-001 MT-RJ Connector Loopback Cable: Multimode 62.5/125 Fiber Optic Port Testing .1m Datasheet
    FO-9LPBMTRJ00-001 Amphenol Cables on Demand Amphenol FO-9LPBMTRJ00-001 MT-RJ Connector Loopback Cable: Single-Mode 9/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFP28LPB1W-3DB Amphenol Cables on Demand Amphenol SF-SFP28LPB1W-3DB SFP28 Loopback Adapter Module for SFP28 Port Compliance Testing - 3dB Attenuation & 1W Power Consumption Datasheet
    FO-50LPBMTRJ0-001 Amphenol Cables on Demand Amphenol FO-50LPBMTRJ0-001 MT-RJ Connector Loopback Cable: Multimode 50/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFPPLOOPBK-003.5 Amphenol Cables on Demand Amphenol SF-SFPPLOOPBK-003.5 SFP+ Loopback Adapter Module for SFP+ Port Compliance Testing - 3.5dB Copper/Optical Cable Emulation Datasheet

    TESTING REPORT Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    TRANSISTOR A104b

    Abstract: TRANSISTOR A107 EIAJ ED-4701 305 water pumping machine control schematic electromigration calculation for TTL smd transistor AIT AAAA series SMD transistor schematic diagram atom ED-4701 A103-C
    Text: [ 3 ] Reliability Testing Contents 1. What is Reliability Testing . 1 1.1 Significance and Purpose of Reliability Testing. 1 1.2 1.3 Before Testing . 1


    Original     		PDF 15000m/s2, 200000m/s2, TRANSISTOR A104b TRANSISTOR A107 EIAJ ED-4701 305 water pumping machine control schematic electromigration calculation for TTL smd transistor AIT AAAA series SMD transistor schematic diagram atom ED-4701 A103-C

    3818

    Abstract: No abstract text available
    Text: Engineering Report 502-1258 19May09 Rev A Electrical Durability and Temperature Testing of Miniature Slide Switches 1. INTRODUCTION 1.1. Purpose Testing was perform ed on Tyco Electronics m iniature slide switches to determ ine their ability to m eet electrical durability and tem perature testing requirem ents.


    Original     		PDF 19May09 09Mar09 11May09. EA2009155T EA2009350T. -40/C 3818

    Untitled

    Abstract: No abstract text available
    Text: TEMPERATURE TEST SYSTEM 8800 Simultaneous temperature testing of up to four different device frequencies, easy to use and surprisingly affordable! QUADROTEMP TESTING SOFTWARE TM WITH that is generations ahead of the competition, the Temperature Test System 8800 facilitates testing


    Original     		PDF

    DIGITAL ammeter controller based block diagram

    Abstract: KPCI-488 260X Keithley 2400 Keithley 237 KUSB-488
    Text: Number 2647 Application Note Se­ries IDDQ Testing and Standby Current Testing with Series 2600 System SourceMeter Instruments Introduction IDDQ Testing of CMOS ICS Manufacturers of CMOS integrated circuits and battery-powered electronic products need to measure the quiescent standby


    Original     		PDF 1-888-KEITHLEY 09053KGW DIGITAL ammeter controller based block diagram KPCI-488 260X Keithley 2400 Keithley 237 KUSB-488

    transistor testing using multimeter

    Abstract: AC302
    Text: Application Note AC302 Power System Verification During Accelerated Life Testing Introduction Design verification of a power system during Accelerated Life Testing ALT and Highly Accelerated Life Testing (HALT) can pose many challenges to the design engineer (Figure 1). Critical signals might not be


    Original     		PDF AC302 transistor testing using multimeter AC302

    USS725D

    Abstract: SL1148C 4-02-6016 USS-725 CY7C637XX cy7c68000 CY7C64013 AN023 ISD300A1 list of series in microcontroller
    Text: USB Compliance Testing Overview Introduction One of the secrets to USB’s success has been the compliance-testing program. This program verifies that your device meets the specification and works well with other USB devices. Only devices that have passed compliance testing


    Original     		PDF

    BTS 3900

    Abstract: alarm troubleshoot of bts 3900 BTS 3900 a RJ48 PCM30 PCM31CRC RJ48-C BTS 333 RJ48C PCM-31
    Text: NetTek Backhaul T1 or E1 Tester YBT1E1 Features & Benefits T1 or E1 Circuit Testing Capability Adds to the Flexibility of the NetTek® BTS Field Tool User-defined Pattern Sequence Testing and Timed Testing Verify the Most Important T1 or E1 Characteristics for Field


    Original     		PDF 2GW-15051-3 BTS 3900 alarm troubleshoot of bts 3900 BTS 3900 a RJ48 PCM30 PCM31CRC RJ48-C BTS 333 RJ48C PCM-31

    error detection codes

    Abstract: SMPTE checkfield pattern SDI tv pattern generator clc018 SDI SERIALIZER smpte rp 198 CLC020 CLC021 CLC030 CLC031
    Text: Chapter 4 System testing 4.1 Digital video system testing Despite the fact that the data is digital, most DTV system testing relies on analog means and equipment. This is done for operator familiarity and convenience. Video may be “digital” but it originates from cameras,


