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    Scans-0021291.pdf

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    • SN54BCT8373A SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES SCBS044D - JUNE 1990 - REVISED JUNE 1994 Member of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Cir
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    SN54BCT373 SN54BCT8373A SN54F373

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