Untitled
Abstract: No abstract text available
Text: Use of Life Tested Parts Application Note May 1999 AN9654.1 Author: J. E. Vinson, Ph. D. History The use of life tested parts in flight hardware continually becomes an issue for customers. The life test referred to here is the standard life test called for during Quality
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AN9654
125oC.
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Use of Life Tested Parts
Abstract: AN9654
Text: Use of Life Tested Parts Application Note November 28, 2006 AN9654.2 Author: J. E. Vinson, Ph. D. History The use of life tested parts in flight hardware continually becomes an issue for customers. The life test referred to here is the standard life test called for during Quality
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AN9654
Use of Life Tested Parts
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HARRIS
Abstract: la log failure rate TDDB Harris CMOS Integrated Circuits HARRIS SEMICONDUCTOR
Text: Harris Semiconductor No. AN9654 Harris Space Products October 1996 Use of Life Tested Parts Author: J. E. Vinson History than 10 years worth of powered on hours. Highly accelerated tests are needed to gather wearout data in a reasonable period of time. A functional circuit is limited in its
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AN9654
1-800-4-HARRIS
HARRIS
la log
failure rate TDDB
Harris CMOS Integrated Circuits
HARRIS SEMICONDUCTOR
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AN-7518
Abstract: No abstract text available
Text: Use of Life Tested Parts Application Note May 1999 AN-7518 Author: J. E. Vinson, Ph. D. History eyrds terrpoon, minctor mniions vin, e t, lility, reeni eful , ant rtalfails, arou Product Assumptions This report addresses high reliability product from an Intersil
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AN-7518
AN-7518
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311P827
Abstract: MIL-PRF-32192 S-311-P-827 GSFC 20771 E595 EEE-INST-002 S311-P827
Text: 1. SCOPE Purpose. This test specification covers the screening and qualification requirements for surface mounted, end-banded chip thermistors. Parts tested to this specification shall be considered acceptable for use in NASA space programs specifying quality level Grade 1 parts.
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311P827
S-311-P-827
311P827
MIL-PRF-32192
S-311-P-827
GSFC
20771
E595
EEE-INST-002
S311-P827
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MIL-PRF-32192
Abstract: PTC thermistor 5k 311P827 E595 EEE-INST-002 r20.c GSFC S311-P827
Text: 03 19, 2008 Mar 17, 2008 Mar 18, 2008 1. SCOPE Purpose. This test specification covers the screening and qualification requirements for surface mounted, end-banded chip thermistors. Parts tested to this specification shall be considered acceptable for use in NASA space programs
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311P827
S-311-P-827
MIL-PRF-32192
PTC thermistor 5k
311P827
E595
EEE-INST-002
r20.c
GSFC
S311-P827
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JQ1P-24V-F
Abstract: JQ1-12V-F JQ1a-24V-F JQ1a-5V-F JQ1aP-12V-F JQ1P-6V-F JQ1aP-18V-F JQ1aP-24V JQ1-18V-F JQ1-24V-F
Text: VDE HIGH ELECTRICAL & MECHANICAL NOISE IMMUNITY RELAY 20 .787 JQ RELAYS FEATURES 10 .394 15.6 .614 mm inch JQ About Cd-free contacts We have introduced cadmium-free type products to reduce environmentally hazardous substances. Please replace parts that contain cadmium with Cd-free
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Contact130
041206D
JQ1P-24V-F
JQ1-12V-F
JQ1a-24V-F
JQ1a-5V-F
JQ1aP-12V-F
JQ1P-6V-F
JQ1aP-18V-F
JQ1aP-24V
JQ1-18V-F
JQ1-24V-F
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JQ1-12V-F
Abstract: JQ1-18V-F JQ1-24V-F JQ1-48V-F JQ1P-12V-F JQ1P-18V-F JQ1P-24V-F JQ1P-48V-F JQ1a-5V-F
Text: VDE HIGH ELECTRICAL & MECHANICAL NOISE IMMUNITY RELAY 20 .787 JQ RELAYS FEATURES 10 .394 15.6 .614 mm inch JQ About Cd-free contacts We have introduced cadmium-free type products to reduce environmentally hazardous substances. Please replace parts that contain cadmium with Cd-free
