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    Scans-0023098.pdf

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    • High-Reliability High-Speed CMOS Logic ICs CD54HC4020/3A CD54HCT4020/3A Burn-In Test-Circuit Connections (Use Static II for /3A burn-in and Dynamic for Life Test.) Static STATIC BURN-IN I STAT
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    CD54HC4024 CD54HCT4024

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