DSASW00398059.pdf by Toshiba

Partial File Text AC AES AFM AQL ATPG BEM Alternating Current Auger Electron Spectroscopy Atomic Force Microscope Acceptable Quality Level Automatic Test Pattern Generator Breakdown Energy of Metal BP
Datasheet Type Original
RoHS Unknown
Pb Free Unknown
Lifecycle Unknown
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BDJ0128B CCD MTBF failure analysis IGBT IC SEM 2005 ic SEM 2005 SMD SEM 2005 SMD