NSG1003
Abstract: TCL24-124 TDS1002 TCL24-112 TCL060-112 TCL060-124 TCL060-148 TCL120-112 208VAC TCL24-105
Text: SEMI F-47 Test Compliance Test Report Standard: SEMI F47-0200 Specification for Semiconductor Processing Equipment Voltage Sag Immunity Test Procedure Standard: Semi F42 : Test method for Semiconductor Processing Equipment. Voltage Sag Immunity 1. Test Setup
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F47-0200
NSG1003:
TDS1002
TCL24-105
TCL24-112
TCL24-124
TCL060-112
TCL060-124
TCL060-148
TCL120-112
NSG1003
TCL24-124
TDS1002
TCL24-112
TCL060-112
TCL060-124
TCL060-148
TCL120-112
208VAC
TCL24-105
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NSG1003
Abstract: TDS1002 TSP070-112 TSP090-124 TSP140-112 TSP180-124 TSP360-124 TSP600-124
Text: SEMI F-47 Test Compliance Test Report Standard: SEMI F47-0200 Specification for Semiconductor Processing Equipment Voltage Sag Immunity Test Procedure Standard: Semi F42 : Test method for Semiconductor Processing Equipment. Voltage Sag Immunity 1. Test Setup
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F47-0200
NSG1003:
TDS1002
TSP070-112
TSP090-124
TSP140-112
TSP180-124
TSP360-124
TSP600-124
DUT50
NSG1003
TDS1002
TSP070-112
TSP090-124
TSP140-112
TSP180-124
TSP360-124
TSP600-124
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reliability report
Abstract: quality and reliability report
Text: Quality and Reliability Report 7. Package Related Reliability Test Data Temperature-Humidity-Bias Test 1. Test Condition Condition: T = 85°C, RH = 85%, Maximum operating voltage Duration: Test time points at 168 hrs, 500 hrs, and 1000 hrs. 2. SRAM Products
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900 mhz oscillator
Abstract: voltage controlled oscillator 900mhz frequency oscillator
Text: JXWBVCO-A-500-900 500~900MHz Voltage Controlled Oscillator Test report is for reference only. TEST REPORT for JXWBVCO-A-500-900 1 JXWBVCO-A-500-900 500~900MHz Voltage Controlled Oscillator Technical Specification Frequency Range MHz 500-900 Tuning Voltage Range(V)
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JXWBVCO-A-500-900
900MHz
10KHz
100KHz
900 mhz oscillator
voltage controlled oscillator
900mhz frequency oscillator
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Untitled
Abstract: No abstract text available
Text: TestStation LH In-Circuit Test System Quality In-Circuit Test at an Affordable Price ½ High fault coverage ½ Safe low voltage test ½ Fast test throughput ½ Exceptional diagnostic accuracy ½ Proven test reliability ½ Scalable test capabilities ½ Low cost of
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AT-150-0303-5k
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LH28F016SCT
Abstract: No abstract text available
Text: FLASH NNON VOLATILE ETOX SMART VOLTAGE LH28F016SCT 16M Reliability Test Report
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LH28F016SCT
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megohmmeter
Abstract: No abstract text available
Text: MEGOHMMETERS 1000V Digital/Analog 5000V Digital Special product features ▼ ER P US C TA B LE SE DA Insulation Tests Test Voltage 50V 100V 250V 500V 1000V Accuracy 2kΩ to 40GΩ 40GΩ to 4TΩ Voltage Test/Safety Check Voltage Warning Indicator Test Inhibition
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4000G
RS-232,
RS-232
128kB
megohmmeter
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Untitled
Abstract: No abstract text available
Text: JXWBVCO-S-3450-3550 3450~3550MHz Voltage Controlled Oscillator Test report is for reference only. TEST REPORT for JXWBVCO-S-3450-3550 Page 1 JXWBVCO-S-3450-3550 3450~3550MHz Voltage Controlled Oscillator Technical Specification Center Frequency GHz 3.5 Bandwidth(MHz)
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JXWBVCO-S-3450-3550
3550MHz
100KHz
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ISL7119EH
Abstract: No abstract text available
Text: Application Note 1872 Total Dose Testing of the ISL7119EH Dual Voltage Comparator Introduction This report summarizes the results of a low and high dose rate total dose test of the ISL7119EH dual voltage comparator. The test was conducted in order to determine the sensitivity of the
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ISL7119EH
ISL7119
ISL7119RH
300rad
300krad
01rad
50krad
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U4284BM
Abstract: No abstract text available
Text: U4284BM TELEFUNKEN Semiconductors Test report Absolute maximum ratings Parameters Output drain voltage Pin 5, 6, 7, 8 Symbol VOD Value 20 Unit V VA VA 8 to 16 24 V V Analogue supply voltage Pin 16 with 220 W seriell resistance one minute Test no. 84, 85, 86,
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U4284BM
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BASIC digital multimeter diagram