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Contact130
041206D
JQ1-12V-F
JQ1-18V-F
JQ1-24V-F
JQ1-48V-F
JQ1P-12V-F
JQ1P-18V-F
JQ1P-24V-F
JQ1P-48V-F
JQ1a-5V-F
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E1108ACBG-8E-E
Abstract: M393T6450FZ3-CCC E1104ACSE-6E-E SROMBSAS18E A222G HYB18T1G800C2F-3S E1108AB-6E-E HYB18T1G400C2F-3S M393T6553CZ3-CCC M393T2950CZ3-CCC
Text: Intel Server Boards SE8500HW4 and SE8501HW4 Memory List Test Report Summary Revision 32.0 August 2008 Intel® Server Board SE8500HW4 and SE8501HW4 Revision History Date Rev Modifications Apr/05 1.0 Initial Release. Jun/05 2.0 Added Samsung* parts. In shaded area
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SE8500HW4
SE8501HW4
Apr/05
Jun/05
Sept/05
512MB
Oct/05
Nov/05
E1108ACBG-8E-E
M393T6450FZ3-CCC
E1104ACSE-6E-E
SROMBSAS18E
A222G
HYB18T1G800C2F-3S
E1108AB-6E-E
HYB18T1G400C2F-3S
M393T6553CZ3-CCC
M393T2950CZ3-CCC
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LM324N applications
Abstract: LM139AJ LM324N LM324n comparator ic LM324N schematic lm324N application lm324n equivalent LM324n power dissipation lm339n Linear Integrated Circuit 8 pin ic lm324n
Text: INFORMATION ONLY NOTIFICATION PCN # 20123503 Revision B Title Of Change: Part Number Change for 19 duplicate parts Publish Date: 05/07/12 Revision History of PCN: Rev - Action Date - User ID - Action Name -
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Diode T3
Abstract: DIODE T4 DSBT2-S-DC24V DSBT2-S-DC12V DSBT2-M-2D-DC12V DSBT2-M-2D-DC24V DSBT2-S-DC5V dc5v
Text: TESTING DS-BT RELAYS 4,000 V BREAKDOWN VOLTAGE DS RELAYS FEATURES 20.65 .813 10.65 .419 •4,000 V breakdown voltage •Reinforced insulation between coil and contacts •Surge voltage withstand: 1500 V FCC Parts 68 10.5 .413 mm inch SPECIFICATIONS Contact
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DIODE T4
Abstract: DSBT2-S-DC12V DSBT2-M-2D-DC12V DSBT2-M-2D-DC24V DSBT2-S-DC24V
Text: TESTING DS-BT RELAYS 4,000 V BREAKDOWN VOLTAGE DS RELAYS FEATURES 20.65 .813 10.65 .419 •4,000 V breakdown voltage •Reinforced insulation between coil and contacts •Surge voltage withstand: 1500 V FCC Parts 68 10.5 .413 mm inch SPECIFICATIONS Characteristics
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DS-BT
Abstract: DIODE t2 DSBT2-S-DC24V DSBT2-S-DC5V
Text: Discontinued TESTING DS-BT RELAYS 4,000 V BREAKDOWN VOLTAGE DS RELAYS FEATURES 20.65 .813 10.65 .419 •4,000 V breakdown voltage •Reinforced insulation between coil and contacts •Surge voltage withstand: 1500 V FCC Parts 68 10.5 .413 mm inch SPECIFICATIONS
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2x107
2x105
DS-BT
DIODE t2
DSBT2-S-DC24V
DSBT2-S-DC5V
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DSBT2-S-DC24V
Abstract: DSBT2-M-2D-DC12V DSBT2-M-2D-DC24V DSBT2-S-DC12V relay dc6v
Text: TESTING DS-BT RELAYS 4,000 V BREAKDOWN VOLTAGE DS RELAYS FEATURES 20.65 .813 10.65 .419 •4,000 V breakdown voltage •Reinforced insulation between coil and contacts •Surge voltage withstand: 1500 V FCC Parts 68 10.5 .413 mm inch SPECIFICATIONS Contact
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TLWR7600
Abstract: No abstract text available
Text: Vishay Semiconductors Reliability The requirements concerning quality and reliability of products are always increasing. It is not sufficient to only deliver fault–free parts. In addition, it must be ensured that the delivered goods serve their purpose safely and failure free, i.e., reliably. From the delivery
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TLWR7600
TLWR7600
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80116
Abstract: No abstract text available
Text: Vishay Semiconductors Reliability The requirements concerning quality and reliability of products are always increasing. It is not sufficient to only deliver fault–free parts. In addition, it must be ensured that the delivered goods serve their purpose safely and failure free, i.e. reliably. From the delivery