    Original     		PDF

    652 wzy

    Abstract: No abstract text available
    Text: CONTECH RESEARCH. INC. _ .- 1 TEST REPORT #93117H - ‘. _ ,. QUALIFICATION TESTING MICRO STRIPE SERIES NO SIDE INSULATION A. SAMTEC CORPORATION 67 MECHANIC STREET ATlLEBORO, MASSACHUSEllS 02703 508/ 226-4800 SEPTEMBER 15, 1993 TEST REPORT #93117H QUALIFICATION TESTING


    Original     		PDF 93117H 93117H 652 wzy

    pj42

    Abstract: schematic diagram lcd monitor chimei 1TP1-6 S3V16 MDC56S-I DIODE S3V 81 DIODE S3V 43 PTC SY 16P BG54S MITAC MPU
    Text: SERVICE MANUAL FOR 8677 BY: Spark Pei TESTING TESTING TECHNOLOGY TECHNOLOGY DEPARTMENT DEPARTMENT // TSSC TSSC Dec . 2002 8677 N/B MAINTENANCE Contents 1. Hardware Engineering Specification - 3


    Original     		PDF SiS961 SiS301LV PCI1410 ICS952001 pj42 schematic diagram lcd monitor chimei 1TP1-6 S3V16 MDC56S-I DIODE S3V 81 DIODE S3V 43 PTC SY 16P BG54S MITAC MPU

    P45 msi MOTHERBOARD CIRCUIT diagram

    Abstract: motherboard quanta EW6 intel chipset 945 motherboard repair motherboard hannstar diagram HANNSTAR motherboard MITAC intel ICH 8 hannstar foxconn R2A1 mitac 8
    Text: SERVICE MANUAL FOR 8170 BY: Jacey Liu TESTING TESTING TECHNOLOGY TECHNOLOGY DEPARTMENT DEPARTMENT // TSSC TSSC Feb . 2002 8170 N/B MAINTENANCE CONTENTS 1. Hardware Engineering


    Original     		PDF 478Pin 82801BA PCI4410 ICS950805 P45 msi MOTHERBOARD CIRCUIT diagram motherboard quanta EW6 intel chipset 945 motherboard repair motherboard hannstar diagram HANNSTAR motherboard MITAC intel ICH 8 hannstar foxconn R2A1 mitac 8

    mobile phone repair

    Abstract: spare parts for mobile mobile phone repair software no fault found mobile phone repair hardware
    Text: Cellular Handset Testing - The Latest Evolution Step Author: Steve Gledhill Published in: Wireless Design and Development Date: 15th February 1999 Cellular radio testing has evolved dramatically since the initial introduction of the original analog cellular systems. Integrated test sets in the 1980s revolutionised testing by providing a "one box"


    Original     		PDF 1980s mobile phone repair spare parts for mobile mobile phone repair software no fault found mobile phone repair hardware

    samtec connector lc

    Abstract: No abstract text available
    Text: TEST REPORT #98150 QUALIFICATION TESTING mm*., , n nr., ‘I‘bW / >aw SAMTEC CORPORATION .: :, <’ AUGUST 13,1998 TEST REPORT #98150 QUALIFICATION TESTING TSW/SSW SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC.


    Original     		PDF 10012-l samtec connector lc

    LF-H72P

    Abstract: intel 945 motherboard repair diagram str 50113 intel chipset 945 motherboard repair 2310 dhi motherboard hannstar 9172-24 d506 intel chipset 845 motherboard repair circuit Hannstar motherboard HANNSTAR
    Text: SERVICE MANUAL FOR 8175 BY: Jacey Liu TESTING TESTING TECHNOLOGY TECHNOLOGY DEPARTMENT DEPARTMENT // TSSC TSSC Mar . 2002 8175 N/B MAINTENANCE CONTENTS 1. Hardware Engineering


    Original     		PDF 478Pin 82801BA PCI4410 ICS950805 LF-H72P intel 945 motherboard repair diagram str 50113 intel chipset 945 motherboard repair 2310 dhi motherboard hannstar 9172-24 d506 intel chipset 845 motherboard repair circuit Hannstar motherboard HANNSTAR

    b 1492

    Abstract: ISL7124SRH K500 LM124 cross reference lm124
    Text: Single Event Effects Testing of the ISL7124SRH Quad Operational Amplifier June 2002 Purpose - This report describes the results of single event effects testing of the ISL7124SRH quad operational amplifier ‘op amp’ to determine whether this part meets


    Original     		PDF ISL7124SRH 36MeVmg/cm2 LM124 ISL7124 b 1492 K500 LM124 cross reference lm124

    Untitled

    Abstract: No abstract text available
    Text: Test Report 006 Neutron Testing of the ISL78845ASEH Pulse Width Modulator Introduction This report summarizes results of 1MeV equivalent neutron testing of the ISL78845ASEH current mode PWM controller. The test was conducted in order to determine the sensitivity of