Abstract: digital multimeter diagram Benning benning 700 analog multimeter Benning TD19-2530-5-0-5-4 Multimeter service manual benning 1500 lcd for multimeters analogue multimeter
Text: 2008 World Testing, Measuring and Safety Instruments The whole range of testers from one supplier Class Test Equipment IEC/EN 61243-3 DIN VDE 0682-401 voltage class B BENNING World Class Test Equipment 2 Top-class test equipment DUSPOL voltage testers – the testers with the VDE mark of conformity
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D-46397
BASIC digital multimeter diagram
digital multimeter diagram
Benning
benning 700
analog multimeter
Benning TD19-2530-5-0-5-4
Multimeter service manual
benning 1500
lcd for multimeters
analogue multimeter
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Untitled
Abstract: No abstract text available
Text: Distribution Photometry Report Report Number: Date: 06-07-2011 Catalog Number: Description: 23_DFL-V0606N #1_110706 Test Distance: 10.293m Test Electrical Parameters: Voltage: 219.88, Current: 0.2871, Power: 60.61 Filename: 23_DFL-V0606N #1_110706.ies Total Uncertainties of Measurement:
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Untitled
Abstract: No abstract text available
Text: A Dimensions: [mm] B Recommended land pattern: [mm] D Electrical Properties: Properties Test conditions Inductance 1 kHz/ 100 mV ∆T = 40 K RDC LS Insulation test voltage Rated voltage Impedance Rated current DC Resistance Leakage inductance C Schematic:
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Text: A Dimensions: [mm] B Recommended land pattern: [mm] D Electrical Properties: Properties Test conditions Inductance 100 kHz/ 5 mV ∆T = 40 K RDC LS Insulation test voltage Rated voltage Impedance Rated current DC Resistance Leakage inductance C Schematic:
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Text: A Dimensions: [mm] B Recommended land pattern: [mm] D Electrical Properties: Properties Test conditions Inductance 100 kHz/ 5 mV ∆T = 40 K RDC LS Insulation test voltage Rated voltage Impedance Rated current DC Resistance Leakage inductance C Schematic:
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Text: A Dimensions: [mm] B Recommended land pattern: [mm] D Electrical Properties: Properties Test conditions Inductance 100 kHz/ 5 mV ∆T = 40 K RDC LS Insulation test voltage Rated voltage Impedance Rated current DC Resistance Leakage inductance C Schematic:
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Text: A Dimensions: [mm] B Recommended land pattern: [mm] D Electrical Properties: Properties Test conditions Inductance 1 kHz/ 100 mV ∆T = 40 K RDC LS Insulation test voltage Rated voltage Impedance Rated current DC Resistance Leakage inductance C Schematic:
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Text: A Dimensions: [mm] B Recommended land pattern: [mm] D Electrical Properties: Properties Test conditions Inductance 100 kHz/ 5 mV ∆T = 40 K RDC LS Insulation test voltage Rated voltage Impedance Rated current DC Resistance Leakage inductance C Schematic:
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Text: A Dimensions: [mm] B Recommended land pattern: [mm] D Electrical Properties: Properties Test conditions Inductance 100 kHz/ 5 mV ∆T = 40 K RDC LS Insulation test voltage Rated voltage Impedance Rated current DC Resistance Leakage inductance C Schematic:
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Text: A Dimensions: [mm] B Recommended land pattern: [mm] D Electrical Properties: Properties Test conditions Inductance 1 kHz/ 100 mV ∆T = 40 K RDC LS Insulation test voltage Rated voltage Impedance Rated current DC Resistance Leakage inductance C Schematic:
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Text: A Dimensions: [mm] B Recommended land pattern: [mm] D Electrical Properties: Properties Test conditions Inductance 1 kHz/ 100 mV ∆T = 40 K RDC LS Insulation test voltage Rated voltage Impedance Rated current DC Resistance Leakage inductance C Schematic:
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Text: A Dimensions: [mm] B Recommended land pattern: [mm] D Electrical Properties: Properties Test conditions Inductance 1 kHz/ 100 mV ∆T = 40 K RDC LS Insulation test voltage Rated voltage Impedance Rated current DC Resistance Leakage inductance C Schematic:
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Text: A Dimensions: [mm] B Recommended land pattern: [mm] D Electrical Properties: Properties Test conditions Inductance 100 kHz/ 5 mV ∆T = 40 K RDC LS Insulation test voltage Rated voltage Impedance Rated current DC Resistance Leakage inductance C Schematic:
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Text: A Dimensions: [mm] B Recommended land pattern: [mm] D Electrical Properties: Properties Test conditions Inductance 1 kHz/ 100 mV ∆T = 40 K RDC LS Insulation test voltage Rated voltage Impedance Rated current DC Resistance Leakage inductance C Schematic:
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