DSASW00420430.pdf

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90 nm CMOS cs324 CSG324 CSG324* reflow FF1152-2v6000 FFG1704 FGG676 PQ100 Reliability Test Methods for Packaged Devices SF363 SOG20 spartan-6, TQG144 spartan6 block ram TA 8659 ta 8659 an UG-116 UG116 Virtex 4 XC4VFX60 Virtex-6 reflow WS609 x2 type ac capacitor XC1702L XC2C128 equivalent XC2S200-6 XC2VP20 fg676 XC3S100E TQ144 xc3s200an xc3s3400a XC3S400 PQ208 XC3S400A failure XC3S700AN XC3S700AN FGG484 XC5VSX95T-1 XC6SLX100-FGG676 XC6SLX150-FGG676 XC6SLX150T XC6SLX16 FIT rate XC6SLX16-CSG324 XC6SLX45 XC6SLX45 FGG484 XC6SLX45-FGG484 XC6SLX45T XC6SLX45t-fgg484 xc6slx75 XC6SLX75 fgg676 XC95144 SF363 XC95288 XC9572 pcg84 XC9572XL XCF02S RELIABILITY REPORT XCF04S fit XILINX XC4008E