    Original     		PDF ISL78845ASEH 2x1011n/cm2 1x1014n/cm2. 28C4x 18C4x TR006

    ABT8996

    Abstract: BCT8244 SN54ABT8996 SN54ACT8990 SN54LVT8980 SN74ABT8996 SN74ACT8990 SN74LVT8980 SCBS676
    Text: Chapter 7 Applications This chapter presents a number of testing problems and shows how boundary-scan testing and TI products can be used to solve them. Board-Etch and Solder-Joint Testing The current approach to detecting board-etch and solder-joint faults in today’s electronics industry uses two


    Original     		PDF

    Rs280

    Abstract: No abstract text available
    Text: ‘I -1 I _i -1 CONTECH RESEARCH, INC. 1 JANUARY 26, 1990 TEST REPORT #90046 GAS TIGHT TESTING SAMTEC CORPORATION : ., .I. ‘. : : ‘,. : 67 MECHANIC STREET AllLEBORO, MASSACHUSET% 02703 508/ 226-4800 JANUARY 26, 1990 TEST REPORT #90046 GAS TIGHT TESTING


    Original     		PDF 012YC, mbn40 HElJN03 Rs280

    HLMP-FW67NP00

    Abstract: lux meter receptor "LIGHT Sensor" lux sensor light sensor ambient light sensor konica application lux meter
    Text: Test Setup for Ambient Light Sensor Testing Application Report Introduction This document provides a general recommendation for testing the functionality of the ambient light sensor. It covers the measurement equipment and techniques for determining the output voltage Vout of the ambient


    Original     		PDF AV01-0224EN HLMP-FW67NP00 lux meter receptor "LIGHT Sensor" lux sensor light sensor ambient light sensor konica application lux meter

    HAMR5603

    Abstract: M9-CSP64 UTC1117 KX15-50KLD SEAGATE ST340810A PMOSSOT23 ibm usa 2001 P6 MOTHERBOARD SERVICE MANUAL 180w subwoofer circuit diagram R101A w31 smd
    Text: SERVICE MANUAL FOR E - 8188 BY: Rain Li TESTING TESTING TECHNOLOGY TECHNOLOGY DEPARTMENT DEPARTMENT // TSSC TSSC Apr . 2003 LCD PC E-8188 MAINTENANCE Contents 1. Hardware Engineering Specification - 3


    Original     		PDF E-8188 845PE CB710 ICS950805 HAMR5603 M9-CSP64 UTC1117 KX15-50KLD SEAGATE ST340810A PMOSSOT23 ibm usa 2001 P6 MOTHERBOARD SERVICE MANUAL 180w subwoofer circuit diagram R101A w31 smd

    P4N266

    Abstract: Insyde bios manual MDC56S-I TDK Ferrite Core PC40 B-H loops P4N266A smd w2k 117 MITAC MPU VT8653 mitac 8 E-8590
    Text: SERVICE MANUAL FOR E-8590 BY: Dragon TESTING TESTING TECHNOLOGY TECHNOLOGY DEPARTMENT DEPARTMENT // TSSC TSSC Jan . 2003 LCD PC E-8590 MAINTENANCE Contents 1. Hardware Engineering Specification - 3


    Original     		PDF E-8590 E-8590 VT8703 VT8235 CB710 IEEE1394 VT6306 P4N266 Insyde bios manual MDC56S-I TDK Ferrite Core PC40 B-H loops P4N266A smd w2k 117 MITAC MPU VT8653 mitac 8

    specification of ldr

    Abstract: LDR SPECIFICATION LDR voltage range
    Text: Application Note 1870 Author: Nick van Vonno Total Dose Testing of the ISL70444SEH Radiation Hardened Quad Operational Amplifier Introduction and Executive Summary This document reports the results of low and high dose rate total dose testing of the ISL70444SEH quad operational


    Original     		PDF ISL70444SEH MIL-STD-883 AN1870 specification of ldr LDR SPECIFICATION LDR voltage range

    Untitled

    Abstract: No abstract text available
    Text: Application Note 1792 Author: Nick van Vonno Total Dose Testing of the ISL70417SEH Radiation Hardened Quad Operational Amplifier Introduction Part Description This document reports the results of low and high dose rate total dose testing of the ISL70417SEH quad operational


    Original     		PDF ISL70417SEH 300krad 300rad 50krad 01rad AN1792

    CO75

    Abstract: CONNECTOR 83734 vibra 16s 8S22L MIL-S-83734
    Text: CONTECH RESEARCH, INC. TEST REPORT #92139 QUALIFICATION TESTING MIL-S-83734E PART NUMBER: SEP-12454 SAMTEC CORPORATION 67 MECHANIC STREET AllLEBORO, MASSACHUSETTS 02703 508/226-4800 JUNE 29, 1992 TEST REPORT #92139 QUALIFICATION TESTING MIL-S-83734E PART NUMBER: SEP-12454


    Original     		PDF MIL-S-83734E SEP-12454 CO75 CONNECTOR 83734 vibra 16s 8S22L MIL-S-83734