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    DSAUTAZ0011246.pdf

    • Microchip Technology
    • Summary of Reliability Data Q4 CY2001 Dynamic Life Testing: Stress Temperature 125 degrees C Derated Temperature 55 degrees C Activation Energy 0.7 eV Acceleration Rate 78 FIT Rates at 60% confidence
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    DSAUTAZ0011246.pdf preview Download Datasheet

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