DASF007804.pdf

Manufacturer Micrel Semiconductor
Partial File Text High Temp Bias Moisture Life Test TA = 85C / 85%RH at rated voltage or Highly Accelerated Stress Test HAST +131C / 85%RH MSL Pkg Lds Device D/C Process L2 L2 L2 L2 L2 L2 L2 L
Datasheet Type Original
ECAD Model
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DASF007804.pdf preview Download Datasheet