This site uses third-party website tracking technologies to provide and continually improve our services, and to display advertisements according to users' interests. I agree and may revoke or change my consent at any time with effect for the future.
High-Reliability High-Speed CMOS Logic ICs_
CD54HC253/3A CD54HCT253/3A
Burn-In Test-Circuit Connections (Use Static II for/3A burn-in and Dynamic for Life Test.)
Static STATIC BURN-IN I STATIC
