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Scans-0023056.pdf
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__High-Reliability High-Speed CMOS Logic ICs CD54HC241/3A CD54HCT241/3A Burn-In Test-Circuit Connections (Use Static II "for /3A burnnn and Dynamic for Life Test.) Static STATIC BURN-IN I STAT
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Scan
RoHS
Unknown
Pb Free
Unknown
Lifecycle
Obsolete
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