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Reliability
Abstract: reliabil efr 135 MAR 618 transistor TLWR7600
Text: Reliability Vishay Semiconductors Reliability The requirements concerning quality and reliability of products are always increasing. It is not sufficient to only deliver fault-free parts. In addition, it must be ensured that the delivered goods serve their purpose safely and failure
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TLWR7600
04-Mar-08
Reliability
reliabil
efr 135
MAR 618 transistor
TLWR7600
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efr 135
Abstract: 80106 TLWR7600
Text: Vishay Semiconductors Reliability The requirements concerning quality and reliability of products are always increasing. It is not sufficient to only deliver fault–free parts. In addition, it must be ensured that the delivered goods serve their purpose safely and failure free, i.e., reliably. From the delivery
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TLWR7600
efr 135
80106
TLWR7600
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NS16450
Abstract: ns16c450 INS8250 Hardware and Software Interrupts of 8086 and 8088 8086 microcomputer NS16550AF INS8250-B INS82C50A NS16550 INS8250b
Text: National currently produces seven versions of the INS8250 UART Functionally these parts appear to be the same however there are differences that the designer and purchaser need to understand For each version this document provides a brief overview of their distinct characteristics a detailed function and timing section a discussion of
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INS8250
INS8250
INS8250-B
INS8250A
NS16450
INS82C50A
NS16C450
NS16550AF
C1995
Hardware and Software Interrupts of 8086 and 8088
8086 microcomputer
INS82C50A
NS16550
INS8250b
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80088
Abstract: No abstract text available
Text: Vishay Semiconductors Reliability The requirements concerning quality and reliability of products are always increasing. It is not sufficient to only deliver fault–free parts. In addition, it must be ensured that the delivered goods serve their purpose safely and failure free, i.e., reliably. From the delivery
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84055
Abstract: No abstract text available
Text: VISHAY Vishay Semiconductors Reliability The requirements concerning quality and reliability of products are always increasing. It is not sufficient to only deliver fault-free parts. In addition, it must be ensured that the delivered goods serve their purpose
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20-Jan-04
84055
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hilton capacitors
Abstract: Mil std-202, method 107 conclusion
Text: TPC/Hilton Capacitor, 21421 N. 14th Avenue Phoenix, AZ 85027 623 582-5555 fax: (623) 582-2278 CORROSION RESISTANCE, MIL STD 202, Meth 204,B Twelve parts from each lot are placed in an environmental chamber. Chamber is set to 35°C and 95-98% RH using 5% NaCl solution. Test is
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BY106
Abstract: No abstract text available
Text: VISHAY _ Vishay Telefunken ▼ AOQ Program AO Q = Before leaving the factory all product after 100% testing, is sampled to make sure that it meets a minimum quality level. The results are accumulated and expressed in PPM parts per million . They are the
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JEDEC16.
BY106
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DIODE T4
Abstract: DSBT2-S-DC24V DSBT2-S-DC5V 2X105
Text: DS-BT DS-BT RELAYS BABT APPROVED DS RELAYS • • • • mm inch Approved by BABT Certmcate of Recognition 4,000 V breakdown voltage Reinforced insulation between coil and contacts Surge voltage withstand: 1500 V FCC Parts 68 SPECIFICATIONS Characteristics
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