DASF007804.pdf by Micrel Semiconductor

Partial File Text High Temp Bias Moisture Life Test TA = 85C / 85%RH at rated voltage or Highly Accelerated Stress Test HAST +131C / 85%RH MSL Pkg Lds Device D/C Process L2 L2 L2 L2 L2 L2 L2 L
Datasheet Type Original
RoHS No
Pb Free Unknown
Lifecycle Obsolete
Price & Stock
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Equivalent Parts !
Always verify details of parts you are evaluating, as these parts are offered as suggestions for what you are looking for and are not guaranteed.

MIC863YM8 MIC863BM8

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