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Scans-0023039.pdf
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.High-Reliability High-Speed CMOS Logic ICs CD54HC160/3A CD54HCT160/3A Burn-In Test-Circuit Connections (Use Static ll for /3A burn-in and Dynamic for Life Test.) Static STATIC BURN-IN I OPEN
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ECAD Model
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HCT161
ICE 280 565
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